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9. Asian Test Symposium 2000: Taipei, Taiwan

9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. IEEE Computer Society 2000, ISBN 0-7695-0887-1 BibTeX
  title     = {9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei,
  booktitle = {Asian Test Symposium},
  publisher = {IEEE Computer Society},
  year      = {2000},
  isbn      = {0-7695-0887-1},
  bibsource = {DBLP, http://dblp.uni-trier.de}

Keynote Address I

Keynote Address II

Industry Session I: CAD Tools on Testing

Industry Session II: Taiwan Test Industry: Value Added Testing in the New Millennium

Panel I Panel II

Analog & Mixed Signal Test I

Memory Built-in Self-Test and Self-Diagnosis

Analog & Mixed Signal Test II

Fault Simulation & Timing Simulation

Fault Analysis I

Test Generation I

Functional Testing

Built-in Self-Test I

Software Testing & Test Synthesis

Embedded-Core Testing

Memory Testing

Test Generation II

IDDQ Testing

Built-in Self-Test II

Testability Analysis and Design for Testability

Fault Tolerance

Fault Analysis II

Low-Power Testing

Self-Checking Circuits and Concurrent Fault Detection

Tutorial 1

Tutorial 2

Copyright © Sat May 16 22:59:04 2009 by Michael Ley (ley@uni-trier.de)