| 2008 |
|---|
| 78 | EE | Daniela De Venuto,
Bruno Riccò:
High Resolution Read-Out Circuit for DNA Label-Free Detection System.
ISQED 2008: 708-711 |
| 77 | EE | Elisabetta Farella,
Omar Cafini,
Luca Benini,
Bruno Riccò:
A smart wireless glove for gesture interaction.
SIGGRAPH Posters 2008: 44 |
| 2007 |
|---|
| 76 | EE | Daniela De Venuto,
Bruno Riccò:
Inductive Fault Analysis for Test and Diagnosis of DNA Sensor Arrays.
ISQED 2007: 311-316 |
| 2006 |
|---|
| 75 | EE | Michele Sama,
Vincenzo Pacella,
Elisabetta Farella,
Luca Benini,
Bruno Riccò:
3dID: a low-power, low-cost hand motion capture device.
DATE Designers' Forum 2006: 136-141 |
| 74 | EE | Elisabetta Farella,
M. Sile O'Modhrain,
Luca Benini,
Bruno Riccò:
Gesture Signature for Ambient Intelligence Applications: A Feasibility Study.
Pervasive 2006: 288-304 |
| 73 | EE | Carlotta Guiducci,
Claudio Stagni,
M. Brocchi,
Massimo Lanzoni,
Bruno Riccò,
A. Nascetti,
D. Caputo,
G. de Cesare:
Innovative Optoelectronic Approaches to Biomolecular Analysis with Arrays of Silicon Devices.
VLSI-SoC 2006: 169-174 |
| 72 | EE | Daniela De Venuto,
Bruno Riccò:
Design and characterization of novel read-out systems for a capacitive DNA sensor.
Microelectronics Journal 37(12): 1610-1619 (2006) |
| 2005 |
|---|
| 71 | EE | Claudio Stagni,
Carlotta Guiducci,
Massimo Lanzoni,
Luca Benini,
Bruno Riccò:
Hardware-Software Design of a Smart Sensor for Fully-Electronic DNA Hybridization Detection.
DATE 2005: 198-203 |
| 70 | EE | Elisabetta Farella,
Augusto Pieracci,
Davide Brunelli,
Luca Benini,
Bruno Riccò,
Andrea Acquaviva:
Design and Implementation of WiMoCA Node for a Body Area Wireless Sensor Network.
ICW/ICHSN/ICMCS/SENET 2005: 342-347 |
| 69 | EE | Elisabetta Farella,
Davide Brunelli,
Luca Benini,
Bruno Riccò,
Maria Elena Bonfigli:
Pervasive Computing for Interactive Virtual Heritage.
IEEE MultiMedia 12(3): 46-58 (2005) |
| 2003 |
|---|
| 68 | EE | Daniela De Venuto,
Michael J. Ohletz,
Bruno Riccò:
Automatic Repositioning Technique for Digital Cell Based Window Comparators and Implementation within Mixed-Signal DfT Schemes.
ISQED 2003: 431-437 |
| 67 | EE | Cecilia Metra,
Stefano Di Francescantonio,
Michele Favalli,
Bruno Riccò:
Scan flip-flops with on-line testing ability with respect to input delay and crosstalk faults.
Microelectronics Journal 34(1): 23-29 (2003) |
| 2002 |
|---|
| 66 | EE | Franco Gatti,
Andrea Acquaviva,
Luca Benini,
Bruno Riccò:
Low Power Control Techniques For TFT LCD Displays.
CASES 2002: 218-224 |
| 65 | EE | Davide Bruni,
Luca Benini,
Bruno Riccò:
System lifetime extension by battery management: an experimental work.
CASES 2002: 232-237 |
| 64 | EE | Cecilia Metra,
Luca Schiano,
Bruno Riccò,
Michele Favalli:
Self-Checking Scheme for the On-Line Testing of Power Supply Noise.
DATE 2002: 832-836 |
| 63 | | Luigi Biagiotti,
M. Gavesi,
Claudio Melchiorri,
Bruno Riccò:
A New Stress Sensor for Force/Torque Measurements.
ICRA 2002: 1655-1660 |
| 62 | EE | Daniele Rossi,
Cecilia Metra,
Bruno Riccò:
Fast and Compact Error Correcting Scheme for Reliable Multilevel Flash Memories.
IOLTW 2002: 221-225 |
| 61 | EE | Elisa Ficarra,
Luca Benini,
Bruno Riccò,
Giampaolo Zuccheri:
Automated DNA sizing in atomic force microscope images.
