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Yi-Shing Chang

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2008
14EEJian Kang, Sharad C. Seth, Yi-Shing Chang, Vijay Gangaram: Efficient Selection of Observation Points for Functional Tests. ISQED 2008: 236-241
13EEI-De Huang, Yi-Shing Chang, Sandeep K. Gupta, Sreejit Chakravarty: An Industrial Case Study of Sticky Path-Delay Faults. VTS 2008: 395-402
12EEAbhijit Jas, Yi-Shing Chang, Sreejit Chakravarty: A Methodology for Handling Complex Functional Constraints for Large Industrial Designs. J. Electronic Testing 24(1-3): 259-269 (2008)
2006
11EEAbhijit Jas, Yi-Shing Chang, Sreejit Chakravarty: An Approach to Minimizing Functional Constraints. DFT 2006: 215-226
2005
10EEYi-Shing Chang, Sreejit Chakravarty, Hiep Hoang, Nick Thorpe, Khen Wee: Transition Tests for High Performance Microprocessors. VTS 2005: 29-34
9EESreejit Chakravarty, Yi-Shing Chang, Hiep Hoang, Sridhar Jayaraman, Silvio Picano, Cheryl Prunty, Eric W. Savage, Rehan Sheikh, Eric N. Tran, Khen Wee: Experimental Evaluation of Bridge Patterns for a High Performance Microprocessor. VTS 2005: 337-342
8EESandip Kundu, Sujit T. Zachariah, Yi-Shing Chang, Chandra Tirumurti: On modeling crosstalk faults. IEEE Trans. on CAD of Integrated Circuits and Systems 24(12): 1909-1915 (2005)
2004
7EEChandra Tirumurti, Sandip Kundu, Susmita Sur-Kolay, Yi-Shing Chang: A Modeling Approach for Addressing Power Supply Switching Noise Related Failures of Integrated Circuit. DATE 2004: 1078-1083
2003
6EESujit T. Zachariah, Yi-Shing Chang, Sandip Kundu, Chandra Tirumurti: On Modeling Cross-Talk Faults. DATE 2003: 10490-10495
5EEYi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer: Test Generation for Maximizing Ground Bounce Considering Circuit Delay. VTS 2003: 151-157
2001
4EEYi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer: Test Generation for Maximizing Ground Bounce for Internal Circuitry with Reconvergent Fan-out. VTS 2001: 358-367
1999
3EEYi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer: Test Generation for Ground Bounce in Internal Logic Circuitry. VTS 1999: 95-105
1997
2EEYi-Shing Chang, Sandeep K. Gupta, Melvin A. Breuer: Analysis of Ground Bounce in Deep Sub-Micron Circuits. VTS 1997: 110-116
1992
1 Thou-Ho Chen, Liang-Gee Chen, Yi-Shing Chang: Design of Concurrent Error-Detectable VLSI-Based Array Dividers. ICCD 1992: 72-75

Coauthor Index

1Melvin A. Breuer [2] [3] [4] [5]
2Sreejit Chakravarty [9] [10] [11] [12] [13]
3Liang-Gee Chen [1]
4Thou-Ho Chen [1]
5Vijay Gangaram [14]
6Sandeep K. Gupta [2] [3] [4] [5] [13]
7Hiep Hoang [9] [10]
8I-De Huang [13]
9Abhijit Jas [11] [12]
10Sridhar Jayaraman [9]
11Jian Kang [14]
12Sandip Kundu [6] [7] [8]
13Silvio Picano [9]
14Cheryl Prunty [9]
15Eric W. Savage [9]
16Sharad C. Seth [14]
17Rehan Sheikh [9]
18Susmita Sur-Kolay [7]
19Nick Thorpe [10]
20Chandra Tirumurti [6] [7] [8]
21Eric N. Tran [9]
22Khen Wee [9] [10]
23Sujit T. Zachariah [6] [8]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)