2008 |
22 | EE | Daniela De Venuto,
Leonardo Reyneri:
PWM-Based Test Stimuli Generation for BIST of High Resolution ADCs.
DATE 2008: 284-287 |
21 | EE | Daniela De Venuto,
Bruno Riccò:
High Resolution Read-Out Circuit for DNA Label-Free Detection System.
ISQED 2008: 708-711 |
2007 |
20 | EE | Daniela De Venuto,
Bruno Riccò:
Inductive Fault Analysis for Test and Diagnosis of DNA Sensor Arrays.
ISQED 2007: 311-316 |
19 | EE | Daniela De Venuto,
Leonardo Reyneri:
Fully Digital Optimized Testing and Calibration Technique for Sigma Delta ADC's.
ISQED 2007: 519-526 |
18 | EE | Daniela De Venuto,
Leonardo Reyneri:
Fast PWM-Based Test for High Resolution SigmaDelta ADCs.
J. Electronic Testing 23(6): 539-548 (2007) |
17 | EE | Daniela De Venuto,
Leonardo Reyneri:
Fully digital strategy for fast calibration and test of SigmaDelta ADC's.
Microelectronics Journal 38(1): 140-147 (2007) |
16 | EE | Daniela De Venuto,
Tom Chen:
Editorial.
Microelectronics Journal 38(4-5): 453 (2007) |
15 | EE | Daniela De Venuto,
Leonardo Reyneri:
Fully digital strategy for fast calibration and test of SigmaDelta ADCs.
Microelectronics Journal 38(4-5): 474-481 (2007) |
2006 |
14 | EE | Daniela De Venuto,
Leonardo Reyneri:
Analysis and experimental results of an FPGA-based strategy for fast production test of high resolution ADCs.
ISQED 2006: 537-542 |
13 | EE | Daniela De Venuto:
Editorial.
Microelectronics Journal 37(12): 1561-1562 (2006) |
12 | EE | Marija Blagojevic,
Maher Kayal,
Daniela De Venuto:
FD SOI Hall sensor electronics interfaces for energy measurement.
Microelectronics Journal 37(12): 1576-1583 (2006) |
11 | EE | Daniela De Venuto,
Bruno Riccò:
Design and characterization of novel read-out systems for a capacitive DNA sensor.
Microelectronics Journal 37(12): 1610-1619 (2006) |
2005 |
10 | EE | Daniela De Venuto,
Grazia Marchione,
Leonardo Reyneri:
A codesign tool to validate and improve an FPGA based test strategy for high resolution audio ADC.
ISQED 2005: 440-447 |
9 | EE | Daniela De Venuto,
Tom Chen:
International Symposium on Quality Electronic Design.
Microelectronics Journal 36(9): 787-788 (2005) |
8 | EE | Daniela De Venuto:
Testing high resolution SigmaDelta ADC's by using the quantizer input as test access.
Microelectronics Journal 36(9): 810-819 (2005) |
2004 |
7 | EE | Daniela De Venuto,
Marija Blagojevic,
Maher Kayal:
Microelectronic System for Hall Sensor Power Measurements.
DELTA 2004: 355-359 |
6 | EE | Daniela De Venuto:
New Test Access for High Resolution SD ADC's by Using the Noise Transfer Function Evaluation.
ISQED 2004: 81-85 |
2003 |
5 | EE | Daniela De Venuto,
Michael J. Ohletz,
Bruno Riccò:
Automatic Repositioning Technique for Digital Cell Based Window Comparators and Implementation within Mixed-Signal DfT Schemes.
ISQED 2003: 431-437 |
4 | EE | Daniela De Venuto,
Michael J. Ohletz:
Floating body effects model for fault simulation of fully depleted CMOS/SOI circuits.
Microelectronics Journal 34(10): 889-895 (2003) |
2002 |
3 | EE | Daniela De Venuto,
Michael J. Ohletz,
Bruno Riccò:
Testing of Analogue Circuits via (Standard) Digital Gates.
ISQED 2002: 112-119 |
2 | EE | Daniela De Venuto,
Michael J. Ohletz,
Bruno Riccò:
Digital Window Comparator DfT Scheme for Mixed-Signal ICs.
J. Electronic Testing 18(2): 121-128 (2002) |
2001 |
1 | EE | Daniela De Venuto,
Michael J. Ohletz:
On-Chip Test for Mixed-Signal ASICs using Two-Mode Comparators with Bias-Programmable Reference Voltages.
J. Electronic Testing 17(3-4): 243-253 (2001) |