Jin-Fu Li

2009
35	EE	Bing-Wei Huang, Jin-Fu Li: Efficient diagnosis algorithms for drowsy SRAMs. ISQED 2009: 276-279
2008
34	EE	Da-Ming Chang, Jin-Fu Li, Yu-Jen Huang: A Built-In Redundancy-Analysis Scheme for Random Access Memories with Two-Level Redundancy. J. Electronic Testing 24(1-3): 181-192 (2008)
2007
33	EE	Tsu-Wei Tseng, Chun-Hsien Wu, Yu-Jen Huang, Jin-Fu Li, Alex Pao, Kevin Chiu, Eliot Chen: A Built-In Self-Repair Scheme for Multiport RAMs. VTS 2007: 355-360
32	EE	Jin-Fu Li, Tsu-Wei Tseng, Chin-Long Wey: An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories CoRR abs/0710.4747: (2007)
31	EE	Rei-Fu Huang, Jin-Fu Li, Jen-Chieh Yeh, Cheng-Wen Wu: Raisin: Redundancy Analysis Algorithm Simulation. IEEE Design & Test of Computers 24(4): 386-396 (2007)
30	EE	Chao-Da Huang, Jin-Fu Li, Tsu-Wei Tseng: ProTaR: An Infrastructure IP for Repairing RAMs in System-on-Chips. IEEE Trans. VLSI Syst. 15(10): 1135-1143 (2007)
29	EE	Jin-Fu Li: Transparent-Test Methodologies for Random Access Memories Without/With ECC. IEEE Trans. on CAD of Integrated Circuits and Systems 26(10): 1888-1893 (2007)
28	EE	Jin-Fu Li: Testing Ternary Content Addressable Memories With Comparison Faults Using March-Like Tests. IEEE Trans. on CAD of Integrated Circuits and Systems 26(5): 919-931 (2007)
27	EE	Jin-Fu Li, Chao-Da Huang: An Efficient Diagnosis Scheme for RAMs with Simple Functional Faults. IEICE Transactions 90-A(12): 2703-2711 (2007)
2006
26	EE	Tsu-Wei Tseng, Jin-Fu Li, Da-Ming Chang: A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap. DATE 2006: 53-58
25	EE	Yu-Jen Huang, Da-Ming Chang, Jin-Fu Li: A Built-In Redundancy-Analysis Scheme for Self-Repairable RAMs with Two-Level Redundancy. DFT 2006: 362-370
24	EE	Yu-Jen Huang, Jin-Fu Li: Testing Active Neighborhood Pattern-Sensitive Faults of Ternary Content Addressable Memories. European Test Symposium 2006: 55-62
2005
23	EE	Jin-Fu Li: Testing comparison faults of ternary CAMs based on comparison faults of binary CAMs. ASP-DAC 2005: 65-70
22	EE	Jin-Fu Li, Tsu-Wei Tseng, Chin-Long Wey: An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories. DATE 2005: 574-579
21	EE	Jin-Fu Li, Jiunn-Der Yu, Yu-Jen Huang: A design methodology for hybrid carry-lookahead/carry-select adders with reconfigurability. ISCAS (1) 2005: 77-80
20	EE	Jin-Fu Li, Chou-Kun Lin: Modeling and Testing Comparison Faults for Ternary Content Addressable Memories. VTS 2005: 60-65
19	EE	Jin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu: A built-in self-repair design for RAMs with 2-D redundancy. IEEE Trans. VLSI Syst. 13(6): 742-745 (2005)
2004
18	EE	Jin-Fu Li, Chao-Da Huang: An Efficient Diagnosis Scheme for Random Access Memories. Asian Test Symposium 2004: 277-282
17	EE	Jin-Fu Li, Chih-Chiang Hsu: Efficient Test Methodologies for Conditional Sum Adders. Asian Test Symposium 2004: 319-324
2003
16	EE	Jin-Fu Li, Jen-Chieh Yeh, Rei-Fu Huang, Cheng-Wen Wu, Peir-Yuan Tsai, Archer Hsu, Eugene Chow: A Built-In Self-Repair Scheme for Semiconductor Memories with 2-D Redundancy. ITC 2003: 393-402
15	EE	Rei-Fu Huang, Li-Ming Denq, Cheng-Wen Wu, Jin-Fu Li: A Testability-Driven Optimizer and Wrapper Generator for Embedded Memories. MTDT 2003: 53-
14	EE	Chih-Tsun Huang, Chi-Feng Wu, Jin-Fu Li, Cheng-Wen Wu: Built-in redundancy analysis for memory yield improvement. IEEE Transactions on Reliability 52(4): 386-399 (2003)
13	EE	Jin-Fu Li, Ruey-Shing Tzeng, Cheng-Wen Wu: Testing and Diagnosis Methodologies for Embedded Content Addressable Memories. J. Electronic Testing 19(2): 207-215 (2003)
2002
12	EE	Jin-Fu Li, Hsin-Jung Huang, Jeng-Bin Chen, Chih-Pin Su, Cheng-Wen Wu, Chuang Cheng, Shao-I Chen, Chi-Yi Hwang, Hsiao-Ping Lin: A Hierarchical Test Scheme for System-On-Chip Designs. DATE 2002: 486-490
11	EE	Rei-Fu Huang, Jin-Fu Li, Jen-Chieh Yeh, Cheng-Wen Wu: A Simulator for E aluating Redundancy Analysis Algorithms of Repairable Embedded Memories. IOLTW 2002: 262-
10	EE	Rei-Fu Huang, Jin-Fu Li, Jen-Chieh Yeh, Cheng-Wen Wu: A Simulator for Evaluating Redundancy Analysis Algorithms of Repairable Embedded Memories. MTDT 2002: 68-
9	EE	Jin-Fu Li, Ruey-Shing Tzeng, Cheng-Wen Wu: Testing and Diagnosing Embedded Content Addressable Memories. VTS 2002: 389-394
8	EE	Jin-Fu Li, Hsin-Jung Huang, Jeng-Bin Chen, Chih-Pin Su, Cheng-Wen Wu, Chuang Cheng, Shao-I Chen, Chi-Yi Hwang, Hsiao-Ping Lin: A Hierarchical Test Methodology for Systems on Chip. IEEE Micro 22(5): 69-81 (2002)
7	EE	Jin-Fu Li, Cheng-Wen Wu: Efficient FFT network testing and diagnosis schemes. IEEE Trans. VLSI Syst. 10(3): 267-278 (2002)
6	EE	Jin-Fu Li, Ruey-Shing Tzeng, Cheng-Wen Wu: Diagnostic Data Compression Techniques for Embedded Memories with Built-In Self-Test. J. Electronic Testing 18(4-5): 515-527 (2002)
5	EE	Chih-Wea Wang, Chi-Feng Wu, Jin-Fu Li, Cheng-Wen Wu, Tony Teng, Kevin Chiu, Hsiao-Ping Lin: A Built-in Self-Test Scheme with Diagnostics Support for Embedded SRAM. J. Electronic Testing 18(6): 637-647 (2002)
2001
4	EE	Jin-Fu Li, Cheng-Wen Wu: Memory fault diagnosis by syndrome compression. DATE 2001: 97-101
3		Jin-Fu Li, Kuo-Liang Cheng, Chih-Tsun Huang, Cheng-Wen Wu: March-based RAM diagnosis algorithms for stuck-at and coupling faults. ITC 2001: 758-767
2000
2	EE	Chih-Wea Wang, Chi-Feng Wu, Jin-Fu Li, Cheng-Wen Wu, Tony Teng, Kevin Chiu, Hsiao-Ping Lin: A built-in self-test and self-diagnosis scheme for embedded SRAM. Asian Test Symposium 2000: 45-50
1999
1	EE	Jin-Fu Li, Cheng-Wen Wu: Testable and Fault Tolerant Design for FFT Networks. DFT 1999: 201-209

