| 2008 |
|---|
| 6 | EE | Young-Gu Kim,
Soo-Hwan Kim,
Hoon Lim,
Sanghoon Lee,
Keun-Ho Lee,
Young-Kwan Park,
Moon-Hyun Yoo:
The Statistical Failure Analysis for the Design of Robust SRAM in Nano-Scale Era.
ISQED 2008: 369-372 |
| 2006 |
|---|
| 5 | EE | Young-Gu Kim,
Sang-Hoon Lee,
Dae-Han Kim,
Jae-Woo Im,
Sung-Eun Yu,
Dae-Wook Kim,
Young-Kwan Park,
Jeong-Taek Kong:
Sensing Margin Analysis of MLC Flash Memories Using a Novel Unified Statistical Model.
ISQED 2006: 185-189 |
| 2003 |
|---|
| 4 | EE | Won-Seok Lee,
Keun-Ho Lee,
Jin-Kyu Park,
Tae-Kyung Kim,
Young-Kwan Park,
Jeong-Taek Kong:
Investigation of the capacitance deviation due to metal-fills and the effective interconnect geometry modeling.
ISQED 2003: 373-376 |
| 2002 |
|---|
| 3 | EE | Jin-Kyu Park,
Keun-Ho Lee,
Chang-Sub Lee,
Gi-Young Yang,
Young-Kwan Park,
Jeong-Taek Kong:
Characterizing the Current Degradation of Abnormally Structured MOS Transistors Using a 3D Poisson Solver.
ISQED 2002: 322-325 |
| 2001 |
|---|
| 2 | EE | Tae-Jin Kwon,
Sang-Hoon Lee,
Tae-Seon Kim,
Hoe-Jin Lee,
Young-Kwan Park,
Taek-Soo Kim,
Seok-Jin Kim,
Jeong-Taek Kong:
Performance Improvement for High Speed Devices Using E-tests and the SPICE Model.
ISQED 2001: 443- |
| 2000 |
|---|
| 1 | EE | Kwan-Do Kim,
Young-Kwan Park,
Jun-Ha Lee,
Jeong-Taek Kong,
Hee-Sung Kang,
Young-Wug Kim,
Seok-Jin Kim:
Three Dimensional Analysis of Thermal Degradation Effects in FDSOI MOSFET's.
ISQED 2000: 87- |
