R. D. (Shawn) Blanton

Ronald D. Blanton

2008
61	EE	Xiaochun Yu, R. D. (Shawn) Blanton: Multiple defect diagnosis using no assumptions on failing pattern characteristics. DAC 2008: 361-366
60	EE	Wing Chiu Tam, Osei Poku, R. D. (Shawn) Blanton: Precise failure localization using automated layout analysis of diagnosis candidates. DAC 2008: 367-372
59	EE	Jason G. Brown, Brian Taylor, Ronald D. Blanton, Larry T. Pileggi: Automated Testability Enhancements for Logic Brick Libraries. DATE 2008: 480-485
58	EE	Yen-Tzu Lin, Osei Poku, Naresh K. Bhatti, Ronald D. Blanton: Physically-Aware N-Detect Test Pattern Selection. DATE 2008: 634-639
57	EE	Jason G. Brown, R. D. (Shawn) Blanton: Automated Standard Cell Library Analysis for Improved Defect Modeling. ISQED 2008: 643-648
56	EE	Sounil Biswas, R. D. (Shawn) Blanton: Test Compaction for Mixed-Signal Circuits Using Pass-Fail Test Data. VTS 2008: 299-308
2007
55	EE	Sounil Biswas, Peng Li, R. D. (Shawn) Blanton, Larry T. Pileggi: Specification Test Compaction for Analog Circuits and MEMS CoRR abs/0710.4719: (2007)
54	EE	Jason G. Brown, R. D. (Shawn) Blanton: A Built-in Self-test and Diagnosis Strategy for Chemically Assembled Electronic Nanotechnology. J. Electronic Testing 23(2-3): 131-144 (2007)
2006
53	EE	Jeffrey E. Nelson, Jason G. Brown, Rao Desineni, R. D. (Shawn) Blanton: Multiple-detect ATPG based on physical neighborhoods. DAC 2006: 1099-1102
52	EE	Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jason G. Brown, N. Patil, Wojciech Maly, R. D. (Shawn) Blanton: Extraction of defect density and size distributions from wafer sort test results. DATE 2006: 913-918
51	EE	Jason G. Brown, R. D. (Shawn) Blanton: Exploiting Regularity for Inductive Fault Analysis. VTS 2006: 364-369
50	EE	Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer: Extracting Defect Density and Size Distributions from Product ICs. IEEE Design & Test of Computers 23(5): 390-400 (2006)
49	EE	Sounil Biswas, Ronald D. Blanton: Statistical Test Compaction Using Binary Decision Trees. IEEE Design & Test of Computers 23(6): 452-462 (2006)
48	EE	Ronald D. Blanton, Kumar N. Dwarakanath, Rao Desineni: Defect Modeling Using Fault Tuples. IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2450-2464 (2006)
47	EE	Tao Jiang, R. D. (Shawn) Blanton: Inductive fault analysis of surface-micromachined MEMS. IEEE Trans. on CAD of Integrated Circuits and Systems 25(6): 1104-1116 (2006)
2005
46	EE	Sounil Biswas, Peng Li, R. D. (Shawn) Blanton, Larry T. Pileggi: Specification Test Compaction for Analog Circuits and MEMS. DATE 2005: 164-169
45	EE	R. D. (Shawn) Blanton, Subhasish Mitra: Testing Nanometer Digital Integration Circuits: Myths, Reality and the Road Ahead. VLSI Design 2005: 8-9
44	EE	Rao Desineni, R. D. (Shawn) Blanton: Diagnosis of Arbitrary Defects Using Neighborhood Function Extraction. VTS 2005: 366-373
2004
43	EE	Chunsheng Liu, Kumar N. Dwarakanath, Krishnendu Chakrabarty, Ronald D. Blanton: Compact Dictionaries for Diagnosis of Unmodeled Faults in Scan-BIST. ISVLSI 2004: 173-178
42	EE	Jason G. Brown, R. D. (Shawn) Blanton: CAEN-BIST: Testing the NanoFabric. ITC 2004: 462-471
41	EE	Thomas J. Vogels, Thomas Zanon, Rao Desineni, R. D. (Shawn) Blanton, Wojciech Maly, Jason G. Brown, Jeffrey E. Nelson, Y. Fei, X. Huang, Padmini Gopalakrishnan, Mahim Mishra, V. Rovner, S. Tiwary: Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations. ITC 2004: 508-517
40	EE	Nilmoni Deb, R. D. (Shawn) Blanton: Multi-Modal Built-In Self-Test for Symmetric Microsystems. VTS 2004: 139-147
39	EE	Sounil Biswas, Kumar N. Dwarakanath, R. D. (Shawn) Blanton: Generalized Sensitization using Fault Tuples. VTS 2004: 297-303
2003
38	EE	Rahul Kundu, R. D. (Shawn) Blanton: ATPG for Noise-Induced Switch Failures in Domino Logic. ICCAD 2003: 765-769
37	EE	Rahul Kundu, R. D. (Shawn) Blanton: Path Delay Test Generation for Domino Logic Circuits in the Presence of Crosstalk. ITC 2003: 122-130
36	EE	Thomas J. Vogels, Wojciech Maly, R. D. (Shawn) Blanton: Progressive Bridge Identification. ITC 2003: 309-318
35	EE	Wojciech Maly, Anne E. Gattiker, Thomas Zanon, Thomas J. Vogels, R. D. (Shawn) Blanton, Thomas M. Storey: Deformations of IC Structure in Test and Yield Learning. ITC 2003: 856-865
34	EE	R. D. (Shawn) Blanton, Kumar N. Dwarakanath, Anirudh B. Shah: Analyzing the Effectiveness of Multiple-Detect Test Sets. ITC 2003: 876-885
