Michael R. Grimaila

2009
14	EE	David W. Marsh, Rusty O. Baldwin, Barry E. Mullins, Robert F. Mills, Michael R. Grimaila: A security policy language for wireless sensor networks. Journal of Systems and Software 82(1): 101-111 (2009)
2008
13	EE	John W. Carls, Richard A. Raines, Michael R. Grimaila, Steven K. Rogers: Biometric enhancements: Template aging error score analysis. FG 2008: 1-8
12	EE	Douglas J. Kelly, Richard A. Raines, Michael R. Grimaila, Rusty O. Baldwin, Barry E. Mullins: A survey of state-of-the-art in anonymity metrics. NDA 2008: 31-40
2007
11	EE	Kenneth S. Edge, Richard A. Raines, Michael R. Grimaila, Rusty O. Baldwin, Robert Bennington, Christopher Reuter: The Use of Attack and Protection Trees to Analyze Security for an Online Banking System. HICSS 2007: 144
10	EE	Victor P. Hubenko Jr., Richard A. Raines, Rusty O. Baldwin, Barry E. Mullins, Robert F. Mills, Michael R. Grimaila: Improving Satellite Multicast Security Scalability by Reducing Rekeying Requirements. IEEE Network 21(4): 51-56 (2007)
2005
9	EE	Evan E. Anderson, Joobin Choobineh, Michael R. Grimaila: An Enterprise Level Security Requirements Specification Model. HICSS 2005
2004
8	EE	Michael R. Grimaila: Maximizing Business Information Security's Educational Value. IEEE Security & Privacy 2(1): 56-60 (2004)
2003
7	EE	Yuxin Tian, Michael R. Grimaila, Weiping Shi, M. Ray Mercer: Minimizing Defective Part Level Using a Linear Programming-Based Optimal Test Selection Method. Asian Test Symposium 2003: 354-359
2002
6	EE	Sooryong Lee, Brad Cobb, Jennifer Dworak, Michael R. Grimaila, M. Ray Mercer: A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults. DATE 2002: 94-101
2001
5	EE	Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang: Defect-Oriented Testing and Defective-Part-Level Prediction. IEEE Design & Test of Computers 18(1): 31-41 (2001)
2000
4	EE	Jennifer Dworak, Michael R. Grimaila, Brad Cobb, Ting-Chi Wang, Li-C. Wang, M. Ray Mercer: On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction. Asian Test Symposium 2000: 151-
3		Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer: Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D. ITC 2000: 930-939
1999
2		Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer: Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies. ITC 1999: 1031-1037
1	EE	Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer: REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. VTS 1999: 268-274

Coauthor Index

1	Evan E. Anderson	[9]
2	Hari Balachandran	[1]
3	Rusty O. Baldwin	[10] [11] [12] [14]
4	Robert Bennington	[11]
5	Kenneth M. Butler	[1] [5]
6	John W. Carls	[13]
7	Joobin Choobineh	[9]
8	Brad Cobb	[4] [6]
9	Jennifer Dworak	[1] [2] [3] [4] [5] [6]
10	Kenneth S. Edge	[11]
11	Bryan Houchins	[1]
12	Victor P. Hubenko Jr.	[10]
13	Douglas J. Kelly	[12]
14	Sooryong Lee	[1] [2] [3] [5] [6]
15	David W. Marsh	[14]
16	Vineet Mathur	[1]
17	M. Ray Mercer	[1] [2] [3] [4] [5] [6] [7]
18	Robert F. Mills	[10] [14]
19	Barry E. Mullins	[10] [12] [14]
20	Jaehong Park	[1]
21	Richard A. Raines	[10] [11] [12] [13]
22	Christopher Reuter	[11]
23	Steven K. Rogers	[13]
24	Weiping Shi	[7]
25	Bret Stewart	[1] [5]
26	Yuxin Tian	[7]
27	Li-C. Wang	[1] [2] [3] [4] [5]
28	Ting-Chi Wang	[4]
29	Jason D. Wicker	[5]

Colors in the list of coauthors