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Sasikumar Cherubal

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2005
16EESasikumar Cherubal: Challenges in Next Generation Mixed-Signal IC Production Testing. Asian Test Symposium 2005: 466
2004
15EEGanesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee: Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit. DATE 2004: 280-285
14EESoumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee: Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences. DELTA 2004: 372-377
13EESasikumar Cherubal, Ramakrishna Voorakaranam, Abhijit Chatterjee, John Mclaughlin, Jason L. Smith, David M. Majernik: Concurrent RF Test Using Optimized Modulated RF Stimuli. VLSI Design 2004: 1017-1022
12EESoumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee: System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. VTS 2004: 229-236
2003
11EERamakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee: Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. ITC 2003: 1174-1181
2002
10EERamakrishna Voorakaranam, Sasikumar Cherubal, Abhijit Chatterjee: A Signature Test Framework for Rapid Production Testing of RF Circuits. DATE 2002: 186-191
9EEPramodchandran N. Variyam, Sasikumar Cherubal, Abhijit Chatterjee: Prediction of analog performance parameters using fast transienttesting. IEEE Trans. on CAD of Integrated Circuits and Systems 21(3): 349-361 (2002)
2001
8EESasikumar Cherubal, Abhijit Chatterjee: Test generation based diagnosis of device parameters for analog circuits. DATE 2001: 596-602
7 Sasikumar Cherubal, Abhijit Chatterjee: A high-resolution jitter measurement technique using ADC sampling. ITC 2001: 838-847
2000
6EESasikumar Cherubal, Abhijit Chatterjee: Test generation for fault isolation in analog circuits using behavioral models. Asian Test Symposium 2000: 19-24
5 Sasikumar Cherubal, Abhijit Chatterjee: Optimal INL/DNL testing of A/D converters using a linear model. ITC 2000: 358-366
4EESasikumar Cherubal, Abhijit Chatterjee: An Efficient Hierarchical Fault Isolation Technique for Mixed-Signal Boards. VLSI Design 2000: 550-555
1999
3EESasikumar Cherubal, Abhijit Chatterjee: Parametric Fault Diagnosis for Analog Systems Using Functional Mapping. DATE 1999: 195-
2EESasikumar Cherubal, Abhijit Chatterjee: A Methodology for Efficient Simulation and Diagnosis of Mixed-Signal Systems Using Error Waveforms. DFT 1999: 357-
1997
1 Ramakrishna Voorakaranam, Sudip Chakrabarti, Junwei Hou, Alfred V. Gomes, Sasikumar Cherubal, Abhijit Chatterjee, William H. Kao: Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis. ITC 1997: 903-912

Coauthor Index

1Soumendu Bhattacharya [12] [14] [15]
2Sudip Chakrabarti [1]
3Abhijit Chatterjee [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15]
4Bob Cometta [11]
5Alfred V. Gomes [1]
6Achintya Halder [12]
7Junwei Hou [1]
8William H. Kao [1]
9Thomas Kuehl [11]
10David M. Majernik [11] [13]
11John Mclaughlin [13]
12Randy Newby [11]
13Jason L. Smith [13]
14Ganesh Srinivasan [12] [14] [15]
15Pramodchandran N. Variyam [9]
16Ramakrishna Voorakaranam [1] [10] [11] [13]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)