33	EE	Ronald D. Blanton, John P. Hayes: On the properties of the input pattern fault model. ACM Trans. Design Autom. Electr. Syst. 8(1): 108-124 (2003)
2002
32	EE	Nilmoni Deb, R. D. (Shawn) Blanton: Built-In Self Test of CMOS-MEMS Accelerometers. ITC 2002: 1075-1084
31	EE	Ronald D. Blanton, John T. Chen, Rao Desineni, Kumar N. Dwarakanath, Wojciech Maly, Thomas J. Vogels: Fault Tuples in Diagnosis of Deep-Submicron Circuits. ITC 2002: 233-241
30	EE	Kumar N. Dwarakanath, R. D. (Shawn) Blanton: Exploiting Dominance and Equivalence using Fault Tuples. VTS 2002: 269-274
29	EE	Rahul Kundu, R. D. (Shawn) Blanton: Timed Test Generation Crosstalk Switch Failures in Domino CMOS Circuits. VTS 2002: 379-388
28	EE	Salvador Mir, H. Bederr, R. D. (Shawn) Blanton, Hans G. Kerkhoff, H. J. Klim: SoCs with MEMS? Can We Include MEMS in the SoCs Design and Test Flow? VTS 2002: 449-450
27	EE	Pranab K. Nag, Anne E. Gattiker, Sichao Wei, Ronald D. Blanton, Wojciech Maly: Modeling the Economics of Testing: A DFT Perspective. IEEE Design & Test of Computers 19(1): 29-41 (2002)
26	EE	Keerthi Heragu, Manish Sharma, Rahul Kundu, Ronald D. Blanton: Test vector generation for charge sharing failures in dynamic logic. IEEE Trans. on CAD of Integrated Circuits and Systems 21(12): 1502-1508 (2002)
2001
25	EE	Ravishankar Arunachalam, Ronald D. Blanton, Lawrence T. Pileggi: False Coupling Interactions in Static Timing Analysis. DAC 2001: 726-731
24	EE	Keerthi Heragu, Manish Sharma, Rahul Kundu, R. D. (Shawn) Blanton: Testing of Dynamic Logic Circuits Based on Charge Sharing. VTS 2001: 396-403
2000
23	EE	Kumar N. Dwarakanath, Ronald D. Blanton: Universal fault simulation using fault tuples. DAC 2000: 786-789
22		Rahul Kundu, Ronald D. Blanton: Identification of crosstalk switch failures in domino CMOS circuits. ITC 2000: 502-509
21		Nilmoni Deb, Ronald D. Blanton: Analysis of failure sources in surface-micromachined MEMS. ITC 2000: 739-749
20		Rao Desineni, Kumar N. Dwarakanath, Ronald D. Blanton: Universal test generation using fault tuples. ITC 2000: 812-819
19	EE	Noppanunt Utamaphethai, R. D. (Shawn) Blanton, John Paul Shen: Effectiveness of Microarchitecture Test Program Generation. IEEE Design & Test of Computers 17(4): 38-49 (2000)
18	EE	Ronald D. Blanton, John P. Hayes: On the design of fast, easily testable ALU's. IEEE Trans. VLSI Syst. 8(2): 220-223 (2000)
17	EE	Noppanunt Utamaphethai, R. D. (Shawn) Blanton, John Paul Shen: A Buffer-Oriented Methodology for Microarchitecture Validation. J. Electronic Testing 16(1-2): 49-65 (2000)
1999
16		Tao Jiang, Ronald D. Blanton: Particulate failures for surface-micromachined MEMS. ITC 1999: 329-337
15	EE	Noppanunt Utamaphethai, R. D. (Shawn) Blanton, John Paul Shen: Superscalar Processor Validation at the Microarchitecture Level. VLSI Design 1999: 300-305
14	EE	R. D. (Shawn) Blanton: IDDQ-Testability of Tree Circuits. VLSI Design 1999: 78-86
13		Bernard Courtois, R. D. (Shawn) Blanton: Guest Editors' Introduction. IEEE Design & Test of Computers 16(4): 16-17 (1999)
12	EE	Tamal Mukherjee, Gary K. Fedder, R. D. (Shawn) Blanton: Hierarchical Design and Test of Integrated Microsystems. IEEE Design & Test of Computers 16(4): 18-27 (1999)
1998
11	EE	Abhijeet Kolpekwar, Ronald D. Blanton, David Woodilla: Failure modes for stiction in surface-micromachined MEMS. ITC 1998: 551-556
10	EE	Abhijeet Kolpekwar, Chris S. Kellen, Ronald D. Blanton: MEMS fault model generation using CARAMEL. ITC 1998: 557-
1997
9	EE	Ronald D. Blanton, John P. Hayes: The input pattern fault model and its application. ED&TC 1997: 628
8		Ronald D. Blanton, John P. Hayes: Properties of the Input Pattern Fault Model. ICCD 1997: 372-380
7		Sichao Wei, Pranab K. Nag, Ronald D. Blanton, Anne E. Gattiker, Wojciech Maly: To DFT or Not to DFT? ITC 1997: 557-566
6		Abhijeet Kolpekwar, Ronald D. Blanton: Development of a MEMS Testing Methodology. ITC 1997: 923-931
5	EE	R. D. (Shawn) Blanton, John P. Hayes: Testability Properties of Divergent Trees. J. Electronic Testing 11(3): 197-209 (1997)
1996
4		Vishwani D. Agrawal, Ronald D. Blanton, Maurizio Damiani: Synthesis of Self-Testing Finite State Machines from High-Level Specifications. ITC 1996: 757-766
3	EE	R. D. (Shawn) Blanton, John P. Hayes: Design of a fast, easily testable ALU. VTS 1996: 9-16
2		Ronald D. Blanton, John P. Hayes: Testability of Convergent Tree Circuits. IEEE Trans. Computers 45(8): 950-963 (1996)
1993
1		Ronald D. Blanton, John P. Hayes: Efficient Testing of Tree Circuits. FTCS 1993: 176-185

