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Masaki Hashizume

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2009
30EEKoji Yamazaki, Toshiyuki Tsutsumi, Hiroshi Takahashi, Yoshinobu Higami, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume: A Novel Approach for Improving the Quality of Open Fault Diagnosis. VLSI Design 2009: 85-90
29EEHiroyuki Yotsuyanagi, Masaki Hashizume, Toshiyuki Tsutsumi, Koji Yamazaki, Takashi Aikyo, Yoshinobu Higami, Hiroshi Takahashi, Yuzo Takamatsu: Fault Effect of Open Faults Considering Adjacent Signal Lines in a 90 nm IC. VLSI Design 2009: 91-96
2007
28EEHiroshi Takahashi, Yoshinobu Higami, Toru Kikkawa, Takashi Aikyo, Yuzo Takamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume: Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines. DFT 2007: 243-251
2006
27EEMasaki Hashizume, Tomomi Nishida, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Yukiya Miura: Current Testable Design of Resistor String DACs. DELTA 2006: 197-200
2005
26EEMasaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada: Electric field for detecting open leads in CMOS logic circuits by supply current testing. ISCAS (3) 2005: 2995-2998
25EEHiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita: Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees. J. Electronic Testing 21(6): 613-620 (2005)
2004
24EEMasaki Hashizume, Daisuke Yoneda, Hiroyuki Yotsuyanagi, Tetsuo Tada, Takeshi Koyama, Ikuro Morita, Takeomi Tamesada: I_DDQ Test Method Based on Wavelet Transformation for Noisy Current Measurement Environment. Asian Test Symposium 2004: 112-117
23EEMasaki Hashizume, Tetsuo Akita, Hiroyuki Yotsuyanagi, Takeomi Tamesada: CMOS Open Fault Detection by Appearance Time of Switching Supply Current. DELTA 2004: 183-188
22EEIsao Tsukimoto, Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada: Practical Fault Coverage of Supply Current Tests for Bipolar ICs. DELTA 2004: 189-194
21EEHiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita: On Configuring Scan Trees to Reduce Scan Shifts based on a Circuit Structure. DELTA 2004: 269-274
20EEDaisuke Ezaki, Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada: A Power Supply Circuit Recycling Charge in Adiabatic Dynamic CMOS Logic Circuits. DELTA 2004: 306-311
19EEMasahiro Ichimiya, Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada: A test circuit for pin shorts generating oscillation in CMOS logic circuits. Systems and Computers in Japan 35(13): 10-20 (2004)
2003
18EEMasaki Hashizume, Teppei Takeda, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Yukiya Miura, Kozo Kinoshita: A BIST Circuit for IDDQ Tests. Asian Test Symposium 2003: 390-395
17EEHiroyuki Yotsuyanagi, Toshimasa Kuchii, Shigeki Nishikawa, Masaki Hashizume, Kozo Kinoshita: Reducing Scan Shifts Using Folding Scan Trees. Asian Test Symposium 2003: 6-11
2002
16EEHiroyuki Yotsuyanagi, Masaki Hashizume, Takeomi Tamesada: Test Time Reduction for I DDQ Testing by Arranging Test Vectors. Asian Test Symposium 2002: 423-428
15EEHiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada: Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field. DELTA 2002: 387-391
14EEMasaki Hashizume, Masashi Sato, Hiroyuki Yotsuyanagi, Takeomi Tamesada: Power Supply Circuit for High Speed Operation of Adiabatic Dynamic CMOS Logic Circuits. DELTA 2002: 459-461
2001
13EETeppei Takeda, Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Yukiya Miura, Kozo Kinoshita: IDDQ Sensing Technique for High Speed IDDQ Testing. Asian Test Symposium 2001: 111-116
12EEMasaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada: CMOS Open Defect Detection Based on Supply Current in Time-Variable Electric Field and Supply Voltage Application. Asian Test Symposium 2001: 117-122
11EEHiroyuki Yotsuyanagi, Shinsuke Hata, Masaki Hashizume, Takeomi Tamesada: Sequential Redundancy Removal Using Test Generation and Multiple Unreachable States. Asian Test Symposium 2001: 23-
10EEMasaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Takeomi Tamesada: CMOS open defect detection by supply current test. DATE 2001: 509
9EEHiroyuki Yotsuyanagi, Masaki Hashizume, Taisuke Iwakiri, Masahiro Ichimiya, Takeomi Tamesada: Test Pattern for Supply Current Test of Open Defects by Applying Time-Variable Electric Field. DFT 2001: 287-
2000
8EEMasaki Hashizume, Hiroyuki Yotsuyanagi, Masahiro Ichimiya, Takeomi Tamesada, Masashi Takeda: High speed IDDQ test and its testability for process variation. Asian Test Symposium 2000: 344-349
7EEMasaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Masashi Takeda: Testability Analysis of IDDQ Testing with Large Threshold Value. DFT 2000: 367-375
1999
6EEMasaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada: Identification of Feedback Bridging Faults with Oscillation. Asian Test Symposium 1999: 25-
1998
5EEMasaki Hashizume, Yukiya Miura, Masahiro Ichimiya, Takeomi Tamesada, Kozo Kinoshita: A High-Speed IDDQ Sensor for Low-Voltage ICs. Asian Test Symposium 1998: 327-
1997
4EEMasaki Hashizume, Toshimasa Kuchii, Takeomi Tamesada: Supply Current Test for Unit-to-unit Variations of Electrical Characteristics in Gates. Asian Test Symposium 1997: 372-377
1996
3EEToshimasa Kuchii, Masaki Hashizume, Takeomi Tamesada: Algorithmic Test Generation for Supply Current Testing of TTL Combinational Circuits. Asian Test Symposium 1996: 171-176
1994
2 Masaki Hashizume, Takeomi Tamesada, Akio Sakamoto: A Maximum Clique Derivation Algorithm for Simplification of Incompletely Specified Machines. ISCAS 1994: 193-196
1988
1 Masaki Hashizume, Takeomi Tamesada, Kazuhiro Yamada, Masaaki Kawakami: Fault Detection of Combinational Circuits Based on Supply Current. ITC 1988: 374-380

Coauthor Index

1Takashi Aikyo [28] [29] [30]
2Tetsuo Akita [23]
3Daisuke Ezaki [20]
4Shinsuke Hata [11]
5Yoshinobu Higami [28] [29] [30]
6Masahiro Ichimiya [5] [8] [9] [10] [12] [13] [15] [19] [26]
7Taisuke Iwakiri [9] [15]
8Masaaki Kawakami [1]
9Toru Kikkawa [28]
10Kozo Kinoshita [5] [13] [17] [18] [21] [25]
11Takeshi Koyama [24]
12Toshimasa Kuchii [3] [4] [17] [21] [25]
13Yukiya Miura [5] [13] [18] [27]
14Ikuro Morita [24]
15Tomomi Nishida [27]
16Shigeki Nishikawa [17] [21] [25]
17Akio Sakamoto [2]
18Masashi Sato [14]
19Tetsuo Tada [24]
20Hiroshi Takahashi [28] [29] [30]
21Yuzo Takamatsu [28] [29] [30]
22Masashi Takeda [7] [8]
23Teppei Takeda [13] [18]
24Takeomi Tamesada [1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [14] [15] [16] [18] [19] [20] [22] [23] [24] [26] [27]
25Isao Tsukimoto [22]
26Toshiyuki Tsutsumi [29] [30]
27Kazuhiro Yamada [1]
28Koji Yamazaki [29] [30]
29Daisuke Yoneda [24]
30Hiroyuki Yotsuyanagi [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] [25] [26] [27] [28] [29] [30]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)