Fabian Vargas

2008
31	EE	Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits. DDECS 2008: 34-37
2007
30		Jorge Semião, J. Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Improving Tolerance to Power-Supply and Temperature Variations in Synchronous Circuits. DDECS 2007: 295-300
29	EE	Jorge Semião, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino Bicho Dos Santos, Isabel C. Teixeira, João Paulo Teixeira: Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations. DFT 2007: 303-311
28	EE	Jorge Semião, J. Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: On-line Dynamic Delay Insertion to Improve Signal Integrity in Synchronous Circuits. IOLTS 2007: 167-172
27	EE	Fabian Vargas, Leonardo Piccoli, Juliano Benfica, Antonio A. de Alecrim Jr., Marlon Moraes: Time-Sensitive Control-Flow Checking for Multitask Operating System-Based SoCs. IOLTS 2007: 93-100
26	EE	Jorge Semião, J. Freijedo, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Enhancing the Tolerance to Power-Supply Instability in Digital Circuits. ISVLSI 2007: 207-212
2006
25	EE	M. Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Jorge Semião, Isabel C. Teixeira, João Paulo Teixeira: Dynamic Fault Detection in Digital Systems Using Dynamic Voltage Scaling and Multi-Temperature Schemes. IOLTS 2006: 257-262
24	EE	Fabian Vargas: 2006 Latin American Test Workshop. IEEE Design & Test of Computers 23(3): 185 (2006)
23	EE	Fabian Vargas: Design and test on chip for EMC. IEEE Design & Test of Computers 23(6): 502-503 (2006)
22	EE	Paolo Bernardi, Leticia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante: A New Hybrid Fault Detection Technique for Systems-on-a-Chip. IEEE Trans. Computers 55(2): 185-198 (2006)
2005
21	EE	Paolo Bernardi, Leticia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante: On-Line Detection of Control-Flow Errors in SoCs by Means of an Infrastructure IP Core. DSN 2005: 50-58
20	EE	Fabian Vargas, D. L. Cavalcante, E. Gatti, Dárcio Prestes, D. Lupi: On the Proposition of an EMI-Based Fault Injection Approach. IOLTS 2005: 207-208
19	EE	M. Rodríguez-Irago, Juan J. Rodríguez-Andina, Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Dynamic Fault Test and Diagnosis in Digital Systems Using Multiple Clock Schemes and Multi-VDD Test. IOLTS 2005: 281-286
18	EE	D. Barros Júnior, M. Rodríguez-Irago, Marcelino B. Santos, Isabel C. Teixeira, Fabian Vargas, João Paulo Teixeira: Fault Modeling and Simulation of Power Supply Voltage Transients in Digital Systems on a Chip. J. Electronic Testing 21(4): 349-363 (2005)
2004
17	EE	Daniel Barros Jr., Fabian Vargas, Marcelino B. Santos, Isabel C. Teixeira, João Paulo Teixeira: Modeling and Simulation of Time Domain Faults in Digital Systems. IOLTS 2004: 5-10
16	EE	Leticia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante: Hybrid Soft Error Detection by Means of Infrastructure IP Cores. IOLTS 2004: 79-88
15	EE	Fabian Vargas, Víctor H. Champac: Guest Editorial. J. Electronic Testing 20(4): 331-332 (2004)
14	EE	Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr., Diogo B. Brum, Eduardo Luis Rhod: Merging a DSP-Oriented Signal Integrity Technique and SW-Based Fault Handling Mechanisms to Ensure Reliable DSP Systems. J. Electronic Testing 20(4): 397-411 (2004)
2003
13	EE	Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr., Diogo B. Brum: Briefing a New Approach to Improve the EMI Immunity of DSP Systems. Asian Test Symposium 2003: 468-473
12	EE	Fabian Vargas, Diogo B. Brum, Dárcio Prestes, Leticia Maria Veiras Bolzani, Eduardo Luis Rhod, Matteo Sonza Reorda: Introducing SW-Based Fault Handling Mechanisms to Cope with EMI in Embedded Electronics: Are They A Good Remedy? IOLTS 2003: 163
11	EE	Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr.: A New On-Line Robust Approach to Design Noise-Immune Speech Recognition Systems. J. Electronic Testing 19(1): 61-72 (2003)
2002
10	EE	Fabian Vargas, Djones Lettnin, Diogo B. Brum, Dárcio Prestes: A New Learning Approach to Design Fault Tolerant ANNs: Finally a Zero HW-SW Overhead. Asian Test Symposium 2002: 218-223
9	EE	Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr.: Experimental Results of a Recovery Block Scheme to Handle Noise in Speech Recognition Systems. Asian Test Symposium 2002: 224-229
8	EE	Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr.: A New On-Line Robust Approach to Design Noise Immune Speech Recognition Systems. IOLTW 2002: 187
7	EE	Fabian Vargas, Maria Cristina Felippetto de Castro, Marcello Macarthy, Djones Lettnin: Electrocardiogram Pattern Recognition by Means of MLP Network and PCA: A Case Study on Equal Amount of Input Signal Types. SBRN 2002: 200-205
2001
6	EE	Fabian Vargas, Rubem Dutra Ribeiro Fagundes, Daniel Barros Jr.: A New Approach to Design Reliable Real-Time Speech Recognition Systems. IOLTW 2001: 187-191
5	EE	Eduardo Augusto Bezerra, Fabian Vargas, Michael Paul Gough: Improving Reconfigurable Systems Reliability by Combining Periodical Test and Redundancy Techniques: A Case Study. J. Electronic Testing 17(2): 163-174 (2001)
2000
4	EE	Fabian Vargas, Alexandre M. Amory: Transient-fault tolerant VHDL descriptions: a case-study for area overhead analysis. Asian Test Symposium 2000: 417-422
3	EE	Fabian Vargas, Alexandre M. Amory, Raoul Velazco: Estimating Circuit Fault-Tolerance by Means of Transient-Fault Injection in VHDL. IOLTW 2000: 67-72
1998
2	EE	Fabian Vargas, E. Bezerra, L. Wulff, Daniel Barros Jr.: Optimizing HW/SW Codesign towards Reliability for Critical-Application Systems. Asian Test Symposium 1998: 52-57
1995
1		Fabian Vargas, Michael Nicolaidis, Yervant Zorian: An Approach for Designing Total-Dose Tolerant MCMs Based on Current Monitoring. ITC 1995: 345-354