Coauthor Index

1	Da-Ming Chang	[25] [26] [34]
2	Eliot Chen	[33]
3	Jeng-Bin Chen	[8] [12]
4	Shao-I Chen	[8] [12]
5	Chuang Cheng	[8] [12]
6	Kuo-Liang Cheng	[3]
7	Kevin Chiu	[2] [5] [33]
8	Eugene Chow	[16]
9	Li-Ming Denq	[15]
10	Archer Hsu	[16]
11	Chih-Chiang Hsu	[17]
12	Bing-Wei Huang	[35]
13	Chao-Da Huang	[18] [27] [30]
14	Chih-Tsun Huang	[3] [14]
15	Hsin-Jung Huang	[8] [12]
16	Rei-Fu Huang	[10] [11] [15] [16] [19] [31]
17	Yu-Jen Huang	[21] [24] [25] [33] [34]
18	Chi-Yi Hwang	[8] [12]
19	Chou-Kun Lin	[20]
20	Hsiao-Ping Lin	[2] [5] [8] [12]
21	Alex Pao	[33]
22	Chih-Pin Su	[8] [12]
23	Tony Teng	[2] [5]
24	Peir-Yuan Tsai	[16]
25	Tsu-Wei Tseng	[22] [26] [30] [32] [33]
26	Ruey-Shing Tzeng	[6] [9] [13]
27	Chih-Wea Wang	[2] [5]
28	Chin-Long Wey	[22] [32]
29	Cheng-Wen Wu	[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [19] [31]
30	Chi-Feng Wu	[2] [5] [14]
31	Chun-Hsien Wu	[33]
32	Jen-Chieh Yeh	[10] [11] [16] [19] [31]
33	Jiunn-Der Yu	[21]

Colors in the list of coauthors