| 2008 |
|---|
| 9 | EE | Jason G. Brown,
Brian Taylor,
Ronald D. Blanton,
Larry T. Pileggi:
Automated Testability Enhancements for Logic Brick Libraries.
DATE 2008: 480-485 |
| 8 | EE | Jason G. Brown,
R. D. (Shawn) Blanton:
Automated Standard Cell Library Analysis for Improved Defect Modeling.
ISQED 2008: 643-648 |
| 2007 |
|---|
| 7 | EE | Jason G. Brown,
R. D. (Shawn) Blanton:
A Built-in Self-test and Diagnosis Strategy for Chemically Assembled Electronic Nanotechnology.
J. Electronic Testing 23(2-3): 131-144 (2007) |
| 2006 |
|---|
| 6 | EE | Jeffrey E. Nelson,
Jason G. Brown,
Rao Desineni,
R. D. (Shawn) Blanton:
Multiple-detect ATPG based on physical neighborhoods.
DAC 2006: 1099-1102 |
| 5 | EE | Jeffrey E. Nelson,
Thomas Zanon,
Rao Desineni,
Jason G. Brown,
N. Patil,
Wojciech Maly,
R. D. (Shawn) Blanton:
Extraction of defect density and size distributions from wafer sort test results.
DATE 2006: 913-918 |
| 4 | EE | Jason G. Brown,
R. D. (Shawn) Blanton:
Exploiting Regularity for Inductive Fault Analysis.
VTS 2006: 364-369 |
| 3 | EE | Jeffrey E. Nelson,
Thomas Zanon,
Jason G. Brown,
Osei Poku,
R. D. (Shawn) Blanton,
Wojciech Maly,
Brady Benware,
Chris Schuermyer:
Extracting Defect Density and Size Distributions from Product ICs.
IEEE Design & Test of Computers 23(5): 390-400 (2006) |
| 2004 |
|---|
| 2 | EE | Jason G. Brown,
R. D. (Shawn) Blanton:
CAEN-BIST: Testing the NanoFabric.
ITC 2004: 462-471 |
| 1 | EE | Thomas J. Vogels,
Thomas Zanon,
Rao Desineni,
R. D. (Shawn) Blanton,
Wojciech Maly,
Jason G. Brown,
Jeffrey E. Nelson,
Y. Fei,
X. Huang,
Padmini Gopalakrishnan,
Mahim Mishra,
V. Rovner,
S. Tiwary:
Benchmarking Diagnosis Algorithms With a Diverse Set of IC Deformations.
ITC 2004: 508-517 |
