Masahiro Ushio
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2000
1
EE
Tsuyoshi Shinogi
, Masahiro Ushio,
Terumine Hayashi
: Cyclic greedy generation method for limited number of IDDQ tests.
Asian Test Symposium 2000
: 362-
Coauthor
Index
1
Terumine Hayashi
[
1
]
2
Tsuyoshi Shinogi
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
