2008 |
22 | EE | Rafaella Fiorelli,
Fernando Silveira,
Eduardo J. Peralías,
Diego Vázquez,
Adoración Rueda,
José Luis Huertas:
A 2.4GHz LNA in a 90-nm CMOS technology designed with ACM model.
SBCCI 2008: 70-75 |
2007 |
21 | EE | Antonio J. Ginés,
Eduardo J. Peralías,
Adoración Rueda:
Improved Background Algorithms for Pipeline ADC Full Calibration.
ISCAS 2007: 3383-3386 |
20 | EE | Antonio J. Ginés,
Eduardo J. Peralías,
Adoración Rueda:
Novel swapping technique for background calibration of capacitor mismatching in pipeline ADCS.
SBCCI 2007: 21-26 |
2006 |
19 | EE | Antonio J. Ginés,
Eduardo J. Peralías,
Adoración Rueda:
Statistical analysis of a background correlation-based technique for full calibration of pipeline ADCs.
ISCAS 2006 |
2005 |
18 | EE | Antonio J. Ginés,
Eduardo J. Peralías,
Adoración Rueda:
Full calibration digital techniques for pipeline ADCs.
ISCAS (3) 2005: 1976-1979 |
2004 |
17 | EE | Antonio J. Ginés,
Eduardo J. Peralías,
Adoración Rueda:
Digital Background Gain Error Correction in Pipeline ADCs.
DATE 2004: 82-87 |
2003 |
16 | EE | Antonio J. Ginés,
Eduardo J. Peralías,
Adoración Rueda:
Digital Background Calibration Technique for Pipeline ADCs with Multi-Bit Stages.
SBCCI 2003: 317-322 |
2002 |
15 | EE | Antonio J. Ginés,
Eduardo J. Peralías,
Adoración Rueda,
Ralf Seepold,
Natividad Martínez Madrid:
A Mixed-Signal Design Reuse Methodology Based on Parametric Behavioural Models with Non-Ideal Effects.
DATE 2002: 310-315 |
14 | EE | Gloria Huertas,
Diego Vázquez,
Eduardo J. Peralías,
Adoración Rueda,
José Luis Huertas:
Practical Oscillation-Based Test of Integrated Filters.
IEEE Design & Test of Computers 19(6): 64-72 (2002) |
13 | EE | Gloria Huertas,
Diego Vázquez,
Eduardo J. Peralías,
Adoración Rueda,
José Luis Huertas:
Testing Mixed-Signal Cores: A Practical Oscillation-Based Test in an Analog Macrocell.
IEEE Design & Test of Computers 19(6): 73-82 (2002) |
2001 |
12 | EE | Natividad Martínez Madrid,
Eduardo J. Peralías,
Antonio J. Acosta,
Adoración Rueda:
Analog/mixed-signal IP modeling for design reuse.
DATE 2001: 766-767 |
11 | EE | Eduardo J. Peralías,
Adoración Rueda,
José L. Huertas:
Structural testing of pipelined analog to digital converters.
ISCAS (1) 2001: 436-439 |
10 | EE | Eduardo J. Peralías,
Gloria Huertas,
Adoración Rueda,
José L. Huertas:
Self-Testable Pipelined ADC with Low Hardware Overhead.
VTS 2001: 272-278 |
9 | EE | Eduardo J. Peralías,
Adoración Rueda,
José Luis Huertas:
New BIST Schemes for Structural Testing of Pipelined Analog to Digital Converters.
J. Electronic Testing 17(5): 373-383 (2001) |
2000 |
8 | EE | Gloria Huertas,
Diego Vázquez,
Eduardo J. Peralías,
Adoración Rueda,
José L. Huertas:
Testing mixed-signal cores: practical oscillation-based test in an analog macrocell.
Asian Test Symposium 2000: 31-38 |
7 | EE | Eduardo J. Peralías,
Antonio J. Acosta,
Adoración Rueda,
José L. Huertas:
A Vhdl-Based Methodology for Design and Verification of Pipeline A/D Converters.
DATE 2000: 534-538 |
6 | EE | Raúl Jiménez,
Antonio J. Acosta,
Eduardo J. Peralías,
Adoración Rueda:
An Application of Self-Timed Circuits to the Reduction of Switching Noise in Analog-Digital Circuits.
PATMOS 2000: 295-305 |
1998 |
5 | EE | Juan A. Prieto,
Adoración Rueda,
Ian A. Grout,
Eduardo J. Peralías,
José L. Huertas,
Andrew M. D. Richardson:
An Approach to Realistic Fault Prediction and Layout Design for Testability in Analog Circuits.
DATE 1998: 905- |
4 | EE | Eduardo J. Peralías,
Adoración Rueda,
Juan A. Prieto,
José L. Huertas:
DfT and on-line test of high-performance data converters: a practical case.
ITC 1998: 534- |
1997 |
3 | EE | Salvador Mir,
Adoración Rueda,
Thomas Olbrich,
Eduardo J. Peralías,
José Luis Huertas:
SWITTEST: Automatic Switch-Level Fault Simulation and Test Evaluation of Switched-Capacitor Systems.
DAC 1997: 281-286 |
2 | EE | Eduardo J. Peralías,
Adoración Rueda,
José L. Huertas:
A DFT Technique for Analog-to-Digital Converters with digital correction.
VTS 1997: 302-307 |
1995 |
1 | EE | Eduardo J. Peralías,
Adoración Rueda,
José Luis Huertas:
Statistical behavioral modeling and characterization of A/D converters.
ICCAD 1995: 562-566 |