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Marie-Lise Flottes

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2008
37EEM. Doulcier, Marie-Lise Flottes, Bruno Rouzeyre: AES-Based BIST: Self-Test, Test Pattern Generation and Signature Analysis. DELTA 2008: 314-321
36EEGiorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre: An Integrated Validation Environment for Differential Power Analysis. DELTA 2008: 527-532
35EEJulien Dalmasso, Érika F. Cota, Marie-Lise Flottes, Bruno Rouzeyre: Improving the Test of NoC-Based SoCs with Help of Compression Schemes. ISVLSI 2008: 139-144
2007
34 Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre: A Novel Parity Bit Scheme for SBox in AES Circuits. DDECS 2007: 267-271
33EEGiorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre: An On-Line Fault Detection Scheme for SBoxes in Secure Circuits. IOLTS 2007: 57-62
32 Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre: A Dependable Parallel Architecture for SBoxes. ReCoSoC 2007: 132-137
31EEJulien Dalmasso, Marie-Lise Flottes, Bruno Rouzeyre: Test data compression and TAM design. VLSI-SoC 2007: 178-183
30EEMathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre: Mutation Sampling Technique for the Generation of Structural Test Data CoRR abs/0710.4802: (2007)
29EEDavid Hély, Frédéric Bancel, Marie-Lise Flottes, Bruno Rouzeyre: Securing Scan Control in Crypto Chips. J. Electronic Testing 23(5): 457-464 (2007)
2006
28EEDavid Hély, Frédéric Bancel, Marie-Lise Flottes, Bruno Rouzeyre: A secure scan design methodology. DATE 2006: 1177-1178
27EEJulien Dalmasso, Marie-Lise Flottes, Bruno Rouzeyre: Fitting ATE Channels with Scan Chains: a Comparison between a Test Data Compression Technique and Serial Loading of Scan Chains. DELTA 2006: 295-300
26EEDavid Hély, Frédéric Bancel, Marie-Lise Flottes, Bruno Rouzeyre: Secure Scan Techniques: A Comparison. IOLTS 2006: 119-124
2005
25EEMathieu Scholivé, Vincent Beroulle, Chantal Robach, Marie-Lise Flottes, Bruno Rouzeyre: Mutation Sampling Technique for the Generation of Structural Test Data. DATE 2005: 1022-1023
2004
24EEMarie-Lise Flottes, Regis Poirier, Bruno Rouzeyre: An Arithmetic Structure for Test Data Horizontal Compression. DATE 2004: 428-435
23EEMarie-Lise Flottes, Yves Bertrand, L. Balado, E. Lupon, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, N. Pricopi, Hans-Joachim Wunderlich: Digital, Memory and Mixed-Signal Test Engineering Education: Five Centres of Competence in Europ. DELTA 2004: 135-139
22EEMarie-Lise Flottes, Regis Poirier, Bruno Rouzeyre: On Using Test Vector Differences for Reducing Test Pin Numbers. DELTA 2004: 275-280
21EEDavid Hély, Marie-Lise Flottes, Frédéric Bancel, Bruno Rouzeyre, Nicolas Bérard, Michel Renovell: Scan Design and Secure Chip. IOLTS 2004: 219-226
2003
20EEYves Bertrand, Marie-Lise Flottes, L. Balado, Joan Figueras, Anton Biasizzo, Franc Novak, Stefano Di Carlo, Paolo Prinetto, N. Pricopi, Hans-Joachim Wunderlich, J.-P. Van der Heyden: Test Engineering Education in Europe: the EuNICE-Test Project. MSE 2003: 85-86
19EEMarie-Lise Flottes, Christian Landrault, A. Petitqueux: A Unified DFT Approach for BIST and External Test. J. Electronic Testing 19(1): 49-60 (2003)
2002
18 Michel Robert, Bruno Rouzeyre, Christian Piguet, Marie-Lise Flottes: SOC Design Methodologies, IFIP TC10/WG10.5 Eleventh International Conference on Very Large Scale Integration of Systems-on/Chip (VLSI-SOC'01), December 3-5, 2001, Montpellier, France Kluwer 2002
17EEMarie-Lise Flottes, Julien Pouget, Bruno Rouzeyre: A Heuristic for Test Scheduling at System Level. DATE 2002: 1124
16EEYves Bertrand, Marie-Lise Flottes, Florence Azaïs, Serge Bernard, Laurent Latorre, Regis Lorival: European Network for Test Education. DELTA 2002: 230-234
2001
15 Marie-Lise Flottes, Julien Pouget, Bruno Rouzeyre: Power-Constrained Test Scheduling for SoCs Under a "no session" Scheme. VLSI-SOC 2001: 401-412
14EEDavid Berthelot, Marie-Lise Flottes, Bruno Rouzeyre: A Method for Trading off Test Time, Area and Fault Coverage in Datapath BIST Synthesis. J. Electronic Testing 17(3-4): 331-339 (2001)
2000
13EEMarie-Lise Flottes, Christian Landrault, A. Petitqueux: Design for sequential testability: an internal state reseeding approach for 100 % fault coverage. Asian Test Symposium 2000: 404-
12 David Berthelot, Marie-Lise Flottes, Bruno Rouzeyre: BISTing data paths at behavioral level. ITC 2000: 672-680
1999
11EEYves Bertrand, Florence Azaïs, Marie-Lise Flottes, Regis Lorival: A Successful Distance-Learning Experience for IC Test Education. MSE 1999: 20-21
10EEDavid Berthelot, Marie-Lise Flottes, Bruno Rouzeyre: BISTing Datapaths under Heterogeneous Test Schemes. J. Electronic Testing 14(1-2): 115-123 (1999)
1998
9EEMarie-Lise Flottes, R. Pires, Bruno Rouzeyre: Alleviating DFT Cost Using Testability Driven HLS. Asian Test Symposium 1998: 46-51
8EEMarie-Lise Flottes, R. Pires, Bruno Rouzeyre, L. Volpe: Scanning Datapaths: A Fast and Effective Partial Scan Selection Technique. DATE 1998: 921-922
7EEMarie-Lise Flottes, R. Pires, Bruno Rouzeyre, L. Volpe: Low Cost Partial Scan Design: A High Level Synthesis Approach. VTS 1998: 332-340
1997
6EEMarie-Lise Flottes, R. Pires, Bruno Rouzeyre: Analyzing testability from behavioral to RT level. ED&TC 1997: 158-165
5EEMarie-Lise Flottes, D. Hammad, Bruno Rouzeyre: Improving Testability of Non-Scan Designs during Behavioral Synthesis. J. Electronic Testing 11(1): 29-42 (1997)
1995
4 Christian Landrault, Marie-Lise Flottes, Bruno Rouzeyre: Is High-Level Test Synthesis Just Design for Test? ITC 1995: 294
1994
3 Marie-Lise Flottes, D. Hammad, Bruno Rouzeyre: Automatic Synthesis of BISTed Data Paths From High Level Specification. EDAC-ETC-EUROASIC 1994: 591-598
1991
2EEMarie-Lise Flottes, Christian Landrault, Serge Pravossoudovitch: Fault modeling and fault equivalence in CMOS technology. J. Electronic Testing 2(3): 229-241 (1991)
1990
1EEMarie-Lise Flottes, Christian Landrault, Serge Pravossoudovitch: Fault modelling and fault equivalence in CMOS technology. EURO-DAC 1990: 407-412