ISBI 2002: 453-456 |
| 60 | EE | Davide Bertozzi,
Luca Benini,
Bruno Riccò:
Energy-efficient and reliable low-swing signaling for on-chip buses based on redundant coding.
ISCAS (1) 2002: 93-96 |
| 59 | EE | Luca Benini,
Davide Bruni,
Bruno Riccò,
Alberto Macii,
Enrico Macii:
An adaptive data compression scheme for memory traffic minimization in processor-based systems.
ISCAS (4) 2002: 866-869 |
| 58 | EE | Davide Bertozzi,
Luca Benini,
Bruno Riccò:
Parametric timing and power macromodels for high level simulation of low-swing interconnects.
ISLPED 2002: 307-312 |
| 57 | EE | Daniela De Venuto,
Michael J. Ohletz,
Bruno Riccò:
Testing of Analogue Circuits via (Standard) Digital Gates.
ISQED 2002: 112-119 |
| 56 | EE | Daniele Rossi,
Cecilia Metra,
Bruno Riccò:
Fast and Compact Error Correcting Scheme for Reliable Multilevel Flash Memories.
MTDT 2002: 27-31 |
| 55 | EE | Daniela De Venuto,
Michael J. Ohletz,
Bruno Riccò:
Digital Window Comparator DfT Scheme for Mixed-Signal ICs.
J. Electronic Testing 18(2): 121-128 (2002) |
| 54 | EE | Cecilia Metra,
Michele Favalli,
Stefano Di Francescantonio,
Bruno Riccò:
On-Chip Clock Faults' Detector.
J. Electronic Testing 18(4-5): 555-564 (2002) |
| 53 | EE | Ruggero Feruglio,
Fernanda Irrera,
Bruno Riccò:
Microscopic aspects of defect generation in SiO2.
Microelectronics Reliability 42(9-11): 1427-1432 (2002) |
| 2001 |
|---|
| 52 | EE | Andrea Acquaviva,
Luca Benini,
Bruno Riccò:
Processor frequency setting for energy minimization of streaming multimedia application.
CODES 2001: 249-253 |
| 51 | EE | Andrea Acquaviva,
Luca Benini,
Bruno Riccò:
An adaptive algorithm for low-power streaming multimedia processing.
DATE 2001: 273-279 |
| 50 | EE | Cecilia Metra,
Stefano Di Francescantonio,
Bruno Riccò,
T. M. Mak:
Evaluation of Clock Distribution Networks' Most Likely Faults and Produced Effects.
DFT 2001: 357-365 |
| 49 | | Cecilia Metra,
Andrea Pagano,
Bruno Riccò:
On-line testing of transient and crosstalk faults affecting interconnections of FPGA-implemented systems.
ITC 2001: 939-947 |
| 48 | EE | Andrea Acquaviva,
Luca Benini,
Bruno Riccò:
Software-controlled processor speed setting for low-power streamingmultimedia.
IEEE Trans. on CAD of Integrated Circuits and Systems 20(11): 1283-1292 (2001) |
| 47 | EE | Andrea Acquaviva,
Luca Benini,
Bruno Riccò:
Energy characterization of embedded real-time operating systems.
SIGARCH Computer Architecture News 29(5): 13-18 (2001) |
| 2000 |
|---|
| 46 | EE | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
On-Line Testing and Diagnosis of Bus Lines with respect to Intermediate Voltage Values.
DATE 2000: 763 |
| 45 | EE | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
Self-Checking Detection and Diagnosis of Transient, Delay, and Crosstalk Faults Affecting Bus Lines.
IEEE Trans. Computers 49(6): 560-574 (2000) |
| 1999 |
|---|
| 44 | EE | Alessandro Bogliolo,
Luca Benini,
Bruno Riccò,
Giovanni De Micheli:
Efficient switching activity computation during high-level synthesis of control-dominated designs.
ISLPED 1999: 127-132 |
| 43 | | Cecilia Metra,
Flavio Giovanelli,
Mani Soma,
Bruno Riccò:
Self-checking scheme for very fast clocks' skew correction.
ITC 1999: 652-661 |
| 1998 |
|---|
| 42 | EE | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
Highly Testable and Compact 1-out-of-n Code Checker with Single Output.
DATE 1998: 981-982 |
| 41 | EE | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
Signal Coding Technique and CMOS Gates for Strongly Fault-Secure Combinational Functional Blocks.
DFT 1998: 174-182 |
| 40 | EE | Luca Benini,
Alessandro Bogliolo,
Stefano Cavallucci,
Bruno Riccò:
Monitoring system activity for OS-directed dynamic power management.
