2009 |
54 | EE | Shingo Watanabe,
Masanori Hashimoto,
Toshinori Sato:
A case for exploiting complex arithmetic circuits towards performance yield enhancement.
ISQED 2009: 401-407 |
53 | EE | Takashi Enami,
Shinyu Ninomiya,
Masanori Hashimoto:
Statistical Timing Analysis Considering Spatially and Temporally Correlated Dynamic Power Supply Noise.
IEEE Trans. on CAD of Integrated Circuits and Systems 28(4): 541-553 (2009) |
2008 |
52 | EE | Koichi Hamamoto,
Hiroshi Fuketa,
Masanori Hashimoto,
Yukio Mitsuyama,
Takao Onoye:
Experimental study on body-biasing layout style-- negligible area overhead enables sufficient speed controllability --.
ACM Great Lakes Symposium on VLSI 2008: 387-390 |
51 | EE | Yasuhiro Ogasahara,
Masanori Hashimoto,
Takao Onoye:
Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification.
ASP-DAC 2008: 107-108 |
50 | EE | Ling Zhang,
Jianhua Liu,
Haikun Zhu,
Chung-Kuan Cheng,
Masanori Hashimoto:
High performance current-mode differential logic.
ASP-DAC 2008: 720-725 |
49 | EE | Takashi Enami,
Masanori Hashimoto,
Takashi Sato:
Decoupling capacitance allocation for timing with statistical noise model and timing analysis.
ICCAD 2008: 420-425 |
48 | EE | Yulei Zhang,
Ling Zhang,
Akira Tsuchiya,
Masanori Hashimoto,
Chung-Kuan Cheng:
On-chip high performance signaling using passive compensation.
ICCD 2008: 182-187 |
47 | EE | Hiroshi Fuketa,
Masanori Hashimoto,
Yukio Mitsuyama,
Takao Onoye:
Correlation verification between transistor variability model with body biasing and ring oscillation frequency in 90nm subthreshold circuits.
ISLPED 2008: 3-8 |
46 | EE | Takashi Enami,
Shinyu Ninomiya,
Masanori Hashimoto:
Statistical timing analysis considering spatially and temporally correlated dynamic power supply noise.
ISPD 2008: 160-167 |
45 | EE | Shinya Abe,
Masanori Hashimoto,
Takao Onoye:
Clock Skew Evaluation Considering Manufacturing Variability in Mesh-Style Clock Distribution.
ISQED 2008: 520-525 |
44 | EE | Masanori Hashimoto,
Junji Yamaguchi,
Takashi Sato,
Hidetoshi Onodera:
Timing Analysis Considering Temporal Supply Voltage Fluctuation.
IEICE Transactions 91-D(3): 655-660 (2008) |
2007 |
43 | EE | Kenichi Shinkai,
Masanori Hashimoto,
Takao Onoye:
Future Prediction of Self-Heating in Short Intra-Block Wires.
ISQED 2007: 660-665 |
42 | EE | Masanori Hashimoto,
Junji Yamaguchi,
Hidetoshi Onodera:
Timing Analysis Considering Spatial Power/Ground Level Variation.
IEICE Transactions 90-A(12): 2661-2668 (2007) |
41 | EE | Masanori Hashimoto,
Takahito Ijichi,
Shingo Takahashi,
Shuji Tsukiyama,
Isao Shirakawa:
Transistor Sizing of LCD Driver Circuit for Technology Migration.
IEICE Transactions 90-A(12): 2712-2717 (2007) |
40 | EE | Yasuhiro Ogasahara,
Masanori Hashimoto,
Takao Onoye:
Quantitative Prediction of On-Chip Capacitive and Inductive Crosstalk Noise and Tradeoff between Wire Cross-Sectional Area and Inductive Crosstalk Effect.
IEICE Transactions 90-A(4): 724-731 (2007) |
39 | EE | Hiroyuki Kobayashi,
Nobuto Ono,
Takashi Sato,
Jiro Iwai,
Hidenari Nakashima,
Takaaki Okumura,
Masanori Hashimoto:
Proposal of Metrics for SSTA Accuracy Evaluation.
IEICE Transactions 90-A(4): 808-814 (2007) |
38 | EE | Akira Tsuchiya,
Masanori Hashimoto,
Hidetoshi Onodera:
Optimal Termination of On-Chip Transmission-Lines for High-Speed Signaling.
IEICE Transactions 90-C(6): 1267-1273 (2007) |
2006 |
37 | EE | Akira Tsuchiya,
Masanori Hashimoto,
Hidetoshi Onodera:
Interconnect RL extraction at a single representative frequency.
