2008 |
31 | EE | Yun Ye,
Frank Liu,
Sani R. Nassif,
Yu Cao:
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness.
DAC 2008: 900-905 |
30 | EE | Frank Liu,
Peter Feldmann:
MAISE: An Interconnect Simulation Engine for Timing and Noise Analysis.
ISQED 2008: 621-626 |
29 | EE | Rouwaida Kanj,
Zhuo Li,
Rajiv V. Joshi,
Frank Liu,
Sani R. Nassif:
A Root-Finding Method for Assessing SRAM Stability.
ISQED 2008: 804-809 |
2007 |
28 | EE | Ying Zhou,
Zhuo Li,
Yuxin Tian,
Weiping Shi,
Frank Liu:
A New Methodology for Interconnect Parasitics Extraction Considering Photo-Lithography Effects.
ASP-DAC 2007: 450-455 |
27 | EE | Wenping Wang,
Shengqi Yang,
Sarvesh Bhardwaj,
Rakesh Vattikonda,
Sarma B. K. Vrudhula,
Frank Liu,
Yu Cao:
The Impact of NBTI on the Performance of Combinational and Sequential Circuits.
DAC 2007: 364-369 |
26 | EE | Frank Liu:
A General Framework for Spatial Correlation Modeling in VLSI Design.
DAC 2007: 817-822 |
25 | EE | Ritu Singhal,
Asha Balijepalli,
Anupama Subramaniam,
Frank Liu,
Sani R. Nassif,
Yu Cao:
Modeling and Analysis of Non-Rectangular Gate for Post-Lithography Circuit Simulation.
DAC 2007: 823-828 |
24 | EE | Min Chen,
Wei Zhao,
Frank Liu,
Yu Cao:
Fast statistical circuit analysis with finite-point based transistor model.
DATE 2007: 1391-1396 |
23 | EE | Frank Liu:
An efficient method for statistical circuit simulation.
ICCAD 2007: 719-724 |
22 | EE | Kanak Agarwal,
Frank Liu:
Efficient computation of current flow in signal wires for reliability analysis.
ICCAD 2007: 741-746 |
21 | EE | Peng Li,
Frank Liu,
Xin Li,
Lawrence T. Pileggi,
Sani R. Nassif:
Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction
CoRR abs/0710.4654: (2007) |
20 | EE | Ganesh Venkataraman,
Jiang Hu,
Frank Liu:
Integrated Placement and Skew Optimization for Rotary Clocking.
IEEE Trans. VLSI Syst. 15(2): 149-158 (2007) |
19 | EE | Xiaoji Ye,
Frank Liu,
Peng Li:
Fast Variational Interconnect Delay and Slew Computation Using Quadratic Models.
IEEE Trans. VLSI Syst. 15(8): 913-926 (2007) |
18 | EE | Ram Bhuwan Pandit,
Juming Tang,
Frank Liu,
Galina Mikhaylenko:
A computer vision method to locate cold spots in foods in microwave sterilization processes.
Pattern Recognition 40(12): 3667-3676 (2007) |
2006 |
17 | EE | Frank Liu:
A practical method to estimate interconnect responses to variabilities.
DATE 2006: 545-546 |
16 | EE | Ganesh Venkataraman,
Jiang Hu,
Frank Liu,
Cliff C. N. Sze:
Integrated placement and skew optimization for rotary clocking.
DATE 2006: 756-761 |
15 | EE | Xiaoji Ye,
Peng Li,
Frank Liu:
Practical variation-aware interconnect delay and slew analysis for statistical timing verification.
ICCAD 2006: 54-59 |
14 | EE | Anand Ramalingam,
David Z. Pan,
Frank Liu,
Sani R. Nassif:
Accurate Thermal Analysis Considering Nonlinear Thermal Conductivity.
ISQED 2006: 644-649 |
2005 |
13 | EE | Haihua Su,
David Widiger,
Chandramouli V. Kashyap,
Frank Liu,
Byron Krauter:
A noise-driven effective capacitance method with fast embedded noise rule calculation for functional noise analysis.
DAC 2005: 186-189 |
12 | EE | Peng Li,
Frank Liu,
Xin Li,
Lawrence T. Pileggi,
Sani R. Nassif:
Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction.
DATE 2005: 958-963 |
2004 |
11 | EE | Kanak Agarwal,
Dennis Sylvester,
David Blaauw,
Frank Liu,
Sani R. Nassif,
Sarma B. K. Vrudhula:
Variational delay metrics for interconnect timing analysis.
DAC 2004: 381-384 |
10 | EE | Charles J. Alpert,
Frank Liu,
Chandramouli V. Kashyap,
Anirudh Devgan:
Closed-form delay and slew metrics made easy.
IEEE Trans. on CAD of Integrated Circuits and Systems 23(12): 1661-1669 (2004) |
9 | EE | Frank Liu,
Chandramouli V. Kashyap,
Charles J. Alpert:
A delay metric for RC circuits based on the Weibull distribution.
IEEE Trans. on CAD of Integrated Circuits and Systems 23(3): 443-447 (2004) |
8 | EE | Chandramouli V. Kashyap,
Charles J. Alpert,
Frank Liu,
Anirudh Devgan:
Closed-form expressions for extending step delay and slew metrics to ramp inputs for RC trees.
IEEE Trans. on CAD of Integrated Circuits and Systems 23(4): 509-516 (2004) |
2003 |
7 | EE | Charles J. Alpert,
Frank Liu,
Chandramouli V. Kashyap,
Anirudh Devgan:
Delay and slew metrics using the lognormal distribution.
DAC 2003: 382-385 |
6 | EE | Rahul M. Rao,
Frank Liu,
Jeffrey L. Burns,
Richard B. Brown:
A Heuristic to Determine Low Leakage Sleep State Vectors for CMOS Combinational Circuits.
ICCAD 2003: 689-692 |
5 | EE | Haihua Su,
Frank Liu,
Anirudh Devgan,
Emrah Acar,
Sani R. Nassif:
Full chip leakage estimation considering power supply and temperature variations.
ISLPED 2003: 78-83 |
4 | EE | Chandramouli V. Kashyap,
Charles J. Alpert,
Frank Liu,
Anirudh Devgan:
Closed form expressions for extending step delay and slew metrics to ramp inputs.
ISPD 2003: 24-31 |
2002 |
3 | EE | Frank Liu,
Chandramouli V. Kashyap,
Charles J. Alpert:
A delay metric for RC circuits based on the Weibull distribution.
ICCAD 2002: 620-624 |
2 | EE | Duane S. Boning,
Joseph Panganiban,
Karen Gonzalez-Valentin,
Sani R. Nassif,
Chandler McDowell,
Anne E. Gattiker,
Frank Liu:
Test structures for delay variability.
Timing Issues in the Specification and Synthesis of Digital Systems 2002: 109 |
1 | EE | Chandramouli V. Kashyap,
Charles J. Alpert,
Frank Liu,
Anirudh Devgan:
PERI: a technique for extending delay and slew metrics to ramp inputs.
Timing Issues in the Specification and Synthesis of Digital Systems 2002: 57-62 |