ISLPED 1998: 185-190 |
| 39 | EE | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
On-line detection of logic errors due to crosstalk, delay, and transient faults.
ITC 1998: 524-533 |
| 38 | EE | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
Concurrent Checking of Clock Signal Correctness.
IEEE Design & Test of Computers 15(4): 42-48 (1998) |
| 1997 |
|---|
| 37 | EE | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
Compact and low power on-line self-testing voting scheme.
DFT 1997: 137-147 |
| 36 | | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
On-Line Testing Scheme for Clock's Faults.
ITC 1997: 587-596 |
| 35 | EE | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
Highly testable and compact single output comparator.
VTS 1997: 210-215 |
| 34 | EE | Alessandro Bogliolo,
Luca Benini,
Giovanni De Micheli,
Bruno Riccò:
Gate-level power and current simulation of CMOS integrated circuits.
IEEE Trans. VLSI Syst. 5(4): 473-488 (1997) |
| 33 | EE | Cecilia Metra,
Michele Favalli,
Piero Olivo,
Bruno Riccò:
On-line detection of bridging and delay faults in functional blocks of CMOS self-checking circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 16(7): 770-776 (1997) |
| 1996 |
|---|
| 32 | EE | Alessandro Bogliolo,
Luca Benini,
Bruno Riccò:
Power Estimation of Cell-Based CMOS Circuits.
DAC 1996: 433-438 |
| 31 | EE | Alessandro Bogliolo,
Luca Benini,
Giovanni De Micheli,
Bruno Riccò:
Gate-level current waveform simulation of CMOS integrated circuits.
ISLPED 1996: 109-112 |
| 30 | EE | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
Embedded two-rail checkers with on-line testing ability.
VTS 1996: 145-150 |
| 1995 |
|---|
| 29 | EE | Alessandro Bogliolo,
Maurizio Damiani,
Piero Olivo,
Bruno Riccò:
Reliability evaluation of combinational logic circuits by symbolic simulation.
VTS 1995: 235-243 |
| 28 | EE | Cecilia Metra,
Michele Favalli,
Piero Olivo,
Bruno Riccò:
Design of CMOS checkers with improved testability of bridging and transistor stuck-on faults.
J. Electronic Testing 6(1): 7-22 (1995) |
| 1994 |
|---|
| 27 | | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
CMOS Self Checking Circuits with Faulty Sequential Functional Block.
DFT 1994: 133-141 |
| 26 | | Cecilia Metra,
Michele Favalli,
Bruno Riccò:
Highly Testable and Compact 1-out-of-n CMOS Checkers.
DFT 1994: 142-150 |
| 25 | | Michele Favalli,
Marcello Dalpasso,
Piero Olivo,
Bruno Riccò:
Modeling of Broken Connections Faults in CMOS ICs.
EDAC-ETC-EUROASIC 1994: 159-164 |
| 1993 |
|---|
| 24 | | Cecilia Metra,
Michele Favalli,
Piero Olivo,
Bruno Riccò:
Design Rules for CMOS Self Checking Circuits with Parametric Faults in the Functional Block.
DFT 1993: 271-278 |
| 23 | | Cecilia Metra,
Michele Favalli,
Piero Olivo,
Bruno Riccò:
A Highly Testable 1-out-of-3 CMOS Checker.
DFT 1993: 279-286 |
| 22 | | Michele Favalli,
Marcello Dalpasso,
Piero Olivo,
Bruno Riccò:
Analyss of Dynamic Effects of Resistive Bridging Faults in CMOS and BiCMOS Digital ICs.
ITC 1993: 865-874 |
| 21 | EE | Michele Favalli,
Marcello Dalpasso,
Piero Olivo,
Bruno Riccò:
Analysis of resistive bridging fault detection in BiCMOS digital ICs.
IEEE Trans. VLSI Syst. 1(3): 342-355 (1993) |
| 20 | EE | Antonio Abramo,
Franco Venturi,
Enrico Sangiorgi,
Jack M. Higman,
Bruno Riccò:
A numerical method to compute isotropic band models from anisotropic semiconductor band structures.
IEEE Trans. on CAD of Integrated Circuits and Systems 12(9): 1327-1336 (1993) |
| 19 | EE | Marcello Dalpasso,
Michele Favalli,
Piero Olivo,
Bruno Riccò:
Fault simulation of parametric bridging faults in CMOS IC's.
IEEE Trans. on CAD of Integrated Circuits and Systems 12(9): 1403-1410 (1993) |
| 1992 |
|---|
| 18 | | Michele Favalli,
Marcello Dalpasso,
Piero Olivo,
Bruno Riccò:
Analysis of Steady State Detection of Resistive Bridging Faults in BiCMOS Digital ICs.
