2008 | ||
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31 | EE | Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao: Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness. DAC 2008: 900-905 |
30 | EE | Frank Liu, Peter Feldmann: MAISE: An Interconnect Simulation Engine for Timing and Noise Analysis. ISQED 2008: 621-626 |
29 | EE | Rouwaida Kanj, Zhuo Li, Rajiv V. Joshi, Frank Liu, Sani R. Nassif: A Root-Finding Method for Assessing SRAM Stability. ISQED 2008: 804-809 |
2007 | ||
28 | EE | Ying Zhou, Zhuo Li, Yuxin Tian, Weiping Shi, Frank Liu: A New Methodology for Interconnect Parasitics Extraction Considering Photo-Lithography Effects. ASP-DAC 2007: 450-455 |
27 | EE | Wenping Wang, Shengqi Yang, Sarvesh Bhardwaj, Rakesh Vattikonda, Sarma B. K. Vrudhula, Frank Liu, Yu Cao: The Impact of NBTI on the Performance of Combinational and Sequential Circuits. DAC 2007: 364-369 |
26 | EE | Frank Liu: A General Framework for Spatial Correlation Modeling in VLSI Design. DAC 2007: 817-822 |
25 | EE | Ritu Singhal, Asha Balijepalli, Anupama Subramaniam, Frank Liu, Sani R. Nassif, Yu Cao: Modeling and Analysis of Non-Rectangular Gate for Post-Lithography Circuit Simulation. DAC 2007: 823-828 |
24 | EE | Min Chen, Wei Zhao, Frank Liu, Yu Cao: Fast statistical circuit analysis with finite-point based transistor model. DATE 2007: 1391-1396 |
23 | EE | Frank Liu: An efficient method for statistical circuit simulation. ICCAD 2007: 719-724 |
22 | EE | Kanak Agarwal, Frank Liu: Efficient computation of current flow in signal wires for reliability analysis. ICCAD 2007: 741-746 |
21 | EE | Peng Li, Frank Liu, Xin Li, Lawrence T. Pileggi, Sani R. Nassif: Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction CoRR abs/0710.4654: (2007) |
20 | EE | Ganesh Venkataraman, Jiang Hu, Frank Liu: Integrated Placement and Skew Optimization for Rotary Clocking. IEEE Trans. VLSI Syst. 15(2): 149-158 (2007) |
19 | EE | Xiaoji Ye, Frank Liu, Peng Li: Fast Variational Interconnect Delay and Slew Computation Using Quadratic Models. IEEE Trans. VLSI Syst. 15(8): 913-926 (2007) |
18 | EE | Ram Bhuwan Pandit, Juming Tang, Frank Liu, Galina Mikhaylenko: A computer vision method to locate cold spots in foods in microwave sterilization processes. Pattern Recognition 40(12): 3667-3676 (2007) |
2006 | ||
17 | EE | Frank Liu: A practical method to estimate interconnect responses to variabilities. DATE 2006: 545-546 |
16 | EE | Ganesh Venkataraman, Jiang Hu, Frank Liu, Cliff C. N. Sze: Integrated placement and skew optimization for rotary clocking. DATE 2006: 756-761 |
15 | EE | Xiaoji Ye, Peng Li, Frank Liu: Practical variation-aware interconnect delay and slew analysis for statistical timing verification. ICCAD 2006: 54-59 |
14 | EE | Anand Ramalingam, David Z. Pan, Frank Liu, Sani R. Nassif: Accurate Thermal Analysis Considering Nonlinear Thermal Conductivity. ISQED 2006: 644-649 |
2005 | ||
13 | EE | Haihua Su, David Widiger, Chandramouli V. Kashyap, Frank Liu, Byron Krauter: A noise-driven effective capacitance method with fast embedded noise rule calculation for functional noise analysis. DAC 2005: 186-189 |
12 | EE | Peng Li, Frank Liu, Xin Li, Lawrence T. Pileggi, Sani R. Nassif: Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction. DATE 2005: 958-963 |
2004 | ||
11 | EE | Kanak Agarwal, Dennis Sylvester, David Blaauw, Frank Liu, Sani R. Nassif, Sarma B. K. Vrudhula: Variational delay metrics for interconnect timing analysis. DAC 2004: 381-384 |
10 | EE | Charles J. Alpert, Frank Liu, Chandramouli V. Kashyap, Anirudh Devgan: Closed-form delay and slew metrics made easy. IEEE Trans. on CAD of Integrated Circuits and Systems 23(12): 1661-1669 (2004) |
9 | EE | Frank Liu, Chandramouli V. Kashyap, Charles J. Alpert: A delay metric for RC circuits based on the Weibull distribution. IEEE Trans. on CAD of Integrated Circuits and Systems 23(3): 443-447 (2004) |
8 | EE | Chandramouli V. Kashyap, Charles J. Alpert, Frank Liu, Anirudh Devgan: Closed-form expressions for extending step delay and slew metrics to ramp inputs for RC trees. IEEE Trans. on CAD of Integrated Circuits and Systems 23(4): 509-516 (2004) |
2003 | ||
7 | EE | Charles J. Alpert, Frank Liu, Chandramouli V. Kashyap, Anirudh Devgan: Delay and slew metrics using the lognormal distribution. DAC 2003: 382-385 |
6 | EE | Rahul M. Rao, Frank Liu, Jeffrey L. Burns, Richard B. Brown: A Heuristic to Determine Low Leakage Sleep State Vectors for CMOS Combinational Circuits. ICCAD 2003: 689-692 |
5 | EE | Haihua Su, Frank Liu, Anirudh Devgan, Emrah Acar, Sani R. Nassif: Full chip leakage estimation considering power supply and temperature variations. ISLPED 2003: 78-83 |
4 | EE | Chandramouli V. Kashyap, Charles J. Alpert, Frank Liu, Anirudh Devgan: Closed form expressions for extending step delay and slew metrics to ramp inputs. ISPD 2003: 24-31 |
2002 | ||
3 | EE | Frank Liu, Chandramouli V. Kashyap, Charles J. Alpert: A delay metric for RC circuits based on the Weibull distribution. ICCAD 2002: 620-624 |
2 | EE | Duane S. Boning, Joseph Panganiban, Karen Gonzalez-Valentin, Sani R. Nassif, Chandler McDowell, Anne E. Gattiker, Frank Liu: Test structures for delay variability. Timing Issues in the Specification and Synthesis of Digital Systems 2002: 109 |
1 | EE | Chandramouli V. Kashyap, Charles J. Alpert, Frank Liu, Anirudh Devgan: PERI: a technique for extending delay and slew metrics to ramp inputs. Timing Issues in the Specification and Synthesis of Digital Systems 2002: 57-62 |