| 2009 |
|---|
| 119 | EE | Mainak Banga,
Michael S. Hsiao:
A Novel Sustained Vector Technique for the Detection of Hardware Trojans.
VLSI Design 2009: 327-332 |
| 2008 |
|---|
| 118 | EE | Yexin Zheng,
Michael S. Hsiao,
Chao Huang:
SAT-based equivalence checking of threshold logic designs for nanotechnologies.
ACM Great Lakes Symposium on VLSI 2008: 225-230 |
| 117 | EE | Mainak Banga,
Maheshwar Chandrasekar,
Lei Fang,
Michael S. Hsiao:
Guided test generation for isolation and detection of embedded trojans in ics.
ACM Great Lakes Symposium on VLSI 2008: 363-366 |
| 116 | EE | Lei Fang,
Michael S. Hsiao:
A Fast Approximation Algorithm for MIN-ONE SAT.
DATE 2008: 1087-1090 |
| 115 | EE | Weixin Wu,
Michael S. Hsiao:
Efficient Design Validation Based on Cultural Algorithms.
DATE 2008: 402-407 |
| 114 | EE | Xueqi Cheng,
Michael S. Hsiao:
Simulation-Directed Invariant Mining for Software Verification.
DATE 2008: 682-687 |
| 113 | EE | Mainak Banga,
Michael S. Hsiao:
A Region Based Approach for the Identification of Hardware Trojans.
HOST 2008: 40-47 |
| 112 | EE | Xueqi Cheng,
Michael S. Hsiao:
Ant Colony Optimization directed program abstraction for software bounded model checking.
ICCD 2008: 46-51 |
| 111 | EE | Shrirang M. Yardi,
Michael S. Hsiao:
Quantifying the energy efficiency of coordinated micro-architectural adaptation for multimedia workloads.
ICCD 2008: 583-590 |
| 110 | | Karthik Channakeshava,
Kaigui Bian,
Michael S. Hsiao,
Jung Min Park,
Robert E. Crossler,
France Belanger,
Payal Aggarwal,
Janine Hiller:
On Providing Automatic Parental Consent over Information Collection from Children.
Security and Management 2008: 196-202 |
| 109 | EE | Michael S. Hsiao,
Robert B. Jones:
Introduction to special section on high-level design, validation, and test.
ACM Trans. Design Autom. Electr. Syst. 13(1): (2008) |
| 108 | EE | Weixin Wu,
Michael S. Hsiao:
Mining Global Constraints With Domain Knowledge for Improving Bounded Sequential Equivalence Checking.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(1): 197-201 (2008) |
| 107 | EE | Lei Fang,
Michael S. Hsiao:
Bilateral Testing of Nano-scale Fault-Tolerant Circuits.
J. Electronic Testing 24(1-3): 285-296 (2008) |
| 106 | EE | Hong-Sik Kim,
Sungho Kang,
Michael S. Hsiao:
A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment.
J. Electronic Testing 24(4): 365-378 (2008) |
| 2007 |
|---|
| 105 | EE | Lei Fang,
Michael S. Hsiao:
A new hybrid solution to boost SAT solver performance.
DATE 2007: 1307-1313 |
| 104 | EE | Nannan He,
Michael S. Hsiao:
Bounded model checking of embedded software in wireless cognitive radio systems.
ICCD 2007: 19-24 |
| 103 | EE | Vishnu C. Vimjam,
Michael S. Hsiao:
Explicit Safety Property Strengthening in SAT-based Induction.
VLSI Design 2007: 63-68 |
| 102 | EE | Vishnu C. Vimjam,
Enamul Amyeen,
Ruifeng Guo,
Srikanth Venkataraman,
Michael S. Hsiao,
Kai Yang:
Using Scan-Dump Values to Improve Functional-Diagnosis Methodology.
VTS 2007: 231-238 |
| 101 | EE | Xiaoding Chen,
Michael S. Hsiao:
An Overlapping Scan Architecture for Reducing Both Test Time and Test Power by Pipelining Fault Detection.
IEEE Trans. VLSI Syst. 15(4): 404-412 (2007) |
| 2006 |
|---|
| 100 | EE | Vishnu C. Vimjam,
Michael S. Hsiao:
Fast illegal state identification for improving SAT-based induction.
DAC 2006: 241-246 |
| 99 | EE | Weixin Wu,
Michael S. Hsiao:
Mining global constraints for improving bounded sequential equivalence checking.
