| |
| 2000 | ||
|---|---|---|
| 2 | EE | Masaki Hashizume, Hiroyuki Yotsuyanagi, Masahiro Ichimiya, Takeomi Tamesada, Masashi Takeda: High speed IDDQ test and its testability for process variation. Asian Test Symposium 2000: 344-349 |
| 1 | EE | Masaki Hashizume, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Masashi Takeda: Testability Analysis of IDDQ Testing with Large Threshold Value. DFT 2000: 367-375 |
| 1 | Masaki Hashizume | [1] [2] |
| 2 | Masahiro Ichimiya | [2] |
| 3 | Takeomi Tamesada | [1] [2] |
| 4 | Hiroyuki Yotsuyanagi | [1] [2] |