| |
| 2008 | ||
|---|---|---|
| 2 | EE | Young-Gu Kim, Soo-Hwan Kim, Hoon Lim, Sanghoon Lee, Keun-Ho Lee, Young-Kwan Park, Moon-Hyun Yoo: The Statistical Failure Analysis for the Design of Robust SRAM in Nano-Scale Era. ISQED 2008: 369-372 |
| 2006 | ||
| 1 | EE | Young-Gu Kim, Sang-Hoon Lee, Dae-Han Kim, Jae-Woo Im, Sung-Eun Yu, Dae-Wook Kim, Young-Kwan Park, Jeong-Taek Kong: Sensing Margin Analysis of MLC Flash Memories Using a Novel Unified Statistical Model. ISQED 2006: 185-189 |
| 1 | Jae-Woo Im | [1] |
| 2 | Dae-Han Kim | [1] |
| 3 | Dae-Wook Kim | [1] |
| 4 | Soo-Hwan Kim | [2] |
| 5 | Jeong-Taek Kong | [1] |
| 6 | Keun-Ho Lee | [2] |
| 7 | Sang-Hoon Lee | [1] |
| 8 | Sanghoon Lee | [2] |
| 9 | Hoon Lim | [2] |
| 10 | Young-Kwan Park | [1] [2] |
| 11 | Moon-Hyun Yoo | [2] |
| 12 | Sung-Eun Yu | [1] |