Minoru Izutsu

2000
1	EE	Toshimitsu Masuzawa, Minoru Izutsu, Hiroki Wada, Hideo Fujiwara: Single-control testability of RTL data paths for BIST. Asian Test Symposium 2000: 210-215

Coauthor Index

1	Hideo Fujiwara	[1]
2	Toshimitsu Masuzawa	[1]
3	Hiroki Wada	[1]