DAC 2006: 743-748 |
| 98 | EE | Lei Fang,
Michael S. Hsiao:
Bilateral Testing of Nano-scale Fault-tolerant Circuits.
DFT 2006: 309-317 |
| 97 | EE | Kameshwar Chandrasekar,
Michael S. Hsiao:
Implicit Search-Space Aware Cofactor Expansion: A Novel Preimage Computation Technique.
ICCD 2006 |
| 96 | EE | Vishnu C. Vimjam,
Michael S. Hsiao:
Efficient Fault Collapsing via Generalized Dominance Relations.
VTS 2006: 258-265 |
| 95 | EE | Qingwei Wu,
Michael S. Hsiao:
A New Simulation-Based Property Checking Algorithm Based on Partitioned Alternative Search Space Traversal.
IEEE Trans. Computers 55(11): 1325-1334 (2006) |
| 94 | EE | Xiaoding Chen,
Michael S. Hsiao:
Testing Embedded Sequential Cores in Parallel Using Spectrum-Based BIST.
IEEE Trans. Computers 55(2): 150-162 (2006) |
| 93 | EE | Qingwei Wu,
Michael S. Hsiao:
State Variable Extraction and Partitioning to Reduce Problem Complexity for ATPG and Design Validation.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(10): 2275-2282 (2006) |
| 92 | EE | Liang Zhang,
Indradeep Ghosh,
Michael S. Hsiao:
A Framework for Automatic Design Validation of RTL Circuits Using ATPG and Observability-Enhanced Tag Coverage.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(11): 2526-2538 (2006) |
| 91 | EE | Manan Syal,
Michael S. Hsiao:
New techniques for untestable fault identification in sequential circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 25(6): 1117-1131 (2006) |
| 2005 |
|---|
| 90 | EE | Vishnu C. Vimjam,
Manan Syal,
Michael S. Hsiao:
Untestable fault identification through enhanced necessary value assignments.
ACM Great Lakes Symposium on VLSI 2005: 176-181 |
| 89 | EE | Ronald P. Lajaunie,
Michael S. Hsiao:
An effective and efficient ATPG-based combinational equivalence checker.
ACM Great Lakes Symposium on VLSI 2005: 248-253 |
| 88 | EE | Kameshwar Chandrasekar,
Michael S. Hsiao:
Forward image computation with backtracing ATPG and incremental state-set construction.
ACM Great Lakes Symposium on VLSI 2005: 254-259 |
| 87 | EE | Manan Syal,
Michael S. Hsiao,
Suriyaprakash Natarajan,
Sreejit Chakravarty:
Untestable Multi-Cycle Path Delay Faults in Industrial Designs.
Asian Test Symposium 2005: 194-201 |
| 86 | EE | Liang Zhang,
Mukul R. Prasad,
Michael S. Hsiao:
Interleaved Invariant Checking with Dynamic Abstraction.
CHARME 2005: 81-96 |
| 85 | EE | Liang Zhang,
Mukul R. Prasad,
Michael S. Hsiao,
Thomas Sidle:
Dynamic abstraction using SAT-based BMC.
DAC 2005: 754-757 |
| 84 | EE | Kameshwar Chandrasekar,
Michael S. Hsiao:
Integration of Learning Techniques into Incremental Satisfiability for Efficient Path-Delay Fault Test Generation.
DATE 2005: 1002-1007 |
| 83 | EE | Shrirang M. Yardi,
Michael S. Hsiao,
Thomas L. Martin,
Dong S. Ha:
Quality-Driven Proactive Computation Elimination for Power-Aware Multimedia Processing.
DATE 2005: 340-345 |
| 82 | EE | Shrirang M. Yardi,
Karthik Channakeshava,
Michael S. Hsiao,
Thomas L. Martin,
Dong S. Ha:
A Formal Framework for Modeling and Analysis of System-Level Dynamic Power Management.
ICCD 2005: 119-126 |
| 81 | EE | Manan Syal,
Rajat Arora,
Michael S. Hsiao:
Extended Forward Implications and Dual Recurrence Relations to Identify Sequentially Untestable Faults.
ICCD 2005: 453-460 |
| 80 | EE | Kameshwar Chandrasekar,
Michael S. Hsiao:
State Set Management for SAT-based Unbounded Model Checking.