Coauthor Index

1	Antonio A. de Alecrim Jr.	[27]
2	Alexandre M. Amory	[3] [4]
3	Daniel Barros Jr.	[2] [6] [8] [9] [11] [13] [14] [17]
4	Juliano Benfica	[27]
5	Paolo Bernardi	[21] [22]
6	E. Bezerra	[2]
7	Eduardo Augusto Bezerra	[5]
8	Leticia Maria Veiras Bolzani	[12] [16] [21] [22]
9	Diogo B. Brum	[10] [12] [13] [14]
10	Maria Cristina Felippetto de Castro	[7]
11	D. L. Cavalcante	[20]
12	Víctor H. Champac (Víctor H. Champac Vilela)	[15]
13	Rubem Dutra Ribeiro Fagundes	[6] [8] [9] [11] [13] [14]
14	J. Freijedo	[26] [28] [30]
15	E. Gatti	[20]
16	Michael Paul Gough	[5]
17	D. Barros Júnior	[18]
18	Djones Lettnin	[7] [10]
19	D. Lupi	[20]
20	Marcello Macarthy	[7]
21	Marlon Moraes	[27]
22	Michael Nicolaidis	[1]
23	Leonardo Piccoli	[27]
24	Dárcio Prestes	[10] [12] [20]
25	Maurizio Rebaudengo	[16] [21] [22]
26	Matteo Sonza Reorda	[12] [16] [21] [22]
27	Eduardo Luis Rhod	[12] [14]
28	Juan J. Rodríguez-Andina	[19] [25] [26] [28] [29] [30] [31]
29	M. Rodríguez-Irago	[18] [19] [25]
30	Marcelino B. Santos	[17] [18] [19] [26] [28] [30] [31]
31	Marcelino Bicho Dos Santos	[29]
32	Jorge Semião	[25] [26] [28] [29] [30] [31]
33	Isabel C. Teixeira	[17] [18] [19] [25] [26] [28] [29] [30] [31]
34	João Paulo Teixeira	[17] [18] [19] [25] [26] [28] [29] [30] [31]
35	Raoul Velazco	[3]
36	Massimo Violante	[16] [21] [22]
37	L. Wulff	[2]
38	Yervant Zorian	[1]

Colors in the list of coauthors