| 2005 |
|---|
| 5 | EE | Hiroyuki Yotsuyanagi,
Toshimasa Kuchii,
Shigeki Nishikawa,
Masaki Hashizume,
Kozo Kinoshita:
Reducing Scan Shifts Using Configurations of Compatible and Folding Scan Trees.
J. Electronic Testing 21(6): 613-620 (2005) |
| 2004 |
|---|
| 4 | EE | Hiroyuki Yotsuyanagi,
Toshimasa Kuchii,
Shigeki Nishikawa,
Masaki Hashizume,
Kozo Kinoshita:
On Configuring Scan Trees to Reduce Scan Shifts based on a Circuit Structure.
DELTA 2004: 269-274 |
| 2003 |
|---|
| 3 | EE | Hiroyuki Yotsuyanagi,
Toshimasa Kuchii,
Shigeki Nishikawa,
Masaki Hashizume,
Kozo Kinoshita:
Reducing Scan Shifts Using Folding Scan Trees.
Asian Test Symposium 2003: 6-11 |
| 2 | EE | Hideyuki Ichihara,
Kozo Kinoshita,
Koji Isodono,
Shigeki Nishikawa:
Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs.
VLSI Design 2003: 329-334 |
| 2000 |
|---|
| 1 | EE | Yann Antonioli,
Tsuneo Inufushi,
Shigeki Nishikawa,
Kozo Kinoshita:
A high-speed IDDQ sensor implementation.
Asian Test Symposium 2000: 356-361 |
