| 2008 |
|---|
| 7 | EE | Stelios Neophytou,
Maria K. Michael:
Two New Methods for Accurate Test Set Relaxation via Test Set Replacement.
ISQED 2008: 827-831 |
| 6 | EE | Stelios Neophytou,
Maria K. Michael:
On the Relaxation of n-detect Test Sets.
VTS 2008: 187-192 |
| 2007 |
|---|
| 5 | EE | Stelios Neophytou,
Maria K. Michael:
Hierarchical Fault Compatibility Identification for Test Generation with a Small Number of Specified Bits.
DFT 2007: 439-447 |
| 2006 |
|---|
| 4 | EE | Stelios Neophytou,
Maria K. Michael,
Spyros Tragoudas:
Efficient Deterministic Test Generation for BIST Schemes with LFSR Reseeding.
IOLTS 2006: 43-50 |
| 3 | EE | Stelios Neophytou,
Maria K. Michael,
Spyros Tragoudas:
Functions for Quality Transition-Fault Tests and Their Applications in Test-Set Enhancement.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(12): 3026-3035 (2006) |
| 2005 |
|---|
| 2 | EE | Stelios Neophytou,
Maria K. Michael,
Spyros Tragoudas:
Test set enhancement for quality transition faults using function-based methods.
ACM Great Lakes Symposium on VLSI 2005: 182-187 |
| 1 | EE | Maria K. Michael,
Stelios Neophytou,
Spyros Tragoudas:
Functions for Quality Transition Fault Tests.
ISQED 2005: 327-332 |
