Rohit Kapur

2009
44	EE	Anshuman Chandra, Yasunari Kanzawa, Rohit Kapur: Proactive management of X's in scan chains for compression. ISQED 2009: 260-265
2008
43	EE	Anshuman Chandra, Felix Ng, Rohit Kapur: Low Power Illinois Scan Architecture for Simultaneous Power and Test Data Volume Reduction. DATE 2008: 462-467
42	EE	Anshuman Chandra, Rohit Kapur: Interval Based X-Masking for Scan Compression Architectures. ISQED 2008: 821-826
41	EE	Anshuman Chandra, Rohit Kapur: Bounded Adjacent Fill for Low Capture Power Scan Testing. VTS 2008: 131-138
40	EE	Rohit Kapur, Subhasish Mitra, Thomas W. Williams: Historical Perspective on Scan Compression. IEEE Design & Test of Computers 25(2): 114-120 (2008)
2007
39	EE	Rajesh Galivanche, Rohit Kapur, Antonio Rubio: Testing in the year 2020. DATE 2007: 960-965
38		Maria Gkatziani, Rohit Kapur, Qing Su, Ben Mathew, Roberto Mattiuzzo, Laura Tarantini, Cy Hay, Salvatore Talluto, Thomas W. Williams: Accurately Determining Bridging Defects from Layout. DDECS 2007: 87-90
37	EE	Peter Wohl, John A. Waicukauski, Rohit Kapur, S. Ramnath, Emil Gizdarski, Thomas W. Williams, P. Jaini: Minimizing the Impact of Scan Compression. VTS 2007: 67-74
36	EE	Anshuman Chandra, Haihua Yan, Rohit Kapur: Multimode Illinois Scan Architecture for Test Application Time and Test Data Volume Reduction. VTS 2007: 84-92
2004
35	EE	Rohit Kapur: Security vs. Test Quality: Are they mutually exclusive?. ITC 2004: 1414
34	EE	Nodari Sitchinava, Samitha Samaranayake, Rohit Kapur, Emil Gizdarski, Frederic Neuveux, Thomas W. Williams: Changing the Scan Enable during Shift. VTS 2004: 73-78
2003
33	EE	Nahmsuk Oh, Rohit Kapur, Thomas W. Williams, Jim Sproch: Test Pattern Compression Using Prelude Vectors in Fan-Out Scan Chain with Feedback Architecture. DATE 2003: 10110-10115
32	EE	Francisco DaSilva, Yervant Zorian, Lee Whetsel, Karim Arabi, Rohit Kapur: Overview of the IEEE P1500 Standard. ITC 2003: 988-997
31	EE	Samitha Samaranayake, Emil Gizdarski, Nodari Sitchinava, Frederic Neuveux, Rohit Kapur, Thomas W. Williams: A Reconfigurable Shared Scan-in Architecture. VTS 2003: 9-14
30	EE	Bruce D. Cory, Rohit Kapur, Bill Underwood: Speed Binning with Path Delay Test in 150-nm Technology. IEEE Design & Test of Computers 20(5): 41-45 (2003)
2002
29	EE	Rohit Kapur, Thomas W. Williams: Manufacturing Test of SoCs. Asian Test Symposium 2002: 317-319
28	EE	Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams: Enhancing test efficiency for delay fault testing using multiple-clocked schemes. DAC 2002: 371-374
27	EE	Rohit Kapur, Thomas W. Williams, M. Ray Mercer: Directed-Binary Search in Logic BIST Diagnostics. DATE 2002: 1121
26	EE	Nahmsuk Oh, Rohit Kapur, Thomas W. Williams: Fast seed computation for reseeding shift register in test pattern compression. ICCAD 2002: 76-81
25	EE	Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams: Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme. ITC 2002: 407-416
24	EE	Loïs Guiller, Frederic Neuveux, S. Duggirala, R. Chandramouli, Rohit Kapur: Integrating DFT in the Physical Synthesis Flow. ITC 2002: 788-795
23	EE	Samitha Samaranayake, Nodari Sitchinava, Rohit Kapur, Minesh B. Amin, Thomas W. Williams: Dynamic Scan: Driving Down the Cost of Test. IEEE Computer 35(10): 63-68 (2002)
22	EE	Erik Jan Marinissen, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti, Yervant Zorian: On IEEE P1500's Standard for Embedded Core Test. J. Electronic Testing 18(4-5): 365-383 (2002)
2001
21		Rohit Kapur, Maurice Lousberg, Tony Taylor, Brion L. Keller, Paul Reuter, Douglas Kay: CTL the language for describing core-based test. ITC 2001: 131-139
20		Rohit Kapur, Thomas W. Williams: Tester retargetable patterns. ITC 2001: 721-727
19		Ajay Khoche, Rohit Kapur, David Armstrong, Thomas W. Williams, Mick Tegethoff, Jochen Rivoir: A new methodology for improved tester utilization. ITC 2001: 916-923
18	EE	Dwayne Burek, Garen Darbinyan, Rohit Kapur, Maurice Lousberg, Teresa L. McLaurin, Mike Ricchetti: IP and Automation to Support IEEE P1500. VTS 2001: 411-412
17	EE	Rohit Kapur, R. Chandramouli, Thomas W. Williams: Strategies for Low-Cost Test. IEEE Design & Test of Computers 18(6): 47-54 (2001)
2000
16	EE	F. Hayat, Thomas W. Williams, Rohit Kapur, D. Hsu: DFT closure. Asian Test Symposium 2000: 8-9
15	EE	Thomas W. Williams, Rohit Kapur: Design for Testability in Nanometer Technologies; Searching for Quality. ISQED 2000: 167-172
14		Yervant Zorian, Erik Jan Marinissen, Rohit Kapur: On using IEEE P1500 SECT for test plug-n-play. ITC 2000: 770-777
13	EE	Rohit Kapur, Cy Hay, Thomas W. Williams: The Mutating Metric for Benchmarking Test. IEEE Design & Test of Computers 17(3): 18-21 (2000)
1999
12		Rohit Kapur: High level ATPG is important and is on its way! ITC 1999: 1115-1116
11		Yervant Zorian, Erik Jan Marinissen, Rohit Kapur, Tony Taylor, Lee Whetsel: Towards a standard for embedded core test: an example. ITC 1999: 616-627
10		Rohit Kapur, Thomas W. Williams: Tough Challenges as Design and Test Go Nanometer - Guest Editors' Introduction. IEEE Computer 32(11): 42-45 (1999)
1997
9	EE	Magdy S. Abadir, Rohit Kapur: Cost-Driven Ranking of Memory Elements for Partial Intrusion. IEEE Design & Test of Computers 14(3): 45-50 (1997)
1996
8		Thomas W. Williams, Robert H. Dennard, Rohit Kapur, M. Ray Mercer, Wojciech Maly: IDDQ Test: Sensitivity Analysis of Scaling. ITC 1996: 786-792
7		Rohit Kapur, Edward F. Miller: System Test and Reliability: Techniques for Avoiding Failure (Guest Editors' Introduction). IEEE Computer 29(11): 28-30 (1996)
6	EE	Rohit Kapur, Srinivas Patil, Thomas J. Snethen, Thomas W. Williams: A weighted random pattern test generation system. IEEE Trans. on CAD of Integrated Circuits and Systems 15(8): 1020-1025 (1996)
1994
5		Rohit Kapur, Srinivas Patil, Thomas J. Snethen, Thomas W. Williams: Design of an Efficient Weighted-Random-Pattern Generation System. ITC 1994: 491-500
1992
4	EE	M. Ray Mercer, Rohit Kapur, Don E. Ross: Functional Approaches to Generating Orderings for Efficient Symbolic Representations. DAC 1992: 624-627
3		Rohit Kapur, Jaehong Park, M. Ray Mercer: All Tests for a Fault Are Not Equally Valuable for Defect Detection. ITC 1992: 762-769
2		Rohit Kapur, M. Ray Mercer: Bounding Signal Probabilities for Testability Measurement Using Conditional Syndromes. IEEE Trans. Computers 41(12): 1580-1588 (1992)
1991
1	EE	Kenneth M. Butler, Don E. Ross, Rohit Kapur, M. Ray Mercer: Heuristics to Compute Variable Orderings for Efficient Manipulation of Ordered Binary Decision Diagrams. DAC 1991: 417-420

