K. Y. Ko

2002
3	EE	K. Y. Ko, Mike W. T. Wong, Y. S. Lee: Testing System-On-Chip by Summations of Cores? Test Output Voltages. Asian Test Symposium 2002: 350-355
2	EE	Mike W. T. Wong, K. Y. Ko, Y. S. Lee: Analog and Mixed-Signal IP Cores Testing. DELTA 2002: 3-7
2000
1	EE	K. Y. Ko, Mike W. T. Wong: New built-in self-test technique based on addition/subtraction of selected node voltages. Asian Test Symposium 2000: 39-

Coauthor Index

1	Y. S. Lee	[2] [3]
2	Mike W. T. Wong	[1] [2] [3]