ITC 1992: 466-475 |
| 17 | | Marcello Dalpasso,
Michele Favalli,
Piero Olivo,
Bruno Riccò:
Parametric Bridging Fault Characterization for the Fault Simulation of Library-Based ICs.
ITC 1992: 486-495 |
| 16 | | Cecilia Metra,
Michele Favalli,
Piero Olivo,
Bruno Riccò:
CMOS Checkers with Testable Bridging and Transistor Stuck-on Faults.
ITC 1992: 948-957 |
| 15 | EE | Michele Favalli,
Piero Olivo,
Bruno Riccò:
A probabilistic fault model for `analog' faults in digital CMOS circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 11(11): 1459-1462 (1992) |
| 14 | EE | Silvia Ercolani,
Michele Favalli,
Maurizio Damiani,
Piero Olivo,
Bruno Riccò:
Testability measures in pseudorandom testing.
IEEE Trans. on CAD of Integrated Circuits and Systems 11(6): 794-800 (1992) |
| 13 | EE | Michele Favalli,
Piero Olivo,
Bruno Riccò:
Dynamic effects in the detection of bridging faults in CMOS ICs.
J. Electronic Testing 3(3): 197-205 (1992) |
| 1991 |
|---|
| 12 | | Maurizio Damiani,
Piero Olivo,
Bruno Riccò:
Analysis and Design of Linear Finite State Machines for Signature Analysis Testing.
IEEE Trans. Computers 40(9): 1034-1045 (1991) |
| 11 | EE | Franco Venturi,
Enrico Sangiorgi,
Rosella Brunetti,
Wolfgang Quade,
Carlo Jacoboni,
Bruno Riccò:
Monte Carlo simulations of high energy electrons and holes in Si-n-MOSFET's.
IEEE Trans. on CAD of Integrated Circuits and Systems 10(10): 1276-1286 (1991) |
| 10 | EE | Michele Favalli,
Piero Olivo,
Bruno Riccò:
A novel critical path heuristic for fast fault grading.
IEEE Trans. on CAD of Integrated Circuits and Systems 10(4): 544-548 (1991) |
| 9 | EE | Michele Favalli,
Piero Olivo,
Maurizio Damiani,
Bruno Riccò:
Fault simulation of unconventional faults in CMOS circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 10(5): 677-682 (1991) |
| 8 | EE | Michele Favalli,
Piero Olivo,
Bruno Riccò,
Fabio Somenzi:
Fault simulation for general FCMOS ICs.
J. Electronic Testing 2(2): 181-190 (1991) |
| 1990 |
|---|
| 7 | EE | Maurizio Damiani,
Piero Olivo,
Michele Favalli,
Silvia Ercolani,
Bruno Riccò:
Aliasing in signature analysis testing with multiple input shift registers.
IEEE Trans. on CAD of Integrated Circuits and Systems 9(12): 1344-1353 (1990) |
| 1989 |
|---|
| 6 | | Mattia Lanzoni,
Piero Olivo,
Bruno Riccò:
A Testing Technique to Characterize E^2PROM's Aging and Endurance.
ITC 1989: 391-396 |
| 5 | | Michele Favalli,
Piero Olivo,
Maurizio Damiani,
Bruno Riccò:
CMOS Design for Improved IC Testability.
ITC 1989: 934 |
| 4 | | Piero Olivo,
Maurizio Damiani,
Bruno Riccò:
On the Design of Multiple-Input Shift-Registers for Signature Analysis Testing.
ITC 1989: 936 |
| 3 | EE | Maurizio Damiani,
Piero Olivo,
Michele Favalli,
Bruno Riccò:
An analytical model for the aliasing probability in signature analysis testing.
IEEE Trans. on CAD of Integrated Circuits and Systems 8(11): 1133-1144 (1989) |
| 2 | EE | Franco Venturi,
R. Kent Smith,
Enrico Sangiorgi,
Mark R. Pinto,
Bruno Riccò:
A general purpose device simulator coupling Poisson and Monte Carlo transport with applications to deep submicron MOSFETs.
IEEE Trans. on CAD of Integrated Circuits and Systems 8(4): 360-369 (1989) |
| 1988 |
|---|
| 1 | EE | Enrico Sangiorgi,
Bruno Riccò,
Franco Venturi:
MOS2: an efficient MOnte Carlo Simulator for MOS devices.
IEEE Trans. on CAD of Integrated Circuits and Systems 7(2): 259-271 (1988) |