Coauthor Index

1	Magdy S. Abadir	[9]
2	Minesh B. Amin	[23]
3	Karim Arabi	[32]
4	David Armstrong	[19]
5	Dwayne Burek	[18]
6	Kenneth M. Butler	[1]
7	Anshuman Chandra	[36] [41] [42] [43] [44]
8	R. Chandramouli	[17] [24]
9	Kwang-Ting Cheng (Kwang-Ting (Tim) Cheng)	[25] [28]
10	Bruce D. Cory	[30]
11	Francisco DaSilva	[32]
12	Garen Darbinyan	[18]
13	Robert H. Dennard	[8]
14	S. Duggirala	[24]
15	Jennifer Dworak	[25] [28]
16	Rajesh Galivanche	[39]
17	Emil Gizdarski	[31] [34] [37]
18	Maria Gkatziani	[38]
19	Loïs Guiller	[24]
20	Cy Hay	[13] [38]
21	F. Hayat	[16]
22	D. Hsu	[16]
23	P. Jaini	[37]
24	Yasunari Kanzawa	[44]
25	Douglas Kay	[21]
26	Brion L. Keller	[21]
27	Ajay Khoche	[19]
28	Jing-Jia Liou	[25] [28]
29	Maurice Lousberg	[18] [21] [22]
30	Wojciech Maly	[8]
31	Erik Jan Marinissen	[11] [14] [22]
32	Ben Mathew	[38]
33	Roberto Mattiuzzo	[38]
34	Teresa L. McLaurin	[18] [22]
35	M. Ray Mercer	[1] [2] [3] [4] [8] [25] [27] [28]
36	Edward F. Miller	[7]
37	Subhasish Mitra	[40]
38	Frederic Neuveux	[24] [31] [34]
39	Felix Ng	[43]
40	Nahmsuk Oh	[26] [33]
41	Jaehong Park	[3]
42	Srinivas Patil	[5] [6]
43	S. Ramnath	[37]
44	Paul Reuter	[21]
45	Mike Ricchetti	[18] [22]
46	Jochen Rivoir	[19]
47	Don E. Ross	[1] [4]
48	Antonio Rubio	[39]
49	Samitha Samaranayake	[23] [31] [34]
50	Nodari Sitchinava	[23] [31] [34]
51	Thomas J. Snethen	[5] [6]
52	Jim Sproch	[33]
53	Qing Su	[38]
54	Salvatore Talluto	[38]
55	Laura Tarantini	[38]
56	Tony Taylor	[11] [21]
57	Mick Tegethoff	[19]
58	Bill Underwood	[30]
59	John A. Waicukauski	[37]
60	Li-C. Wang	[25] [28]
61	Lee Whetsel	[11] [32]
62	Thomas W. Williams	[5] [6] [8] [10] [13] [15] [16] [17] [19] [20] [23] [25] [26] [27] [28] [29] [31] [33] [34] [37] [38] [40]
63	Peter Wohl	[37]
64	Haihua Yan	[36]
65	Yervant Zorian	[11] [14] [22] [32]

Colors in the list of coauthors