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ISQED 2008: San Jose, California, USA

9th International Symposium on Quality of Electronic Design (ISQED 2008), 17-19 March 2008, San Jose, CA, USA. IEEE Computer Society 2008, ISBN 978-0-7695-3117-5 BibTeX


Plenary Session

Power Conscious Memories

Speed-Up and Timing of Integrated Circuits

SER and Noise Tolerance

Luncheon Keynote Speech

Robust SRAM and Analog Circuits

Power and Thermal Management

Process Variations

System and Circuit Synthesis

Process, Characterization, and Temperature-Aware Design

Processor Test Verification / Delay Diagnosis

Embedded Technical Sessions

Plenary Session

Co-Design Applications for IC Packages

Tools and Interconnects

Sequential Analysis, Defect Modeling, and At-Speed Testing

Modeling and Analysis in Physical Design

Emerging Technologies and Novel Applications

Statistical Timing

Modern Processor Design

Modeling and Design of Reliable Circuits

Design for Manufacturing

Structural Test

Advanced Design Methodologies

Copyright © Sat May 16 23:26:15 2009 by Michael Ley (ley@uni-trier.de)