| 2008 |
|---|
| 9 | EE | Dimitris Gizopoulos,
Kaushik Roy,
Subhasish Mitra,
Pia Sanda:
Soft Errors: System Effects, Protection Techniques and Case Studies.
DATE 2008 |
| 8 | EE | Pradeep Ramachandran,
Prabhakar Kudva,
Jeffrey W. Kellington,
John Schumann,
Pia Sanda:
Statistical Fault Injection.
DSN 2008: 122-127 |
| 2007 |
|---|
| 7 | EE | Subhasish Mitra,
Pia Sanda,
Norbert Seifert:
Soft Errors: Technology Trends, System Effects, and Protection Techniques.
IOLTS 2007: 4 |
| 2005 |
|---|
| 6 | EE | Sarita V. Adve,
Pia Sanda:
Guest Editors' Introduction: Reliability-Aware Microarchitecture.
IEEE Micro 25(6): 8-9 (2005) |
| 2003 |
|---|
| 5 | EE | Franco Stellari,
Peilin Song,
Moyra K. McManus,
Robert Gauthier,
Alan J. Weger,
Kiran V. Chatty,
Mujahid Muhammad,
Pia Sanda:
Optical and Electrical Testing of Latchup in I/O Interface Circuits.
ITC 2003: 236-245 |
| 4 | EE | Franco Stellari,
Peilin Song,
Moyra K. McManus,
Alan J. Weger,
Robert Gauthier,
Kiran V. Chatty,
Mujahid Muhammad,
Pia Sanda,
Philip Wu,
Steve Wilson:
Latchup Analysis Using Emission Microscopy.
Microelectronics Reliability 43(9-11): 1603-1608 (2003) |
| 2000 |
|---|
| 3 | EE | Stanislav Polonsky,
Moyra K. McManus,
Daniel R. Knebel,
Steve Steen,
Pia Sanda:
Non-invasive timing analysis of IBM G6 microprocessor L1 cache using picosecond imaging circuit analysis.
Asian Test Symposium 2000: 125- |
| 1999 |
|---|
| 2 | | William V. Huott,
Moyra K. McManus,
Daniel R. Knebel,
Steve Steen,
Dennis Manzer,
Pia Sanda,
Steve Wilson,
Yuen H. Chan,
Antonio Pelella,
Stanislav Polonsky:
The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA).
ITC 1999: 883-891 |
| 1998 |
|---|
| 1 | EE | Daniel R. Knebel,
Pia Sanda,
Moyra K. McManus,
Jeffrey A. Kash,
James C. Tsang,
David P. Vallett,
Leendert M. Huisman,
Phil Nigh,
Rick Rizzolo,
Peilin Song,
Franco Motika:
Diagnosis and characterization of timing-related defects by time-dependent light emission.
ITC 1998: 733-739 |