Coauthor Index

1Florence Azaïs [11] [16]
2L. Balado [20] [23]
3Frédéric Bancel [21] [26] [28] [29]
4Nicolas Bérard [21]
5Serge Bernard [16]
6Vincent Beroulle [25] [30]
7David Berthelot [10] [12] [14]
8Yves Bertrand [11] [16] [20] [23]
9Anton Biasizzo [20] [23]
10Stefano Di Carlo [20] [23]
11Érika F. Cota [35]
12Julien Dalmasso [27] [31] [35]
13M. Doulcier [37]
14Joan Figueras [20]
15D. Hammad [3] [5]
16David Hély [21] [26] [28] [29]
17J.-P. Van der Heyden [20]
18Christian Landrault [1] [2] [4] [13] [19]
19Laurent Latorre [16]
20Regis Lorival [11] [16]
21E. Lupon [23]
22Giorgio Di Natale [32] [33] [34] [36]
23Franc Novak [20] [23]
24A. Petitqueux [13] [19]
25Christian Piguet [18]
26R. Pires [6] [7] [8] [9]
27Regis Poirier [22] [24]
28Julien Pouget [15] [17]
29Serge Pravossoudovitch [1] [2]
30N. Pricopi [20] [23]
31Paolo Prinetto [20] [23]
32Michel Renovell [21]
33Chantal Robach [25] [30]
34Michel Robert [18]
35Bruno Rouzeyre [3] [4] [5] [6] [7] [8] [9] [10] [12] [14] [15] [17] [18] [21] [22] [24] [25] [26] [27] [28] [29] [30] [31] [32] [33] [34] [35] [36] [37]
36Mathieu Scholivé [25] [30]
37L. Volpe [7] [8]
38Hans-Joachim Wunderlich [20] [23]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)