2002 |
4 | EE | Jun-Weir Lin,
Chung-Len Lee,
Jwu E. Chen:
An Efficient Test and Diagnosis Scheme for the Feedback Type of Analog Circuits with Minimal Added Circuits.
DATE 2002: 1119 |
2001 |
3 | EE | Jun-Weir Lin,
Chung-Len Lee,
Chau-chin Su,
Jwu E. Chen:
Fault Diagnosis for Linear Analog Circuits.
J. Electronic Testing 17(6): 483-494 (2001) |
2000 |
2 | EE | Jun-Weir Lin,
Chung-Len Lee,
Chauchin Su,
Jwu E. Chen:
Fault diagnosis for linear analog circuits.
Asian Test Symposium 2000: 25-30 |
1 | EE | Yin-Chao Huang,
Chung-Len Lee,
Jun-Weir Lin,
Jwu E. Chen,
Chauchin Su:
A methodology for fault model development for hierarchical linear systems.
Asian Test Symposium 2000: 90-95 |