Sasikumar Cherubal

2005
16	EE	Sasikumar Cherubal: Challenges in Next Generation Mixed-Signal IC Production Testing. Asian Test Symposium 2005: 466
2004
15	EE	Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee: Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit. DATE 2004: 280-285
14	EE	Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee: Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences. DELTA 2004: 372-377
13	EE	Sasikumar Cherubal, Ramakrishna Voorakaranam, Abhijit Chatterjee, John Mclaughlin, Jason L. Smith, David M. Majernik: Concurrent RF Test Using Optimized Modulated RF Stimuli. VLSI Design 2004: 1017-1022
12	EE	Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee: System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams. VTS 2004: 229-236
2003
11	EE	Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee: Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. ITC 2003: 1174-1181
2002
10	EE	Ramakrishna Voorakaranam, Sasikumar Cherubal, Abhijit Chatterjee: A Signature Test Framework for Rapid Production Testing of RF Circuits. DATE 2002: 186-191
9	EE	Pramodchandran N. Variyam, Sasikumar Cherubal, Abhijit Chatterjee: Prediction of analog performance parameters using fast transienttesting. IEEE Trans. on CAD of Integrated Circuits and Systems 21(3): 349-361 (2002)
2001
8	EE	Sasikumar Cherubal, Abhijit Chatterjee: Test generation based diagnosis of device parameters for analog circuits. DATE 2001: 596-602
7		Sasikumar Cherubal, Abhijit Chatterjee: A high-resolution jitter measurement technique using ADC sampling. ITC 2001: 838-847
2000
6	EE	Sasikumar Cherubal, Abhijit Chatterjee: Test generation for fault isolation in analog circuits using behavioral models. Asian Test Symposium 2000: 19-24
5		Sasikumar Cherubal, Abhijit Chatterjee: Optimal INL/DNL testing of A/D converters using a linear model. ITC 2000: 358-366
4	EE	Sasikumar Cherubal, Abhijit Chatterjee: An Efficient Hierarchical Fault Isolation Technique for Mixed-Signal Boards. VLSI Design 2000: 550-555
1999
3	EE	Sasikumar Cherubal, Abhijit Chatterjee: Parametric Fault Diagnosis for Analog Systems Using Functional Mapping. DATE 1999: 195-
2	EE	Sasikumar Cherubal, Abhijit Chatterjee: A Methodology for Efficient Simulation and Diagnosis of Mixed-Signal Systems Using Error Waveforms. DFT 1999: 357-
1997
1		Ramakrishna Voorakaranam, Sudip Chakrabarti, Junwei Hou, Alfred V. Gomes, Sasikumar Cherubal, Abhijit Chatterjee, William H. Kao: Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis. ITC 1997: 903-912

Coauthor Index

1	Soumendu Bhattacharya	[12] [14] [15]
2	Sudip Chakrabarti	[1]
3	Abhijit Chatterjee	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15]
4	Bob Cometta	[11]
5	Alfred V. Gomes	[1]
6	Achintya Halder	[12]
7	Junwei Hou	[1]
8	William H. Kao	[1]
9	Thomas Kuehl	[11]
10	David M. Majernik	[11] [13]
11	John Mclaughlin	[13]
12	Randy Newby	[11]
13	Jason L. Smith	[13]
14	Ganesh Srinivasan	[12] [14] [15]
15	Pramodchandran N. Variyam	[9]
16	Ramakrishna Voorakaranam	[1] [10] [11] [13]