ASP-DAC 2006: 515-520 |
36 | EE | Kenichi Shinkai,
Masanori Hashimoto,
Atsushi Kurokawa,
Takao Onoye:
A gate delay model focusing on current fluctuation over wide-range of process and environmental variability.
ICCAD 2006: 47-53 |
35 | EE | Yasuhiro Ogasahara,
Masanori Hashimoto,
Takao Onoye:
Quantitative Prediction of On-chip Capacitive and Inductive Crosstalk Noise and Discussion on Wire Cross-Sectional Area Toward Inductive Crosstalk Free Interconnects.
ICCD 2006 |
34 | EE | Takashi Sato,
Junji Ichimiya,
Nobuto Ono,
Masanori Hashimoto:
On-Chip Thermal Gradient Analysis Considering Interdependence between Leakage Power and Temperature.
IEICE Transactions 89-A(12): 3491-3499 (2006) |
33 | EE | Shingo Takahashi,
Shuji Tsukiyama,
Masanori Hashimoto,
Isao Shirakawa:
A Sampling Switch Design Procedure for Active Matrix Liquid Crystal Displays.
IEICE Transactions 89-A(12): 3538-3545 (2006) |
32 | EE | Toshiki Kanamoto,
Tatsuhiko Ikeda,
Akira Tsuchiya,
Hidetoshi Onodera,
Masanori Hashimoto:
Si-Substrate Modeling toward Substrate-Aware Interconnect Resistance and Inductance Extraction in SoC Design.
IEICE Transactions 89-A(12): 3560-3568 (2006) |
31 | EE | Akira Tsuchiya,
Masanori Hashimoto,
Hidetoshi Onodera:
Interconnect RL Extraction Based on Transfer Characteristics of Transmission-Line.
IEICE Transactions 89-A(12): 3585-3593 (2006) |
30 | EE | Toshiki Kanamoto,
Shigekiyo Akutsu,
Tamiyo Nakabayashi,
Takahiro Ichinomiya,
Koutaro Hachiya,
Atsushi Kurokawa,
Hiroshi Ishikawa,
Sakae Muromoto,
Hiroyuki Kobayashi,
Masanori Hashimoto:
Impact of Intrinsic Parasitic Extraction Errors on Timing and Noise Estimation.
IEICE Transactions 89-A(12): 3666-3670 (2006) |
2005 |
29 | EE | Yoshihiro Uchida,
Sadahiro Tani,
Masanori Hashimoto,
Shuji Tsukiyama,
Isao Shirakawa:
Interconnect capacitance extraction for system LCD circuits.
ACM Great Lakes Symposium on VLSI 2005: 160-163 |
28 | EE | Takashi Sato,
Junji Ichimiya,
Nobuto Ono,
Koutaro Hachiya,
Masanori Hashimoto:
On-chip thermal gradient analysis and temperature flattening for SoC design.
ASP-DAC 2005: 1074-1077 |
27 | EE | Akira Tsuchiya,
Masanori Hashimoto,
Hidetoshi Onodera:
Return path selection for loop RL extraction.
ASP-DAC 2005: 1078-1081 |
26 | EE | Masanori Hashimoto,
Junji Yamaguchi,
Takashi Sato,
Hidetoshi Onodera:
Timing analysis considering temporal supply voltage fluctuation.
ASP-DAC 2005: 1098-1101 |
25 | EE | Takashi Sato,
Masanori Hashimoto,
Hidetoshi Onodera:
Successive pad assignment algorithm to optimize number and location of power supply pad using incremental matrix inversion.
ASP-DAC 2005: 723-728 |
24 | EE | Akinori Shinmyo,
Masanori Hashimoto,
Hidetoshi Onodera:
Design and measurement of 6.4 Gbps 8: 1 multiplexer in 0.18µm CMOS process.
ASP-DAC 2005: 9-10 |
23 | EE | Atsushi Muramatsu,
Masanori Hashimoto,
Hidetoshi Onodera:
Effects of on-chip inductance on power distribution grid.
ISPD 2005: 63-69 |
22 | EE | Masanori Hashimoto,
Tomonori Yamamoto,
Hidetoshi Onodera:
Statistical Analysis of Clock Skew Variation in H-Tree Structure.
ISQED 2005: 402-407 |
21 | EE | Masanori Hashimoto,
Tomonori Yamamoto,
Hidetoshi Onodera:
Statistical Analysis of Clock Skew Variation in H-Tree Structure.
IEICE Transactions 88-A(12): 3375-3381 (2005) |
20 | EE | Takashi Sato,
Junji Ichimiya,
Nobuto Ono,
Koutaro Hachiya,
Masanori Hashimoto:
On-Chip Thermal Gradient Analysis and Temperature Flattening for SoC Design.
