| 2009 |
|---|
| 5 | EE | Vishal J. Mehta,
Malgorzata Marek-Sadowska,
Kun-Han Tsai,
Janusz Rajski:
Timing-Aware Multiple-Delay-Fault Diagnosis.
IEEE Trans. on CAD of Integrated Circuits and Systems 28(2): 245-258 (2009) |
| 2008 |
|---|
| 4 | EE | Vishal J. Mehta,
Malgorzata Marek-Sadowska,
Kun-Han Tsai,
Janusz Rajski:
Timing-Aware Multiple-Delay-Fault Diagnosis.
ISQED 2008: 246-253 |
| 3 | EE | Vishal J. Mehta,
Malgorzata Marek-Sadowska,
Kun-Han Tsai,
Janusz Rajski:
Improving the Resolution of Single-Delay-Fault Diagnosis.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(5): 932-945 (2008) |
| 2006 |
|---|
| 2 | EE | Vishal J. Mehta,
Malgorzata Marek-Sadowska,
Zhiyuan Wang,
Kun-Han Tsai,
Janusz Rajski:
Delay Fault Diagnosis for Non-Robust Test.
ISQED 2006: 463-472 |
| 2003 |
|---|
| 1 | EE | Vishal J. Mehta,
Kunal K. Dave,
Vishwani D. Agrawal,
Michael L. Bushnell:
A Fault-Independent Transitive Closure Algorithm for Redundancy Identification.
VLSI Design 2003: 149-154 |