ICCD 2005: 585-590 |
| 79 | EE | Xueqi Cheng,
Michael S. Hsiao:
Region-level approximate computation reuse for power reduction in multimedia applications.
ISLPED 2005: 119-122 |
| 78 | EE | Daniel C. Nash,
Thomas L. Martin,
Dong S. Ha,
Michael S. Hsiao:
Towards an Intrusion Detection System for Battery Exhaustion Attacks on Mobile Computing Devices.
PerCom Workshops 2005: 141-145 |
| 77 | EE | Kameshwar Chandrasekar,
Michael S. Hsiao:
Q-PREZ: QBF Evaluation Using Partition, Resolution and Elimination with ZBDDs.
VLSI Design 2005: 189-194 |
| 76 | EE | Xiao Liu,
Michael S. Hsiao,
Sreejit Chakravarty,
Paul J. Thadikaran:
Efficient techniques for transition testing.
ACM Trans. Design Autom. Electr. Syst. 10(2): 258-278 (2005) |
| 75 | EE | Xiao Liu,
Michael S. Hsiao:
A Novel Transition Fault ATPG That Reduces Yield Loss.
IEEE Design & Test of Computers 22(6): 576-584 (2005) |
| 74 | EE | Anand L. D'Souza,
Michael S. Hsiao:
Error Diagnosis of Sequential Circuits Using Region-Based Model.
J. Electronic Testing 21(2): 115-126 (2005) |
| 2004 |
|---|
| 73 | EE | Bin Li,
Michael S. Hsiao,
Shuo Sheng:
A Novel SAT All-Solutions Solver for Efficient Preimage Computation.
DATE 2004: 272-279 |
| 72 | EE | Liang Zhang,
Mukul R. Prasad,
Michael S. Hsiao:
Incremental deductive & inductive reasoning for SAT-based bounded model checking.
ICCAD 2004: 502-509 |
| 71 | EE | Manan Syal,
Michael S. Hsiao,
Sreejit Chakravarty:
Identifying Untestable Transition Faults in Latch Based Designs with Multiple Clocks.
ITC 2004: 1034-1043 |
| 70 | EE | Puneet Gupta,
Michael S. Hsiao:
ALAPTF: A new Transition Faultmodel and the ATPG Algorithm.
ITC 2004: 1053-1060 |
| 69 | EE | Kameshwar Chandrasekar,
Michael S. Hsiao:
Decision Selection and Learning for an All-Solutions ATPG Engine.
ITC 2004: 607-616 |
| 68 | EE | Qingwei Wu,
Michael S. Hsiao:
State Variable Extraction to Reduce Problem Complexity for ATPG and Design Validation.
ITC 2004: 820-829 |
| 67 | EE | Thomas L. Martin,
Michael S. Hsiao,
Dong S. Ha,
Jayan Krishnaswami:
Denial-of-Service Attacks on Battery-powered Mobile Computers.
PerCom 2004: 309-318 |
| 66 | EE | Manan Syal,
Michael S. Hsiao:
Untestable Fault Identification using Recurrence Relations and Impossible Value Assignments.
VLSI Design 2004: 481-486 |
| 65 | EE | Mukul R. Prasad,
Michael S. Hsiao,
Jawahar Jain:
Can SAT be used to Improve Sequential ATPG Methods?
VLSI Design 2004: 585- |
| 64 | EE | Rajat Arora,
Michael S. Hsiao:
Enhancing SAT-based Bounded Model Checking using Sequential Logic Implications.
VLSI Design 2004: 784-787 |
| 63 | EE | Qingwei Wu,
Michael S. Hsiao:
Efficient ATPG for Design Validation Based On Partitioned State Exploration Histories.
VTS 2004: 389-405 |
| 62 | EE | Shuo Sheng,
Michael S. Hsiao:
Success-Driven Learning in ATPG for Preimage Computation.
IEEE Design & Test of Computers 21(6): 504-512 (2004) |
| 61 | EE | Rajat Arora,
Michael S. Hsiao:
Using Global Structural Relationships of Signals to Accelerate SAT-based Combinational Equivalence Checking.
J. UCS 10(12): 1597-1628 (2004) |
| 2003 |
|---|
| 60 | EE | Liang Zhang,
Michael S. Hsiao,
Indradeep Ghosh:
Automatic Design Validation Framework for HDL Descriptions via RTL ATPG.
