2003 |
8 | EE | Franco Stellari,
Peilin Song,
Moyra K. McManus,
Robert Gauthier,
Alan J. Weger,
Kiran V. Chatty,
Mujahid Muhammad,
Pia Sanda:
Optical and Electrical Testing of Latchup in I/O Interface Circuits.
ITC 2003: 236-245 |
7 | EE | Franco Stellari,
Peilin Song,
Moyra K. McManus,
Alan J. Weger,
Robert Gauthier,
Kiran V. Chatty,
Mujahid Muhammad,
Pia Sanda,
Philip Wu,
Steve Wilson:
Latchup Analysis Using Emission Microscopy.
Microelectronics Reliability 43(9-11): 1603-1608 (2003) |
6 | EE | Romain Desplats,
A. Eral,
Felix Beaudoin,
Philippe Perdu,
Alan J. Weger,
Moyra K. McManus,
Peilin Song,
Franco Stellari:
Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling.
Microelectronics Reliability 43(9-11): 1663-1668 (2003) |
2002 |
5 | EE | Franco Stellari,
Peilin Song,
James C. Tsang,
Moyra K. McManus,
Mark B. Ketchen:
Optical diagnosis of excess IDDQ in low power CMOS circuits.
Microelectronics Reliability 42(9-11): 1689-1694 (2002) |
2000 |
4 | EE | Stanislav Polonsky,
Moyra K. McManus,
Daniel R. Knebel,
Steve Steen,
Pia Sanda:
Non-invasive timing analysis of IBM G6 microprocessor L1 cache using picosecond imaging circuit analysis.
Asian Test Symposium 2000: 125- |
1999 |
3 | | Peilin Song,
Franco Motika,
Daniel R. Knebel,
Rick Rizzolo,
Mary P. Kusko,
Julie Lee,
Moyra K. McManus:
Diagnostic techniques for the IBM S/390 600 MHz G5 microprocessor.
ITC 1999: 1073-1082 |
2 | | William V. Huott,
Moyra K. McManus,
Daniel R. Knebel,
Steve Steen,
Dennis Manzer,
Pia Sanda,
Steve Wilson,
Yuen H. Chan,
Antonio Pelella,
Stanislav Polonsky:
The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA).
ITC 1999: 883-891 |
1998 |
1 | EE | Daniel R. Knebel,
Pia Sanda,
Moyra K. McManus,
Jeffrey A. Kash,
James C. Tsang,
David P. Vallett,
Leendert M. Huisman,
Phil Nigh,
Rick Rizzolo,
Peilin Song,
Franco Motika:
Diagnosis and characterization of timing-related defects by time-dependent light emission.
ITC 1998: 733-739 |