| 2004 |
|---|
| 13 | EE | Mike W. T. Wong,
Yubin Zhang:
Design and Implementation of Self-Testable Full Range Window Comparator.
Asian Test Symposium 2004: 314-318 |
| 2003 |
|---|
| 12 | EE | Mike W. T. Wong:
Issues Related to the Formulation of DFT Solution for Analog Circuit Test Using Equivalent Fault Analysis.
Asian Test Symposium 2003: 120-123 |
| 2002 |
|---|
| 11 | EE | K. Y. Ko,
Mike W. T. Wong,
Y. S. Lee:
Testing System-On-Chip by Summations of Cores? Test Output Voltages.
Asian Test Symposium 2002: 350-355 |
| 10 | EE | Mike W. T. Wong,
K. Y. Ko,
Y. S. Lee:
Analog and Mixed-Signal IP Cores Testing.
DELTA 2002: 3-7 |
| 9 | EE | Matthew Worsman,
Mike W. T. Wong,
Y. S. Lee:
Enhancing The Static D. C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis.
DELTA 2002: 443-446 |
| 2000 |
|---|
| 8 | EE | K. Y. Ko,
Mike W. T. Wong:
New built-in self-test technique based on addition/subtraction of selected node voltages.
Asian Test Symposium 2000: 39- |
| 7 | EE | Matthew Worsman,
Mike W. T. Wong,
Y. S. Lee:
Analog circuit equivalent faults in the D.C. domain.
Asian Test Symposium 2000: 84-89 |
| 6 | EE | Matthew Worsman,
Mike W. T. Wong,
Y. S. Lee:
A Pre-Simulation Measure of D.C. Design-for-Testability Fault Diagnosis Quality.
ISQED 2000: 361-368 |
| 1998 |
|---|
| 5 | EE | Mike W. T. Wong,
Matthew Worsman:
DC Nonlinear Circuit Fault Simulation With Large Change Sensitivity.
Asian Test Symposium 1998: 366-371 |
| 1997 |
|---|
| 4 | EE | Joseph C. W. Pang,
Mike W. T. Wong,
Y. S. Lee:
Design and Implementation of Strongly Code-Disjoint CMOS Built-in Intermediate Voltage Sensor for Totally Self-Checking Circuits.
Asian Test Symposium 1997: 82-87 |
| 1996 |
|---|
| 3 | EE | Tao Wei,
Mike W. T. Wong,
Y. S. Lee:
Efficient Multifrequency Analysis of Fault Diagnosis in Analog Circuits Based on Large Change Sensitivity Computation.
Asian Test Symposium 1996: 232-237 |
| 2 | EE | Yingquan Zhou,
Mike W. T. Wong,
Yinghua Min:
Hardware reduction in continuous checksum-based analog checkers: Algorithm and its analysis.
J. Electronic Testing 9(1-2): 153-163 (1996) |
| 1995 |
|---|
| 1 | | Yingquan Zhou,
Mike W. T. Wong,
Yinghua Min:
Feasibility and Effectiveness of the Algorithm for Overhead Reduction in Analog Checkers.
FTCS 1995: 238-247 |