Asian Test Symposium 2003: 148-153 |
| 59 | EE | Manan Syal,
Michael S. Hsiao:
A Novel, Low-Cost Algorithm for Sequentially Untestable Fault Identification.
DATE 2003: 10316-10321 |
| 58 | EE | Shuo Sheng,
Michael S. Hsiao:
Efficient Preimage Computation Using A Novel Success-Driven ATPG.
DATE 2003: 10822-10827 |
| 57 | EE | Xiao Liu,
Michael S. Hsiao:
Constrained ATPG for Broadside Transition Testing.
DFT 2003: 175- |
| 56 | EE | Qingwei Wu,
Michael S. Hsiao:
Efficient Sequential ATPG Based on Partitioned Finite-State-Machine Traversal.
ITC 2003: 281-289 |
| 55 | EE | Liang Zhang,
Indradeep Ghosh,
Michael S. Hsiao:
Efficient Sequential ATPG for Functional RTL Circuits.
ITC 2003: 290-298 |
| 54 | EE | Puneet Gupta,
Michael S. Hsiao:
High Quality ATPG for Delay Defects.
ITC 2003: 584-591 |
| 53 | EE | Xiaoding Chen,
Michael S. Hsiao:
Energy-Efficient Logic BIST Based on State Correlation Analysis.
VTS 2003: 267-272 |
| 52 | EE | Manan Syal,
Michael S. Hsiao,
Kiran B. Doreswamy,
Sreejit Chakravarty:
Efficient Implication - Based Untestable Bridge Fault Identifier.
VTS 2003: 393-402 |
| 51 | EE | Xiao Liu,
Michael S. Hsiao,
Sreejit Chakravarty,
Paul J. Thadikaran:
Efficient Transition Fault ATPG Algorithms Based on Stuck-At Test Vectors.
J. Electronic Testing 19(4): 437-445 (2003) |
| 2002 |
|---|
| 50 | EE | Shuo Sheng,
Koichiro Takayama,
Michael S. Hsiao:
Effective safety property checking using simulation-based sequential ATPG.
DAC 2002: 813-818 |
| 49 | EE | Michael S. Hsiao:
Maximizing Impossibilities for Untestable Fault Identification.
DATE 2002: 949-953 |
| 48 | EE | Xiaoding Chen,
Michael S. Hsiao:
Characteristic faults and spectral information for logic BIST.
ICCAD 2002: 294-298 |
| 47 | EE | Xiao Liu,
Michael S. Hsiao,
Sreejit Chakravarty,
Paul J. Thadikaran:
Techniques to Reduce Data Volume and Application Time for Transition Test.
ITC 2002: 983-992 |
| 46 | | Mukul R. Prasad,
Michael S. Hsiao,
Jawahar Jain:
Improving Sequential ATPG Using SAT Methods.
IWLS 2002: 79-84 |
| 45 | EE | Yufeng Zhao,
Michael S. Hsiao:
Reducing Power Consumption by Utilizing Retransmission in Short Range Wireless Network.
LCN 2002: 527-533 |
| 44 | EE | Phillip Stanley-Marbell,
Michael S. Hsiao,
Ulrich Kremer:
A Hardware Architecture for Dynamic Performance and Energy Adaptation.
PACS 2002: 33-52 |
| 43 | EE | Ganapathy Kasturirangan,
Michael S. Hsiao:
Spectrum-Based BIST in Complex SOCs.
VTS 2002: 111-116 |
| 42 | EE | Shuo Sheng,
Michael S. Hsiao:
Efficient Sequential Test Generation Based on Logic Simulation.
IEEE Design & Test of Computers 19(5): 56-64 (2002) |
| 41 | EE | Ashish Giani,
Shuo Sheng,
Michael S. Hsiao,
Vishwani D. Agrawal:
State and Fault Information for Compaction-Based Test Generation.
J. Electronic Testing 18(1): 63-72 (2002) |
| 40 | EE | Sandhya Seshadri,
Michael S. Hsiao:
Behavioral-Level DFT via Formal Operator Testability Measures.
J. Electronic Testing 18(6): 595-611 (2002) |
| 2001 |
|---|
| 39 | EE | Ashish Giani,
Shuo Sheng,
Michael S. Hsiao,
Vishwani D. Agrawal:
Efficient spectral techniques for sequential ATPG.
