Terumine Hayashi

2008
21	EE	Masaru Fujita, Haruhiko Takase, Hidehiko Kita, Terumine Hayashi: Shape of error surfaces in SpikeProp. IJCNN 2008: 840-844
2007
20		Kazutaka Noro, Haruhiko Takase, Hidehiko Kita, Terumine Hayashi, Naoki Morita: Descriptive Answer Clustering System for Immediate Feedback. ICCE 2007: 37-40
19	EE	Haruhiko Takase, Masahiko Masahiko, Hidehiko Kita, Terumine Hayashi: Enhancing both generalization and fault tolerance of multilayer neural networks. IJCNN 2007: 1429-1433
2005
18	EE	Tsuyoshi Shinogi, Hiroyuki Yamada, Terumine Hayashi, Shinji Tsuruoka, Tomohiro Yoshikawa: A Test Cost Reduction Method by Test Response and Test Vector Overlapping for Full-Scan Test Architecture. Asian Test Symposium 2005: 366-371
17	EE	Terumine Hayashi, Haruna Yoshioka, Tsuyoshi Shinogi, Hidehiko Kita, Haruhiko Takase: On Test Data Compression Using Selective Don't-Care Identification. J. Comput. Sci. Technol. 20(2): 210-215 (2005)
2004
16	EE	Terumine Hayashi, Haruna Yoshioka, Tsuyoshi Shinogi, Hidehiko Kita, Haruhiko Takase: Test data compression technique using selective don't-care identification. ASP-DAC 2004: 230-233
2003
15	EE	Tsuyoshi Shinogi, Yuki Yamada, Terumine Hayashi, Tomohiro Yoshikawa, Shinji Tsuruoka: Between-Core Vector Overlapping for Test Cost Reduction in Core Testing. Asian Test Symposium 2003: 268-273
2001
14	EE	Tsuyoshi Shinogi, Tomokazu Kanbayashi, Tomohiro Yoshikawa, Shinji Tsuruoka, Terumine Hayashi: Faulty Resistance Sectioning Technique for Resistive Bridging Fault ATPG Systems. Asian Test Symposium 2001: 76-81
13	EE	Junzhi Sang, Tsuyoshi Shinogi, Haruhiko Takase, Hidehiko Kita, Terumine Hayashi: An enhanced fault model for high defect coverage. Systems and Computers in Japan 32(6): 36-44 (2001)
2000
12	EE	Tsuyoshi Shinogi, Masahiro Ushio, Terumine Hayashi: Cyclic greedy generation method for limited number of IDDQ tests. Asian Test Symposium 2000: 362-
11	EE	Haruhiko Takase, Tsuyoshi Shinogi, Terumine Hayashi, Hidehiko Kita: Evaluation Function for Fault Tolerant Multi-Layer Neural Networks. IJCNN (3) 2000: 521-526
1999
10	EE	Kai Zhang, Tsuyoshi Shinogi, Haruhiko Takase, Terumine Hayashi: A Method for Evaluating Upper Bound of Simultaneous Switching Gates Using Circuit Partition. ASP-DAC 1999: 291-294
9	EE	Tsuyoshi Shinogi, Terumine Hayashi: A Parallel Generation System of Compact IDDQ Test Sets for Large Combinational Circuits. Asian Test Symposium 1999: 164-
8	EE	Tsuyoshi Shinogi, Terumine Hayashi, Kazuo Taki: Test generation for stuck-on faults in pass-transistor logic SPL and implementation of DFT circuits. Systems and Computers in Japan 30(7): 55-68 (1999)
1998
7	EE	Junzhi Sang, Tsuyoshi Shinogi, Haruhiko Takase, Terumine Hayashi: On a Logical Fault Model H1SGLF for Enhancing Defect Coverage. Asian Test Symposium 1998: 102-107
6	EE	Tsuyoshi Shinogi, Terumine Hayashi: A Simple and Efficient Method for Generating Compact IDDQ Test Set for Bridging Fault. VTS 1998: 112-117
1997
5	EE	Tsuyoshi Shinogi, Terumine Hayashi, Kazuo Taki: Test Generation for Stuck-On Faults in BDD-Based Pass-Transistor Logic SPL. Asian Test Symposium 1997: 16-21
1992
4		Kazumi Hatayama, Kazunori Hikone, Mitsuji Ikeda, Terumine Hayashi: Sequential Test Generation Based on Real-Value Logic. ITC 1992: 41-48
1991
3		Yutaka Sekiyama, Yasuyuki Fujihara, Terumine Hayashi, Mitsuho Seki, Jiro Kusuhara, Kazuhiko Iijima, Masahiro Takakura, Koji Fukatani: Timing-Oriented Routers for PCB Layout Design of High-Performance Computers. ICCAD 1991: 332-335
1989
2		Kazumi Hatayama, Mitsuji Ikeda, Terumine Hayashi, Masahiro Takakura, Kuniaki Kishida, Shun Ishiyama: Enhanced Delay Test Generator for High-Speed Logic LSIs. ITC 1989: 161-165
1986
1	EE	Kuniaki Kishida, F. Shirotori, Y. Ikemoto, Shun Ishiyama, Terumine Hayashi: A delay test system for high speed logic LSI's. DAC 1986: 786-790

Coauthor Index

1	Yasuyuki Fujihara	[3]
2	Masaru Fujita	[21]
3	Koji Fukatani	[3]
4	Kazumi Hatayama	[2] [4]
5	Kazunori Hikone	[4]
6	Kazuhiko Iijima	[3]
7	Mitsuji Ikeda	[2] [4]
8	Y. Ikemoto	[1]
9	Shun Ishiyama	[1] [2]
10	Tomokazu Kanbayashi	[14]
11	Kuniaki Kishida	[1] [2]
12	Hidehiko Kita	[11] [13] [16] [17] [19] [20] [21]
13	Jiro Kusuhara	[3]
14	Masahiko Masahiko	[19]
15	Naoki Morita	[20]
16	Kazutaka Noro	[20]
17	Junzhi Sang	[7] [13]
18	Mitsuho Seki	[3]
19	Yutaka Sekiyama	[3]
20	Tsuyoshi Shinogi	[5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18]
21	F. Shirotori	[1]
22	Masahiro Takakura	[2] [3]
23	Haruhiko Takase	[7] [10] [11] [13] [16] [17] [19] [20] [21]
24	Kazuo Taki	[5] [8]
25	Shinji Tsuruoka	[14] [15] [18]
26	Masahiro Ushio	[12]
27	Hiroyuki Yamada	[18]
28	Yuki Yamada	[15]
29	Tomohiro Yoshikawa	[14] [15] [18]
30	Haruna Yoshioka	[16] [17]
31	Kai Zhang	[10]

Colors in the list of coauthors