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Daniela De Venuto

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2008
22EEDaniela De Venuto, Leonardo Reyneri: PWM-Based Test Stimuli Generation for BIST of High Resolution ADCs. DATE 2008: 284-287
21EEDaniela De Venuto, Bruno Riccò: High Resolution Read-Out Circuit for DNA Label-Free Detection System. ISQED 2008: 708-711
2007
20EEDaniela De Venuto, Bruno Riccò: Inductive Fault Analysis for Test and Diagnosis of DNA Sensor Arrays. ISQED 2007: 311-316
19EEDaniela De Venuto, Leonardo Reyneri: Fully Digital Optimized Testing and Calibration Technique for Sigma Delta ADC's. ISQED 2007: 519-526
18EEDaniela De Venuto, Leonardo Reyneri: Fast PWM-Based Test for High Resolution SigmaDelta ADCs. J. Electronic Testing 23(6): 539-548 (2007)
17EEDaniela De Venuto, Leonardo Reyneri: Fully digital strategy for fast calibration and test of SigmaDelta ADC's. Microelectronics Journal 38(1): 140-147 (2007)
16EEDaniela De Venuto, Tom Chen: Editorial. Microelectronics Journal 38(4-5): 453 (2007)
15EEDaniela De Venuto, Leonardo Reyneri: Fully digital strategy for fast calibration and test of SigmaDelta ADCs. Microelectronics Journal 38(4-5): 474-481 (2007)
2006
14EEDaniela De Venuto, Leonardo Reyneri: Analysis and experimental results of an FPGA-based strategy for fast production test of high resolution ADCs. ISQED 2006: 537-542
13EEDaniela De Venuto: Editorial. Microelectronics Journal 37(12): 1561-1562 (2006)
12EEMarija Blagojevic, Maher Kayal, Daniela De Venuto: FD SOI Hall sensor electronics interfaces for energy measurement. Microelectronics Journal 37(12): 1576-1583 (2006)
11EEDaniela De Venuto, Bruno Riccò: Design and characterization of novel read-out systems for a capacitive DNA sensor. Microelectronics Journal 37(12): 1610-1619 (2006)
2005
10EEDaniela De Venuto, Grazia Marchione, Leonardo Reyneri: A codesign tool to validate and improve an FPGA based test strategy for high resolution audio ADC. ISQED 2005: 440-447
9EEDaniela De Venuto, Tom Chen: International Symposium on Quality Electronic Design. Microelectronics Journal 36(9): 787-788 (2005)
8EEDaniela De Venuto: Testing high resolution SigmaDelta ADC's by using the quantizer input as test access. Microelectronics Journal 36(9): 810-819 (2005)
2004
7EEDaniela De Venuto, Marija Blagojevic, Maher Kayal: Microelectronic System for Hall Sensor Power Measurements. DELTA 2004: 355-359
6EEDaniela De Venuto: New Test Access for High Resolution SD ADC's by Using the Noise Transfer Function Evaluation. ISQED 2004: 81-85
2003
5EEDaniela De Venuto, Michael J. Ohletz, Bruno Riccò: Automatic Repositioning Technique for Digital Cell Based Window Comparators and Implementation within Mixed-Signal DfT Schemes. ISQED 2003: 431-437
4EEDaniela De Venuto, Michael J. Ohletz: Floating body effects model for fault simulation of fully depleted CMOS/SOI circuits. Microelectronics Journal 34(10): 889-895 (2003)
2002
3EEDaniela De Venuto, Michael J. Ohletz, Bruno Riccò: Testing of Analogue Circuits via (Standard) Digital Gates. ISQED 2002: 112-119
2EEDaniela De Venuto, Michael J. Ohletz, Bruno Riccò: Digital Window Comparator DfT Scheme for Mixed-Signal ICs. J. Electronic Testing 18(2): 121-128 (2002)
2001
1EEDaniela De Venuto, Michael J. Ohletz: On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with Bias-Programmable Reference Voltages. J. Electronic Testing 17(3-4): 243-253 (2001)

Coauthor Index

1Marija Blagojevic [7] [12]
2Tom Chen [9] [16]
3Maher Kayal [7] [12]
4Grazia Marchione [10]
5Michael J. Ohletz [1] [2] [3] [4] [5]
6Leonardo Reyneri [10] [14] [15] [17] [18] [19] [22]
7Bruno Riccò [2] [3] [5] [11] [20] [21]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)