Rasit Onur Topaloglu

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13EEAkif Sultan, John Faricelli, Sushant Suryagandh, Hans vanMeer, Kaveri Mathur, James Pattison, Sean Hannon, Greg Constant, Kalyana Kumar, Kevin Carrejo, Joe Meier, Rasit Onur Topaloglu, Darin Chan, Uwe Hahn, Thorsten Knopp, Victor Andrade, Bill Gardiol, Steve Hejl, David Wu, James Buller, Larry Bair, Ali Icel, Yuri Apanovich: CAD utilities to comprehend layout-dependent stress effects in 45 nm high- performance SOI custom macro design. ISQED 2009: 442-446
12EERasit Onur Topaloglu: Process Variation Characterization and Modeling of Nanoparticle Interconnects for Foldable Electronics. ISQED 2008: 498-501
11EEAndrew B. Kahng, Puneet Sharma, Rasit Onur Topaloglu: Chip Optimization Through STI-Stress-Aware Placement Perturbations and Fill Insertion. IEEE Trans. on CAD of Integrated Circuits and Systems 27(7): 1241-1252 (2008)
10EEAndrew B. Kahng, Puneet Sharma, Rasit Onur Topaloglu: Exploiting STI stress for performance. ICCAD 2007: 83-90
9EERasit Onur Topaloglu: Energy-Minimization Model for Fill Synthesis. ISQED 2007: 444-451
8EEAndrew B. Kahng, Rasit Onur Topaloglu: A DOE Set for Normalization-Based Extraction of Fill Impact on Capacitances. ISQED 2007: 467-474
7EERasit Onur Topaloglu, Andrew B. Kahng: Interconnect Matching Design Rule Inferring and Optimization through Correlation Extraction. ICCD 2006
6EERasit Onur Topaloglu: Monte Carlo-Alternative Probabilistic Simulations for Analog Systems. ISQED 2006: 249-253
5EEAndrew B. Kahng, Rasit Onur Topaloglu: Generation of design guarantees for interconnect matching. SLIP 2006: 29-34
4EERasit Onur Topaloglu: Early, Accurate and Fast Yield Estimation through Monte Carlo-Alternative Probabilistic Behavioral Analog System Simulations. VTS 2006: 136-142
3EERasit Onur Topaloglu, Alex Orailoglu: Forward discrete probability propagation method for device performance characterization under process variations. ASP-DAC 2005: 220-223
2EERasit Onur Topaloglu, Alex Orailoglu: A DFT approach for diagnosis and process variation-aware structural test of thermometer coded current steering DACs. DAC 2005: 851-856
1EERasit Onur Topaloglu, Alex Orailoglu: On mismatch in the deep sub-micron era - from physics to circuits. ASP-DAC 2004: 62-67

Coauthor Index

1Victor Andrade [13]
2Yuri Apanovich [13]
3Larry Bair [13]
4James Buller [13]
5Kevin Carrejo [13]
6Darin Chan [13]
7Greg Constant [13]
8John Faricelli [13]
9Bill Gardiol [13]
10Uwe Hahn [13]
11Sean Hannon [13]
12Steve Hejl [13]
13Ali Icel [13]
14Andrew B. Kahng [5] [7] [8] [10] [11]
15Thorsten Knopp [13]
16Kalyana Kumar [13]
17Kaveri Mathur [13]
18Joe Meier [13]
19Alex Orailoglu [1] [2] [3]
20James Pattison [13]
21Puneet Sharma [10] [11]
22Akif Sultan [13]
23Sushant Suryagandh [13]
24David Wu [13]
25Hans vanMeer [13]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)