Coauthor Index

1	Vishwani D. Agrawal	[4]
2	Ravishankar Arunachalam	[25]
3	H. Bederr	[28]
4	Brady Benware	[50]
5	Naresh K. Bhatti	[58]
6	Sounil Biswas	[39] [46] [49] [55] [56]
7	Jason G. Brown	[41] [42] [50] [51] [52] [53] [54] [57] [59]
8	Krishnendu Chakrabarty	[43]
9	John T. Chen	[31]
10	Bernard Courtois	[13]
11	Maurizio Damiani	[4]
12	Nilmoni Deb	[21] [32] [40]
13	Rao Desineni	[20] [31] [41] [44] [48] [52] [53]
14	Kumar N. Dwarakanath	[20] [23] [30] [31] [34] [39] [43] [48]
15	Gary K. Fedder	[12]
16	Y. Fei	[41]
17	Anne E. Gattiker	[7] [27] [35]
18	Padmini Gopalakrishnan	[41]
19	John P. Hayes	[1] [2] [3] [5] [8] [9] [18] [33]
20	Keerthi Heragu	[24] [26]
21	X. Huang	[41]
22	Tao Jiang	[16] [47]
23	Chris S. Kellen	[10]
24	Hans G. Kerkhoff	[28]
25	H. J. Klim	[28]
26	Abhijeet Kolpekwar	[6] [10] [11]
27	Rahul Kundu	[22] [24] [26] [29] [37] [38]
28	Peng Li	[46] [55]
29	Yen-Tzu Lin	[58]
30	Chunsheng Liu	[43]
31	Wojciech Maly	[7] [27] [31] [35] [36] [41] [50] [52]
32	Salvador Mir	[28]
33	Mahim Mishra	[41]
34	Subhasish Mitra	[45]
35	Tamal Mukherjee	[12]
36	Pranab K. Nag	[7] [27]
37	Jeffrey E. Nelson	[41] [50] [52] [53]
38	N. Patil	[52]
39	Lawrence T. Pileggi (Larry T. Pileggi, Lawrence T. Pillage)	[25] [46] [55] [59]
40	Osei Poku	[50] [58] [60]
41	V. Rovner	[41]
42	Chris Schuermyer	[50]
43	Anirudh B. Shah	[34]
44	Manish Sharma	[24] [26]
45	John Paul Shen	[15] [17] [19]
46	Thomas M. Storey	[35]
47	Wing Chiu Tam	[60]
48	Brian Taylor	[59]
49	S. Tiwary	[41]
50	Noppanunt Utamaphethai	[15] [17] [19]
51	Thomas J. Vogels	[31] [35] [36] [41]
52	Sichao Wei	[7] [27]
53	David Woodilla	[11]
54	Xiaochun Yu	[61]
55	Thomas Zanon	[35] [41] [50] [52]

Colors in the list of coauthors