| 2008 |
|---|
| 17 | EE | Arthur Nieuwoudt,
Jamil Kawa,
Yehia Massoud:
Impact of dummy filling techniques on interconnect capacitance and planarization in nano-scale process technology.
ACM Great Lakes Symposium on VLSI 2008: 151-154 |
| 16 | EE | Yongqiang Lu,
Qing Su,
Jamil Kawa:
An innovative Steiner tree based approach for polygon partitioning.
ASP-DAC 2008: 358-363 |
| 15 | EE | Arthur Nieuwoudt,
Jamil Kawa,
Yehia Massoud:
Automated design of tunable impedance matching networks for reconfigurable wireless applications.
DAC 2008: 498-503 |
| 14 | EE | Arthur Nieuwoudt,
Jamil Kawa,
Yehia Massoud:
Robust reconfigurable filter design using analytic variability quantification techniques.
ICCAD 2008: 765-770 |
| 13 | EE | Qing Su,
Charles Chiang,
Jamil Kawa:
Hotspot Based Yield Prediction with Consideration of Correlations.
ISQED 2008: 338-343 |
| 12 | EE | Arthur Nieuwoudt,
Jamil Kawa,
Yehia Massoud:
Investigating the Impact of Fill Metal on Crosstalk-Induced Delay and Noise.
ISQED 2008: 724-729 |
| 2007 |
|---|
| 11 | EE | Jamil Kawa,
Charles Chiang:
DFM issues for 65nm and beyond.
ACM Great Lakes Symposium on VLSI 2007: 318-322 |
| 2006 |
|---|
| 10 | EE | Dan Page,
Jamil Kawa,
Charles Chiang:
DFM: swimming upstream.
ACM Great Lakes Symposium on VLSI 2006: 1 |
| 9 | EE | Charles Chiang,
Jamil Kawa:
Three DFM Challenges: Random Defects, Thickness Variation, and Printability Variation.
APCCAS 2006: 1099-1102 |
| 8 | EE | Jianfeng Luo,
Subarna Sinha,
Qing Su,
Jamil Kawa,
Charles Chiang:
An IC manufacturing yield model considering intra-die variations.
DAC 2006: 749-754 |
| 7 | EE | Qing Su,
Jamil Kawa,
Charles Chiang,
Yehia Massoud:
Accurate modeling of substrate resistive coupling for floating substrates.
ACM Trans. Design Autom. Electr. Syst. 11(1): 44-51 (2006) |
| 2005 |
|---|
| 6 | | Jianfeng Luo,
Qing Su,
Charles Chiang,
Jamil Kawa:
A layout dependent full-chip copper electroplating topography model.
ICCAD 2005: 133-140 |
| 5 | EE | Xin Wang,
Charles Chiang,
Jamil Kawa,
Qing Su:
A Min-Variance Iterative Method for Fast Smart Dummy Feature Density Assignment in Chemical-Mechanical Polishing.
ISQED 2005: 258-263 |
| 2004 |
|---|
| 4 | EE | Narendra V. Shenoy,
Jamil Kawa,
Raul Camposano:
Design automation for mask programmable fabrics.
DAC 2004: 192-197 |
| 3 | | Bo-Kyung Choi,
Charles Chiang,
Jamil Kawa,
Majid Sarrafzadeh:
Routing resources consumption on M-arch and X-arch.
ISCAS (5) 2004: 73-76 |
| 2002 |
|---|
| 2 | EE | Yehia Massoud,
Steve S. Majors,
Jamil Kawa,
Tareq Bustami,
Don MacMillen,
Jacob K. White:
Managing on-chip inductive effects.
IEEE Trans. VLSI Syst. 10(6): 789-798 (2002) |
| 2001 |
|---|
| 1 | EE | Yehia Massoud,
Jamil Kawa,
Don MacMillen,
Jacob White:
Modeling and Analysis of Differential Signaling for Minimizing Inductive Cross-Talk.
DAC 2001: 804-809 |
