| 2005 |
|---|
| 9 | EE | Masaki Hashizume,
Masahiro Ichimiya,
Hiroyuki Yotsuyanagi,
Takeomi Tamesada:
Electric field for detecting open leads in CMOS logic circuits by supply current testing.
ISCAS (3) 2005: 2995-2998 |
| 2004 |
|---|
| 8 | EE | Masahiro Ichimiya,
Masaki Hashizume,
Hiroyuki Yotsuyanagi,
Takeomi Tamesada:
A test circuit for pin shorts generating oscillation in CMOS logic circuits.
Systems and Computers in Japan 35(13): 10-20 (2004) |
| 2002 |
|---|
| 7 | EE | Hiroyuki Yotsuyanagi,
Masaki Hashizume,
Taisuke Iwakiri,
Masahiro Ichimiya,
Takeomi Tamesada:
Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field.
DELTA 2002: 387-391 |
| 2001 |
|---|
| 6 | EE | Teppei Takeda,
Masaki Hashizume,
Masahiro Ichimiya,
Hiroyuki Yotsuyanagi,
Yukiya Miura,
Kozo Kinoshita:
IDDQ Sensing Technique for High Speed IDDQ Testing.
Asian Test Symposium 2001: 111-116 |
| 5 | EE | Masaki Hashizume,
Masahiro Ichimiya,
Hiroyuki Yotsuyanagi,
Takeomi Tamesada:
CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application.
Asian Test Symposium 2001: 117-122 |
| 4 | EE | Masaki Hashizume,
Masahiro Ichimiya,
Hiroyuki Yotsuyanagi,
Takeomi Tamesada:
CMOS open defect detection by supply current test.
DATE 2001: 509 |
| 3 | EE | Hiroyuki Yotsuyanagi,
Masaki Hashizume,
Taisuke Iwakiri,
Masahiro Ichimiya,
Takeomi Tamesada:
Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field.
DFT 2001: 287- |
| 2000 |
|---|
| 2 | EE | Masaki Hashizume,
Hiroyuki Yotsuyanagi,
Masahiro Ichimiya,
Takeomi Tamesada,
Masashi Takeda:
High speed IDDQ test and its testability for process variation.
Asian Test Symposium 2000: 344-349 |
| 1998 |
|---|
| 1 | EE | Masaki Hashizume,
Yukiya Miura,
Masahiro Ichimiya,
Takeomi Tamesada,
Kozo Kinoshita:
A High-Speed IDDQ Sensor for Low-Voltage ICs.
Asian Test Symposium 1998: 327- |
