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Jun-Weir Lin

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2002
4EEJun-Weir Lin, Chung-Len Lee, Jwu E. Chen: An Efficient Test and Diagnosis Scheme for the Feedback Type of Analog Circuits with Minimal Added Circuits. DATE 2002: 1119
2001
3EEJun-Weir Lin, Chung-Len Lee, Chau-chin Su, Jwu E. Chen: Fault Diagnosis for Linear Analog Circuits. J. Electronic Testing 17(6): 483-494 (2001)
2000
2EEJun-Weir Lin, Chung-Len Lee, Chauchin Su, Jwu E. Chen: Fault diagnosis for linear analog circuits. Asian Test Symposium 2000: 25-30
1EEYin-Chao Huang, Chung-Len Lee, Jun-Weir Lin, Jwu E. Chen, Chauchin Su: A methodology for fault model development for hierarchical linear systems. Asian Test Symposium 2000: 90-95

Coauthor Index

1Jwu E. Chen [1] [2] [3] [4]
2Yin-Chao Huang [1]
3Chung-Len Lee [1] [2] [3] [4]
4Chau-chin Su [3]
5Chauchin Su [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)