2008 |
14 | EE | Jian Kang,
Sharad C. Seth,
Yi-Shing Chang,
Vijay Gangaram:
Efficient Selection of Observation Points for Functional Tests.
ISQED 2008: 236-241 |
13 | EE | I-De Huang,
Yi-Shing Chang,
Sandeep K. Gupta,
Sreejit Chakravarty:
An Industrial Case Study of Sticky Path-Delay Faults.
VTS 2008: 395-402 |
12 | EE | Abhijit Jas,
Yi-Shing Chang,
Sreejit Chakravarty:
A Methodology for Handling Complex Functional Constraints for Large Industrial Designs.
J. Electronic Testing 24(1-3): 259-269 (2008) |
2006 |
11 | EE | Abhijit Jas,
Yi-Shing Chang,
Sreejit Chakravarty:
An Approach to Minimizing Functional Constraints.
DFT 2006: 215-226 |
2005 |
10 | EE | Yi-Shing Chang,
Sreejit Chakravarty,
Hiep Hoang,
Nick Thorpe,
Khen Wee:
Transition Tests for High Performance Microprocessors.
VTS 2005: 29-34 |
9 | EE | Sreejit Chakravarty,
Yi-Shing Chang,
Hiep Hoang,
Sridhar Jayaraman,
Silvio Picano,
Cheryl Prunty,
Eric W. Savage,
Rehan Sheikh,
Eric N. Tran,
Khen Wee:
Experimental Evaluation of Bridge Patterns for a High Performance Microprocessor.
VTS 2005: 337-342 |
8 | EE | Sandip Kundu,
Sujit T. Zachariah,
Yi-Shing Chang,
Chandra Tirumurti:
On modeling crosstalk faults.
IEEE Trans. on CAD of Integrated Circuits and Systems 24(12): 1909-1915 (2005) |
2004 |
7 | EE | Chandra Tirumurti,
Sandip Kundu,
Susmita Sur-Kolay,
Yi-Shing Chang:
A Modeling Approach for Addressing Power Supply Switching Noise Related Failures of Integrated Circuit.
DATE 2004: 1078-1083 |
2003 |
6 | EE | Sujit T. Zachariah,
Yi-Shing Chang,
Sandip Kundu,
Chandra Tirumurti:
On Modeling Cross-Talk Faults.
DATE 2003: 10490-10495 |
5 | EE | Yi-Shing Chang,
Sandeep K. Gupta,
Melvin A. Breuer:
Test Generation for Maximizing Ground Bounce Considering Circuit Delay.
VTS 2003: 151-157 |
2001 |
4 | EE | Yi-Shing Chang,
Sandeep K. Gupta,
Melvin A. Breuer:
Test Generation for Maximizing Ground Bounce for Internal Circuitry with Reconvergent Fan-out.
VTS 2001: 358-367 |
1999 |
3 | EE | Yi-Shing Chang,
Sandeep K. Gupta,
Melvin A. Breuer:
Test Generation for Ground Bounce in Internal Logic Circuitry.
VTS 1999: 95-105 |
1997 |
2 | EE | Yi-Shing Chang,
Sandeep K. Gupta,
Melvin A. Breuer:
Analysis of Ground Bounce in Deep Sub-Micron Circuits.
VTS 1997: 110-116 |
1992 |
1 | | Thou-Ho Chen,
Liang-Gee Chen,
Yi-Shing Chang:
Design of Concurrent Error-Detectable VLSI-Based Array Dividers.
ICCD 1992: 72-75 |