S. L. Lin
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2000
1
EE
S. L. Lin,
S. Mourad
,
S. Krishnan
: A BIST methodology for at-speed testing of data communications transceivers.
Asian Test Symposium 2000
: 216-221
Coauthor
Index
1
S. Krishnan
[
1
]
2
S. Mourad
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)