Kun-Han Tsai

2009
19	EE	Vishal J. Mehta, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski: Timing-Aware Multiple-Delay-Fault Diagnosis. IEEE Trans. on CAD of Integrated Circuits and Systems 28(2): 245-258 (2009)
2008
18	EE	Vishal J. Mehta, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski: Timing-Aware Multiple-Delay-Fault Diagnosis. ISQED 2008: 246-253
17	EE	Vishal J. Mehta, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski: Improving the Resolution of Single-Delay-Fault Diagnosis. IEEE Trans. on CAD of Integrated Circuits and Systems 27(5): 932-945 (2008)
2007
16	EE	Dhiraj Goswami, Kun-Han Tsai, Mark Kassab, Janusz Rajski: Test Generation in the Presence of Timing Exceptions and Constraints. DAC 2007: 688-693
2006
15	EE	Vishal J. Mehta, Malgorzata Marek-Sadowska, Zhiyuan Wang, Kun-Han Tsai, Janusz Rajski: Delay Fault Diagnosis for Non-Robust Test. ISQED 2006: 463-472
14	EE	Vlado Vorisek, Bruce Swanson, Kun-Han Tsai, Dhiraj Goswami: Improved Handling of False and Multicycle Paths in ATPG. VTS 2006: 160-165
13	EE	Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski: Analysis and methodology for multiple-fault diagnosis. IEEE Trans. on CAD of Integrated Circuits and Systems 25(3): 558-575 (2006)
2005
12	EE	Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski: Delay-fault diagnosis using timing information. IEEE Trans. on CAD of Integrated Circuits and Systems 24(9): 1315-1325 (2005)
2004
11	EE	Wu-Tung Cheng, Kun-Han Tsai, Yu Huang, Nagesh Tamarapalli, Janusz Rajski: Compactor Independent Direct Diagnosis. Asian Test Symposium 2004: 204-209
10	EE	Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski: Diagnosis of Hold Time Defects. ICCD 2004: 192-199
9	EE	Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski: Delay Fault Diagnosis Using Timing Information. ISQED 2004: 485-490
8	EE	Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski: Realizing High Test Quality Goals with Smart Test Resource Usage. ITC 2004: 525-533
2003
7	EE	Zhiyuan Wang, Malgorzata Marek-Sadowska, Kun-Han Tsai, Janusz Rajski: Multiple Fault Diagnosis Using n-Detection Tests. ICCD 2003: 198-
6	EE	Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski: Impact of Multiple-Detect Test Patterns on Product Quality. ITC 2003: 1031-1040
5	EE	Zhiyuan Wang, Kun-Han Tsai, Malgorzata Marek-Sadowska, Janusz Rajski: An Efficient and Effective Methodology on the Multiple Fault Diagnosis. ITC 2003: 329-338
2002
4	EE	Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian: Embedded Deterministic Test for Low-Cost Manufacturing Test. ITC 2002: 301-310
2000
3	EE	Kun-Han Tsai, Janusz Rajski, Malgorzata Marek-Sadowska: Star test: the theory and its applications. IEEE Trans. on CAD of Integrated Circuits and Systems 19(9): 1052-1064 (2000)
1997
2	EE	Kun-Han Tsai, Sybille Hellebrand, Janusz Rajski, Malgorzata Marek-Sadowska: STARBIST: Scan Autocorrelated Random Pattern Generation. DAC 1997: 472-477
1		Kun-Han Tsai, Malgorzata Marek-Sadowska, Janusz Rajski: Scan-Encoded Test Pattern Generation for BIST. ITC 1997: 548-556

Coauthor Index

1	Brady Benware	[6]
2	Wu-Tung Cheng	[11]
3	Geir Eide	[4]
4	Bill Eklow (William Eklow)	[8]
5	Dhiraj Goswami	[14] [16]
6	Xinli Gu	[8]
7	Sybille Hellebrand	[2]
8	Andre Hertwig	[4]
9	Yu Huang	[11]
10	Mark Kassab	[4] [8] [16]
11	Prabhu Krishnamurthy	[6]
12	Abby Lee	[8]
13	Robert Madge	[6]
14	Malgorzata Marek-Sadowska	[1] [2] [3] [5] [7] [9] [10] [12] [13] [15] [17] [18] [19]
15	Vishal J. Mehta	[15] [17] [18] [19]
16	Grzegorz Mrugalski	[4]
17	Nilanjan Mukherjee	[4]
18	Jun Qian	[4]
19	Janusz Rajski	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [15] [16] [17] [18] [19]
20	Sreenevasan Ranganathan	[6]
21	Chris Schuermyer	[6]
22	Bruce Swanson	[14]
23	Nagesh Tamarapalli	[4] [6] [11]
24	Rob Thompson	[4]
25	Jan Arild Tofte	[8]
26	Jerzy Tyszer	[4]
27	Vlado Vorisek	[14]
28	Cyndee Wang	[8]
29	Zhiyuan Wang	[5] [7] [9] [10] [12] [13] [15]