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Andrew R. Neureuther

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2008
12EEJae-Seok Yang, Andrew R. Neureuther: Crosstalk Noise Variation Assessment and Analysis for the Worst Process Corner. ISQED 2008: 352-356
2004
11EEFrank Gennari, Andrew R. Neureuther: A Pattern Matching System for Linking TCAD and EDA. ISQED 2004: 165-170
1995
10EEAlfred Kwok Kit Wong, Roberto Guerrieri, Andrew R. Neureuther: Massively parallel electromagnetic simulation for photolithographic applications. IEEE Trans. on CAD of Integrated Circuits and Systems 14(10): 1231-1240 (1995)
1994
9EEEdward W. Scheckler, Andrew R. Neureuther: Models and algorithms for three-dimensional topography simulation with SAMPLE-3D. IEEE Trans. on CAD of Integrated Circuits and Systems 13(2): 219-230 (1994)
8EEKenny K. H. Toh, Andrew R. Neureuther, Edward W. Scheckler: Algorithms for simulation of three-dimensional etching. IEEE Trans. on CAD of Integrated Circuits and Systems 13(5): 616-624 (1994)
1993
7EEEdward W. Scheckler, Nelson N. Tam, Anton K. Pfau, Andrew R. Neureuther: An efficient volume-removal algorithm for practical three-dimensional lithography simulation with experimental verification. IEEE Trans. on CAD of Integrated Circuits and Systems 12(9): 1345-1356 (1993)
1992
6EEEdward W. Scheckler, Alexander S. Wong, Robert K. Wang, Goodwin R. Chin, John R. Camagna, Andrew R. Neureuther, Robert W. Dutton: A utility-based integrated system for process simulation. IEEE Trans. on CAD of Integrated Circuits and Systems 11(7): 911-920 (1992)
1991
5EEGoodwin R. Chin, Walter C. Dietrich Jr., Duane S. Boning, Alexander S. Wong, Andrew R. Neureuther, Robert W. Dutton: Linking TCAD to EDA - Benefits and Issues. DAC 1991: 573-578
4EERoberto Guerrieri, Karim H. Tadros, John K. Gamelin, Andrew R. Neureuther: Massively parallel algorithms for scattering in optical lithography. IEEE Trans. on CAD of Integrated Circuits and Systems 10(9): 1091-1100 (1991)
3EEAlexander S. Wong, Andrew R. Neureuther: The intertool profile interchange format: a technology CAD environment approach [semiconductor technology]. IEEE Trans. on CAD of Integrated Circuits and Systems 10(9): 1157-1162 (1991)
1988
2EEK. Lee, Andrew R. Neureuther: SIMPL-2: (SIMulated Profiles from the Layout-Version 2). IEEE Trans. on CAD of Integrated Circuits and Systems 7(2): 160-167 (1988)
1EERoberto Guerrieri, Andrew R. Neureuther: Simulation of microcrack effects in dissolution of positive resist exposed by X-ray lithography. IEEE Trans. on CAD of Integrated Circuits and Systems 7(7): 755-764 (1988)

Coauthor Index

1Duane S. Boning [5]
2John R. Camagna [6]
3Goodwin R. Chin [5] [6]
4Walter C. Dietrich Jr. [5]
5Robert W. Dutton [5] [6]
6John K. Gamelin [4]
7Frank Gennari [11]
8Roberto Guerrieri [1] [4] [10]
9K. Lee [2]
10Anton K. Pfau [7]
11Edward W. Scheckler [6] [7] [8] [9]
12Karim H. Tadros [4]
13Nelson N. Tam [7]
14Kenny K. H. Toh [8]
15Robert K. Wang [6]
16Alexander S. Wong [3] [5] [6]
17Alfred Kwok Kit Wong [10]
18Jae-Seok Yang [12]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)