IEICE Transactions 88-A(12): 3382-3389 (2005) |
19 | EE | Takashi Sato,
Masanori Hashimoto,
Hidetoshi Onodera:
Successive Pad Assignment for Minimizing Supply Voltage Drop.
IEICE Transactions 88-A(12): 3429-3436 (2005) |
18 | EE | Atsushi Kurokawa,
Masanori Hashimoto,
Akira Kasebe,
Zhangcai Huang,
Yun Yang,
Yasuaki Inoue,
Ryosuke Inagaki,
Hiroo Masuda:
Second-Order Polynomial Expressions for On-Chip Interconnect Capacitance.
IEICE Transactions 88-A(12): 3453-3462 (2005) |
17 | EE | Atsushi Muramatsu,
Masanori Hashimoto,
Hidetoshi Onodera:
Effects of On-Chip Inductance on Power Distribution Grid.
IEICE Transactions 88-A(12): 3564-3572 (2005) |
16 | EE | Akira Tsuchiya,
Masanori Hashimoto,
Hidetoshi Onodera:
Performance Limitation of On-Chip Global Interconnects for High-Speed Signaling.
IEICE Transactions 88-A(4): 885-891 (2005) |
15 | EE | Takahito Miyazaki,
Masanori Hashimoto,
Hidetoshi Onodera:
A Performance Prediction of Clock Generation PLLs: A Ring Oscillator Based PLL and an LC Oscillator Based PLL.
IEICE Transactions 88-C(3): 437-444 (2005) |
2004 |
14 | EE | Takahito Miyazaki,
Masanori Hashimoto,
Hidetoshi Onodera:
A performance comparison of PLLs for clock generation using ring oscillator VCO and LC oscillator in a digital CMOS process.
ASP-DAC 2004: 545-546 |
13 | EE | Akira Tsuchiya,
Masanori Hashimoto,
Hidetoshi Onodera:
Representative frequency for interconnect R(f)L(f)C extraction.
ASP-DAC 2004: 691-696 |
12 | EE | Masanori Hashimoto,
Junji Yamaguchi,
Hidetoshi Onodera:
Timing analysis considering spatial power/ground level variation.
ICCAD 2004: 814-820 |
11 | EE | Masanori Hashimoto,
Kazunori Fujimori,
Hidetoshi Onodera:
Automatic Generation of Standard Cell Library in VDSM Technologies.
ISQED 2004: 36-41 |
10 | EE | Masanori Hashimoto,
Yuji Yamada,
Hidetoshi Onodera:
Equivalent waveform propagation for static timing analysis.
IEEE Trans. on CAD of Integrated Circuits and Systems 23(4): 498-508 (2004) |
2003 |
9 | EE | Masanori Hashimoto,
Yuji Yamada,
Hidetoshi Onodera:
Equivalent Waveform Propagation for Static Timing Analysis.
ICCAD 2003: 169-175 |
8 | EE | Masanori Hashimoto,
Yuji Yamada,
Hidetoshi Onodera:
Capturing crosstalk-induced waveform for accurate static timing analysis.
ISPD 2003: 18-23 |
2002 |
7 | EE | Masanori Hashimoto,
Masao Takahashi,
Hidetoshi Onodera:
Crosstalk noise optimization by post-layout transistor sizing.
ISPD 2002: 126-130 |
6 | | Masanori Hashimoto,
Yashiteru Hayashi,
Hidetoshi Onodera:
Experimental Study on Cell-Base High-Performance Datapath Design.
IWLS 2002: 283-287 |
2001 |
5 | EE | Masanori Hashimoto,
Hidetoshi Onodera:
Post-layout transistor sizing for power reduction in cell-based design.
ASP-DAC 2001: 359-365 |
4 | | Masao Takahashi,
Masanori Hashimoto,
Hidetoshi Onodera:
Crosstalk Noise Estimation for Generic RC Trees.
ICCD 2001: 110-117 |
2000 |
3 | EE | Masanori Hashimoto,
Hidetoshi Onodera:
A performance optimization method by gate sizing using statistical static timing analysis.
ISPD 2000: 111-116 |
1999 |
2 | EE | Masanori Hashimoto,
Hidetoshi Onodera,
Keikichi Tamaru:
A Practical Gate Resizing Technique Considering Glitch Reduction for Low Power Design.
DAC 1999: 446-451 |
1998 |
1 | EE | Masanori Hashimoto,
Hidetoshi Onodera,
Keikichi Tamaru:
A power optimization method considering glitch reduction by gate sizing.
ISLPED 1998: 221-226 |