Yea-Ling Horng
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2000
1
EE
Yea-Ling Horng,
Jing-Reng Huang
,
Tsin-Yuan Chang
: A realistic fault model for flash memories.
Asian Test Symposium 2000
: 274-281
Coauthor
Index
1
Tsin-Yuan Chang
[
1
]
2
Jing-Reng Huang
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