DATE 2001: 204-208 |
| 38 | EE | Phillip Stanley-Marbell,
Michael S. Hsiao:
Fast, flexible, cycle-accurate energy estimation.
ISLPED 2001: 141-146 |
| 37 | EE | Chung-Hsing Hsu,
Ulrich Kremer,
Michael S. Hsiao:
Compiler-directed dynamic voltage/frequency scheduling for energy reduction in mircoprocessors.
ISLPED 2001: 275-278 |
| 36 | | Nandini Sridhar,
Michael S. Hsiao:
On efficient error diagnosis of digital circuits.
ITC 2001: 678-687 |
| 35 | EE | Anand L. D'Souza,
Michael S. Hsiao:
Error Diagnosis of Sequential Circuits Using Region-Based Mode.
VLSI Design 2001: 103- |
| 34 | EE | Sameer Sharma,
Michael S. Hsiao:
Combination of Structural and State Analysis for Partial Scan.
VLSI Design 2001: 134- |
| 33 | EE | Nachiketh R. Potlapally,
Michael S. Hsiao,
Anand Raghunathan,
Ganesh Lakshminarayana,
Srimat T. Chakradhar:
Accurate Power Macro-modeling Techniques for Complex RTL Circuits.
VLSI Design 2001: 235-241 |
| 32 | EE | Ashish Giani,
Shuo Sheng,
Michael S. Hsiao,
Vishwani D. Agrawal:
Novel Spectral Methods for Built-In Self-Test in a System-on-a-Chip Environment.
VTS 2001: 163-168 |
| 31 | | Matthew Arnold,
Michael S. Hsiao,
Ulrich Kremer,
Barbara G. Ryder:
Exploring the Interaction between Java?s Implicitly Thrown Exceptions and Instruction Scheduling.
International Journal of Parallel Programming 29(2): 111-137 (2001) |
| 2000 |
|---|
| 30 | EE | Ashish Giani,
Shuo Sheng,
Michael S. Hsiao,
Vishwani D. Agrawal:
Compaction-based test generation using state and fault information.
Asian Test Symposium 2000: 159-164 |
| 29 | EE | Ruofan Xu,
Michael S. Hsiao:
Embedded core testing using genetic algorithms.
Asian Test Symposium 2000: 254-259 |
| 28 | EE | Kabir Gulrajani,
Michael S. Hsiao:
Multi-Node Static Logic Implications for Redundancy Identification.
DATE 2000: 729- |
| 27 | EE | Chung-Hsing Hsu,
Ulrich Kremer,
Michael S. Hsiao:
Compiler-Directed Dynamic Frequency and Voltage Scheduling.
PACS 2000: 65-81 |
| 26 | EE | Ankur Jain,
Vamsi Boppana,
Rajarshi Mukherjee,
Jawahar Jain,
Masahiro Fujita,
Michael S. Hsiao:
Testing, Verification, and Diagnosis in the Presence of Unknowns.
VTS 2000: 263-270 |
| 25 | EE | Michael S. Hsiao,
Elizabeth M. Rudnick,
Janak H. Patel:
Dynamic state traversal for sequential circuit test generation.
ACM Trans. Design Autom. Electr. Syst. 5(3): 548-565 (2000) |
| 24 | EE | Michael S. Hsiao,
Elizabeth M. Rudnick,
Janak H. Patel:
Peak power estimation of VLSI circuits: new peak power measures.
IEEE Trans. VLSI Syst. 8(4): 435-439 (2000) |
| 23 | EE | Sandhya Seshadri,
Michael S. Hsiao:
Formal Value-Range and Variable Testability Techniques for High-Level Design-For-Testability.
J. Electronic Testing 16(1-2): 131-145 (2000) |
| 22 | EE | Michael S. Hsiao,
Srimat T. Chakradhar:
Test Set Compaction Using Relaxed Subsequence Removal.
J. Electronic Testing 16(4): 319-327 (2000) |
| 21 | EE | Michael S. Hsiao,
Srimat T. Chakradhar:
Test Set and Fault Partitioning Techniques for Static Test Sequence Compaction for Sequential Circuits.
J. Electronic Testing 16(4): 329-338 (2000) |
| 1999 |
|---|
| 20 | EE | Michael S. Hsiao:
Peak Power Estimation Using Genetic Spot Optimization for Large VLSI Circuits.
