Rouwaida Kanj

2009
14	EE	Rouwaida Kanj, Rajiv V. Joshi, Jente B. Kuang, J. Kim, Mesut Meterelliyoz, W. Reohr, Sani R. Nassif, Kevin J. Nowka: Statistical yield analysis of silicon-on-insulator embedded DRAM. ISQED 2009: 190-194
13	EE	Ying Zhou, Rouwaida Kanj, Kanak Agarwal, Zhuo Li, Rajiv V. Joshi, Sani R. Nassif, Weiping Shi: The impact of BEOL lithography effects on the SRAM cell performance and yield. ISQED 2009: 607-612
2008
12	EE	Rouwaida Kanj, Rajiv V. Joshi, Zhou Li, Jente B. Kuang, Hung C. Ngo, Ying Zhou, Weiping Shi, Sani R. Nassif: SRAM methodology for yield and power efficiency: per-element selectable supplies and memory reconfiguration schemes. ISLPED 2008: 87-92
11	EE	Rouwaida Kanj, Rajiv V. Joshi, Keunwoo Kim, Richard Williams, Sani R. Nassif: Statistical Evaluation of Split Gate Opportunities for Improved 8T/6T Column-Decoupled SRAM Cell Yield. ISQED 2008: 702-707
10	EE	Rouwaida Kanj, Zhuo Li, Rajiv V. Joshi, Frank Liu, Sani R. Nassif: A Root-Finding Method for Assessing SRAM Stability. ISQED 2008: 804-809
2007
9	EE	Rajiv V. Joshi, Rouwaida Kanj, Keunwoo Kim, Richard Q. Williams, Ching-Te Chuang: A floating-body dynamic supply boosting technique for low-voltage sram in nanoscale PD/SOI CMOS technologies. ISLPED 2007: 8-13
8	EE	Amin Khajeh Djahromi, Ahmed M. Eltawil, Fadi J. Kurdahi, Rouwaida Kanj: Cross Layer Error Exploitation for Aggressive Voltage Scaling. ISQED 2007: 192-197
7	EE	Rouwaida Kanj, Rajiv V. Joshi, Jayakumaran Sivagnaname, Jente B. Kuang, Dhruva Acharyya, Tuyet Nguyen, Chandler McDowell, Sani R. Nassif: Gate Leakage Effects on Yield and Design Considerations of PD/SOI SRAM Designs. ISQED 2007: 33-40
2006
6	EE	Rouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif: Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events. DAC 2006: 69-72
5	EE	Fadi J. Kurdahi, Ahmed M. Eltawil, Young-Hwan Park, Rouwaida Kanj, Sani R. Nassif: System-Level SRAM Yield Enhancement. ISQED 2006: 179-184
4	EE	Praveen Elakkumanan, Jente B. Kuang, Kevin J. Nowka, Ramalingam Sridhar, Rouwaida Kanj, Sani R. Nassif: SRAM Local Bit Line Access Failure Analyses. ISQED 2006: 204-209
2004
3	EE	Rouwaida Kanj, Timothy Lehner, Bhavna Agrawal, Elyse Rosenbaum: Noise characterization of static CMOS gates. DAC 2004: 888-893
2	EE	Rouwaida Kanj, Elyse Rosenbaum: Critical evaluation of SOI design guidelines. IEEE Trans. VLSI Syst. 12(9): 885-894 (2004)
2002
1	EE	Rouwaida Kanj, Elyse Rosenbaum: A critical look at design guidelines for SOI logic gates. ISCAS (3) 2002: 261-264

Coauthor Index

1	Dhruva Acharyya	[7]
2	Kanak Agarwal	[13]
3	Bhavna Agrawal	[3]
4	Ching-Te Chuang	[9]
5	Amin Khajeh Djahromi	[8]
6	Praveen Elakkumanan	[4]
7	Ahmed M. Eltawil	[5] [8]
8	Rajiv V. Joshi	[6] [7] [9] [10] [11] [12] [13] [14]
9	J. Kim	[14]
10	Keunwoo Kim	[9] [11]
11	Jente B. Kuang	[4] [7] [12] [14]
12	Fadi J. Kurdahi	[5] [8]
13	Timothy Lehner	[3]
14	Zhou Li	[12]
15	Zhuo Li	[10] [13]
16	Frank Liu	[10]
17	Chandler McDowell	[7]
18	Mesut Meterelliyoz	[14]
19	Sani R. Nassif	[4] [5] [6] [7] [10] [11] [12] [13] [14]
20	Hung C. Ngo	[12]
21	Tuyet Nguyen	[7]
22	Kevin J. Nowka	[4] [14]
23	Young-Hwan Park	[5]
24	W. Reohr	[14]
25	Elyse Rosenbaum	[1] [2] [3]
26	Weiping Shi	[12] [13]
27	Jayakumaran Sivagnaname	[7]
28	Ramalingam Sridhar	[4]
29	Richard Williams	[11]
30	Richard Q. Williams	[9]
31	Ying Zhou	[12] [13]

Colors in the list of coauthors