| 2009 |
|---|
| 10 | EE | Ho Fai Ko,
Nicola Nicolici:
Algorithms for State Restoration and Trace-Signal Selection for Data Acquisition in Silicon Debug.
IEEE Trans. on CAD of Integrated Circuits and Systems 28(2): 285-297 (2009) |
| 2008 |
|---|
| 9 | EE | Ho Fai Ko,
Nicola Nicolici:
Automated Trace Signals Identification and State Restoration for Improving Observability in Post-Silicon Validation.
DATE 2008: 1298-1303 |
| 8 | EE | Ho Fai Ko,
Nicola Nicolici:
On Automated Trigger Event Generation in Post-Silicon Validation.
DATE 2008: 256-259 |
| 7 | EE | Ho Fai Ko,
Nicola Nicolici:
A Novel Automated Scan Chain Division Method for Shift and Capture Power Reduction in Broadside At-Speed Test.
ISQED 2008: 649-654 |
| 6 | EE | Ho Fai Ko,
Nicola Nicolici:
Automated Scan Chain Division for Reducing Shift and Capture Power During Broadside At-Speed Test.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(11): 2092-2097 (2008) |
| 5 | EE | Ho Fai Ko,
Nicola Nicolici:
Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application Strategy.
J. Electronic Testing 24(4): 393-403 (2008) |
| 2006 |
|---|
| 4 | EE | Ho Fai Ko,
Nicola Nicolici:
RTL Scan Design for Skewed-Load At-speed Test under Power Constraints.
ICCD 2006 |
| 2005 |
|---|
| 3 | EE | Ho Fai Ko,
Qiang Xu,
Nicola Nicolici:
Register-transfer level functional scan for hierarchical designs.
ASP-DAC 2005: 1172-1175 |
| 2004 |
|---|
| 2 | EE | Ho Fai Ko,
Nicola Nicolici:
Functional Scan Chain Design at RTL for Skewed-Load Delay Fault Testing.
Asian Test Symposium 2004: 454-459 |
| 1 | EE | Ho Fai Ko,
Nicola Nicolici:
Functional Illinois Scan Design at RTL.
ICCD 2004: 78-81 |
