2008 | ||
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3 | EE | Je-Hyoung Park, Ali Shakouri, Sung-Mo Kang: Fast Evaluation Method for Transient Hot Spots in VLSI ICs in Packages. ISQED 2008: 600-603 |
2004 | ||
2 | EE | James Christofferson, Ali Shakouri: Thermal measurements of active semiconductor micro-structures acquired through the substrate using near IR thermoreflectance. Microelectronics Journal 35(10): 791-796 (2004) |
2002 | ||
1 | Peyman Milanfar, Ali Shakouri: A statistical analysis of diffraction-limited imaging. ICIP (1) 2002: 864-867 |
1 | James Christofferson | [2] |
2 | Sung-Mo Kang | [3] |
3 | Peyman Milanfar | [1] |
4 | Je-Hyoung Park | [3] |