Ismet Bayraktaroglu

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25EEIsmet Bayraktaroglu, Olivier Caty, Yickkei Wong: Highly Configurable Programmable Built-In Self Test Architecture for High-Speed Memories. VTS 2005: 21-26
24EEIsmet Bayraktaroglu, Alex Orailoglu: The Construction of Optimal Deterministic Partitionings in Scan-Based BIST Fault Diagnosis: Mathematical Foundations and Cost-Effective Implementations. IEEE Trans. Computers 54(1): 61-75 (2005)
23EESule Ozev, Ismet Bayraktaroglu, Alex Orailoglu: Seamless Test of Digital Components in Mixed-Signal Paths. IEEE Design & Test of Computers 21(1): 44-55 (2004)
22EEYiorgos Makris, Ismet Bayraktaroglu, Alex Orailoglu: Enhancing reliability of RTL controller-datapath circuits via Invariant-based concurrent test. IEEE Transactions on Reliability 53(2): 269-278 (2004)
21EEWenjing Rao, Ismet Bayraktaroglu, Alex Orailoglu: Test application time and volume compression through seed overlapping. DAC 2003: 732-737
20EEOlivier Caty, Ismet Bayraktaroglu, Amitava Majumdar, Richard Lee, John Bell, Lisa Curhan: Instruction Based BIST for Board/System Level Test of External Memories and Internconnects. ITC 2003: 961-970
19EEIsmet Bayraktaroglu, Alex Orailoglu: Decompression Hardware Determination for Test Volume and Time Reduction through Unified Test Pattern Compaction and Compression. VTS 2003: 113-120
18EEIsmet Bayraktaroglu, Alex Orailoglu: Concurrent Application of Compaction and Compression for Test Time and Data Volume Reduction in Scan Designs. IEEE Trans. Computers 52(11): 1480-1489 (2003)
17EEOzgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailoglu: Reducing Average and Peak Test Power Through Scan Chain Modification. J. Electronic Testing 19(4): 457-467 (2003)
16EEIsmet Bayraktaroglu, Alex Orailoglu: Gate Level Fault Diagnosis in Scan-Based BIST. DATE 2002: 376-381
15EEOzgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailoglu: Scan Power Reduction Through Test Data Transition Frequency Analysis. ITC 2002: 844-850
14EEOzgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailoglu: Test Power Reduction through Minimization of Scan Chain Transitions. VTS 2002: 166-172
13EEIsmet Bayraktaroglu, Alex Orailoglu: Cost-Effective Deterministic Partitioning for Rapid Diagnosis in Scan-Based BIST. IEEE Design & Test of Computers 19(1): 42-53 (2002)
12EEIsmet Bayraktaroglu, Alex Orailoglu: Selecting a PRPG: Randomness, Primitiveness, or Sheer Luck? Asian Test Symposium 2001: 373-378
11EEIsmet Bayraktaroglu, Alex Orailoglu: Test Volume and Application Time Reduction Through Scan Chain Concealment. DAC 2001: 151-155
10EEIsmet Bayraktaroglu, Alex Orailoglu: Diagnosis for scan-based BIST: reaching deep into the signatures. DATE 2001: 102-111
9EEIsmet Bayraktaroglu, Alex Orailoglu: Concurrent test for digital linear systems. IEEE Trans. on CAD of Integrated Circuits and Systems 20(9): 1132-1142 (2001)
8EEIsmet Bayraktaroglu, Alex Orailoglu: Accumulation-based concurrent fault detection for linear digital state variable systems. Asian Test Symposium 2000: 484-
7EEIsmet Bayraktaroglu, Alex Orailoglu: Improved fault diagnosis in scan-based BIST via superposition. DAC 2000: 55-58
6EESule Ozev, Ismet Bayraktaroglu, Alex Orailoglu: Test Synthesis for Mixed-Signal SOC Paths. DATE 2000: 128-133
5 Ismet Bayraktaroglu, Alex Orailoglu: Deterministic partitioning techniques for fault diagnosis in scan-based BIST. ITC 2000: 273-282
4EEYiorgos Makris, Ismet Bayraktaroglu, Alex Orailoglu: Invariance-Based On-Line Test for RTL Controller-Datapath Circuits. VTS 2000: 459-464
3EEIsmet Bayraktaroglu, Alex Orailoglu: Low-Cost On-Line Test for Digital Filters. VTS 1999: 446-451
2EEIsmet Bayraktaroglu, Arif Selçuk Ögrenci, Günhan Dündar, Sina Balkir, Ethem Alpaydin: ANNSyS: an Analog Neural Network Synthesis System. Neural Networks 12(2): 325-338 (1999)
1EEIsmet Bayraktaroglu, K. Udawatta, Alex Orailoglu: An Examination of PRPG Selection Approaches for Large, Industrial Designs. Asian Test Symposium 1998: 440-

Coauthor Index

1Ethem Alpaydin [2]
2Sina Balkir [2]
3John Bell [20]
4Olivier Caty [20] [25]
5Lisa Curhan [20]
6Günhan Dündar [2]
7Richard Lee [20]
8Amitava Majumdar [20]
9Yiorgos Makris [4] [22]
10Arif Selçuk Ögrenci [2]
11Alex Orailoglu [1] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [21] [22] [23] [24]
12Sule Ozev [6] [23]
13Wenjing Rao [21]
14Ozgur Sinanoglu [14] [15] [17]
15K. Udawatta [1]
16Yickkei Wong [25]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)