| |
| 2008 | ||
|---|---|---|
| 2 | EE | Shah M. Jahinuzzaman, Mohammad Sharifkhani, Manoj Sachdev: Investigation of Process Impact on Soft Error Susceptibility of Nanometric SRAMs Using a Compact Critical Charge Model. ISQED 2008: 207-212 |
| 2006 | ||
| 1 | EE | Mohammad Sharifkhani, Shah M. Jahinuzzaman, Manoj Sachdev: Dynamic Data Stability in SRAM Cells and Its Implications on Data Stability Tests. MTDT 2006: 55-64 |
| 1 | Manoj Sachdev | [1] [2] |
| 2 | Mohammad Sharifkhani | [1] [2] |