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2008 | ||
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4 | EE | Sanjiv Taneja: Plenary Speech 2P1: Consumerization of Electronics and Nanometer Technologies: Implications for Manufacturing Test. ISQED 2008: 585 |
2007 | ||
3 | EE | Sanjiv Taneja: Accelerating Yield Ramp through Real-Time Testing. IOLTS 2007: 11 |
2005 | ||
2 | EE | Sanjiv Taneja: DFT Aware Layout - Layout Aware DFT. Asian Test Symposium 2005 |
1986 | ||
1 | EE | Sanjiv Taneja, Bruce W. Weide: Graphical description and run-time environments for Real-Time software. ACM Conference on Computer Science 1986: 205-211 |
1 | Bruce W. Weide | [1] |