| 2008 |
|---|
| 5 | EE | Eric Karl,
Dennis Sylvester,
David Blaauw:
Analysis of System-Level Reliability Factors and Implications on Real-Time Monitoring Methods for Oxide Breakdown Device Failures.
ISQED 2008: 391-395 |
| 4 | EE | Eric Karl,
David Blaauw,
Dennis Sylvester,
Trevor N. Mudge:
Multi-Mechanism Reliability Modeling and Management in Dynamic Systems.
IEEE Trans. VLSI Syst. 16(4): 476-487 (2008) |
| 2006 |
|---|
| 3 | EE | Eric Karl,
David Blaauw,
Dennis Sylvester,
Trevor N. Mudge:
Reliability modeling and management in dynamic microprocessor-based systems.
DAC 2006: 1057-1060 |
| 2 | EE | Dennis Sylvester,
David Blaauw,
Eric Karl:
ElastIC: An Adaptive Self-Healing Architecture for Unpredictable Silicon.
IEEE Design & Test of Computers 23(6): 484-490 (2006) |
| 2005 |
|---|
| 1 | EE | Eric Karl,
Dennis Sylvester,
David Blaauw:
Timing error correction techniques for voltage-scalable on-chip memories.
ISCAS (4) 2005: 3563-3566 |