DATE 1999: 175- |
| 19 | | Sandhya Seshadri,
Michael S. Hsiao:
An integrated approach to behavioral-level design-for-testability using value-range and variable testability techniques.
ITC 1999: 858-867 |
| 18 | EE | Matthew Arnold,
Michael S. Hsiao,
Ulrich Kremer,
Barbara G. Ryder:
Instruction Scheduling in the Presence of Java's Runtime Exceptions.
LCPC 1999: 18-34 |
| 17 | EE | Sameer Sharma,
Michael S. Hsiao:
Partial Scan Using Multi-Hop State Reachability Analysis.
VTS 1999: 121-127 |
| 16 | EE | Ankur Jain,
Michael S. Hsiao,
Vamsi Boppana,
Masahiro Fujita:
On the Evaluation of Arbitrary Defect Coverage of Test Sets.
VTS 1999: 426-432 |
| 15 | | Michael S. Hsiao,
Elizabeth M. Rudnick,
Janak H. Patel:
Fast Static Compaction Algorithms for Sequential Circuit Test Vectors.
IEEE Trans. Computers 48(3): 311-322 (1999) |
| 14 | EE | Michael S. Hsiao:
On Non-Statistical Techniques for Fast Fault Coverage Estimation.
J. Electronic Testing 15(3): 239-254 (1999) |
| 1998 |
|---|
| 13 | EE | Michael S. Hsiao,
Srimat T. Chakradhar:
Partitioning and Reordering Techniques for Static Test Sequence Compaction of Sequential Circuits.
Asian Test Symposium 1998: 452-457 |
| 12 | EE | Michael S. Hsiao,
Srimat T. Chakradhar:
State Relaxation Based Subsequence Removal for Fast Static Compaction in Sequential Circuits.
DATE 1998: 577-582 |
| 11 | EE | Michael S. Hsiao:
A fast, accurate, and non-statistical method for fault coverage estimation.
ICCAD 1998: 155-161 |
| 10 | EE | Michael S. Hsiao,
Gurjeet S. Saund,
Elizabeth M. Rudnick,
Janak H. Patel:
Partial Scan Selection Based on Dynamic Reachability and Observability Information.
VLSI Design 1998: 174-180 |
| 9 | EE | Michael S. Hsiao,
Elizabeth M. Rudnick,
Janak H. Patel:
Application of genetically engineered finite-state-machine sequences to sequential circuit ATPG.
IEEE Trans. on CAD of Integrated Circuits and Systems 17(3): 239-254 (1998) |
| 1997 |
|---|
| 8 | EE | Michael S. Hsiao,
Elizabeth M. Rudnick,
Janak H. Patel:
Sequential circuit test generation using dynamic state traversal.
ED&TC 1997: 22-28 |
| 7 | | Gurjeet S. Saund,
Michael S. Hsiao,
Janak H. Patel:
Partial Scan beyond Cycle Cutting.
FTCS 1997: 320-328 |
| 6 | EE | Michael S. Hsiao,
Elizabeth M. Rudnick,
Janak H. Patel:
Effects of delay models on peak power estimation of VLSI sequential circuits.
ICCAD 1997: 45-51 |
| 5 | EE | Michael S. Hsiao,
Elizabeth M. Rudnick,
Janak H. Patel:
K2: an estimator for peak sustainable power of VLSI circuits.
ISLPED 1997: 178-183 |
| 4 | EE | Dilip Krishnaswamy,
Michael S. Hsiao,
Vikram Saxena,
Elizabeth M. Rudnick,
Janak H. Patel,
Prithviraj Banerjee:
Parallel Genetic Algorithms for Simulation-Based Sequential Circuit Test Generation.
VLSI Design 1997: 475-481 |
| 3 | EE | Michael S. Hsiao,
Elizabeth M. Rudnick,
Janak H. Patel:
Fast Algorithms for Static Compaction of Sequential Circuit Test Vectors.
VTS 1997: 188-195 |
| 1996 |
|---|
| 2 | EE | Michael S. Hsiao,
Elizabeth M. Rudnick,
Janak H. Patel:
Automatic test generation using genetically-engineered distinguishing sequences.
VTS 1996: 216-223 |
| 1995 |
|---|
| 1 | EE | Michael S. Hsiao,
Janak H. Patel:
A new architectural-level fault simulation using propagation prediction of grouped fault-effects.
ICCD 1995: 628- |
