Chenyue Ma

2009
2	EE	Chenyue Ma, Bo Li, Lining Zhang, Jin He, Xing Zhang, Xinnan Lin, Mansun Chan: A unified FinFET reliability model including high K gate stack dynamic threshold voltage, hot carrier injection, and negative bias temperature instability. ISQED 2009: 7-12
2008
1	EE	Yue Fu, Jin He, Feng Liu, Jie Feng, Chenyue Ma, Lining Zhang: Study on the Si-Ge Nanowire MOSFETs with the Core-Shell Structure. ISQED 2008: 531-536

Coauthor Index

1	Mansun Chan	[2]
2	Jie Feng	[1]
3	Yue Fu	[1]
4	Jin He	[1] [2]
5	Bo Li	[2]
6	Xinnan Lin	[2]
7	Feng Liu	[1]
8	Lining Zhang	[1] [2]
9	Xing Zhang	[2]