| 2009 |
|---|
| 232 | | Fabrizio Lombardi,
Sanjukta Bhanja,
Yehia Massoud,
R. Iris Bahar:
Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, Boston Area, MA, USA, May 10-12 2009
ACM 2009 |
| 231 | EE | Masaru Fukushi,
Susumu Horiguchi,
Luke Demoracski,
Fabrizio Lombardi:
An Efficient Framework for Scalable Defect Isolation in Large Scale Networks of DNA Self-Assembly.
J. Electronic Testing 25(1): 11-23 (2009) |
| 230 | EE | Masoud Hashempour,
Zahra Mashreghian Arani,
Fabrizio Lombardi:
Healing DNA Self-Assemblies Using Punctures.
J. Electronic Testing 25(1): 25-37 (2009) |
| 229 | EE | Xiaojun Ma,
Jing Huang,
Cecilia Metra,
Fabrizio Lombardi:
Detecting Multiple Faults in One-Dimensional Arrays of Reversible QCA Gates.
J. Electronic Testing 25(1): 39-54 (2009) |
| 228 | EE | Faizal Karim,
Marco Ottavi,
Hamidreza Hashempour,
Vamsi Vankamamidi,
Konrad Walus,
André Ivanov,
Fabrizio Lombardi:
Modeling and Evaluating Errors Due to Random Clock Shifts in Quantum-Dot Cellular Automata Circuits.
J. Electronic Testing 25(1): 55-66 (2009) |
| 2008 |
|---|
| 227 | EE | Sheng Lin,
Yong-Bin Kim,
Fabrizio Lombardi:
A low leakage 9t sram cell for ultra-low power operation.
ACM Great Lakes Symposium on VLSI 2008: 123-126 |
| 226 | EE | Vamsi Vankamamidi,
Fabrizio Lombardi:
Design of defect tolerant tile-based QCA circuits.
ACM Great Lakes Symposium on VLSI 2008: 237-242 |
| 225 | EE | Stephen Frechette,
Fabrizio Lombardi:
Error Detection/Correction in DNA Algorithmic Self-Assembly.
DATE 2008: 1079-1082 |
| 224 | EE | Xiaojun Ma,
Fabrizio Lombardi:
Fault Tolerant Schemes for QCA Systems.
DFT 2008: 236-244 |
| 223 | EE | Masoud Hashempour,
Zahra Mashreghian Arani,
Fabrizio Lombardi:
A Tile-Based Error Model for Forward Growth of DNA Self-Assembly.
DFT 2008: 516-524 |
| 222 | EE | Stephen Frechette,
Yong-Bin Kim,
Fabrizio Lombardi:
Checkpointing of Rectilinear Growth in DNA Self-Assembly.
DFT 2008: 525-533 |
| 221 | EE | Young Bok Kim,
Yong-Bin Kim,
Fabrizio Lombardi:
Low power 8T SRAM using 32nm independent gate FinFET technology.
SoCC 2008: 247-250 |
| 220 | EE | Masoud Hashempour,
Zahra Mashreghian Arani,
Fabrizio Lombardi:
A Metric for Assessing the Error Tolerance of Tile Sets for Punctured DNA Self-Assemblies.
VTS 2008: 275-282 |
| 219 | EE | Hamidreza Hashempour,
Fabrizio Lombardi:
Device Model for Ballistic CNFETs Using the First Conducting Band.
IEEE Design & Test of Computers 25(2): 178-186 (2008) |
| 218 | EE | Fabrizio Lombardi:
State of the Journal.
IEEE Trans. Computers 57(1): 1-6 (2008) |
| 217 | EE | Mohammad Hosseinabady,
Shervin Sharifi,
Fabrizio Lombardi,
Zainalabedin Navabi:
A Selective Trigger Scan Architecture for VLSI Testing.
IEEE Trans. Computers 57(3): 316-328 (2008) |
| 216 | EE | Vamsi Vankamamidi,
Marco Ottavi,
Fabrizio Lombardi:
A Serial Memory by Quantum-Dot Cellular Automata (QCA).
IEEE Trans. Computers 57(5): 606-618 (2008) |
| 215 | EE | Kyung Ki Kim,
Jing Huang,
Yong-Bin Kim,
Fabrizio Lombardi:
Analysis and Simulation of Jitter Sequences for Testing Serial Data Channels.
IEEE Trans. Industrial Informatics 4(2): 134-143 (2008) |
| 214 | EE | Vamsi Vankamamidi,
Marco Ottavi,
Fabrizio Lombardi:
Two-Dimensional Schemes for Clocking/Timing of QCA Circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(1): 34-44 (2008) |
| 213 | EE | Xiaojun Ma,
Fabrizio Lombardi:
Synthesis of Tile Sets for DNA Self-Assembly.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(5): 963-967 (2008) |
| 212 | EE | Salvatore Pontarelli,
Marco Ottavi,
Vamsi Vankamamidi,
Gian-Carlo Cardarilli,
Fabrizio Lombardi,
Adelio Salsano:
Analysis and Evaluations of Reliability of Reconfigurable FPGAs.
J. Electronic Testing 24(1-3): 105-116 (2008) |
| 211 | EE | Xiaojun Ma,
Fabrizio Lombardi:
Substrate Testing on a Multi-Site/Multi-Probe ATE.
J. Electronic Testing 24(1-3): 193-201 (2008) |
| 210 | EE | Byunghyun Jang,
Yong-Bin Kim,
Fabrizio Lombardi:
Monomer Control for Error Tolerance in DNA Self-Assembly.
J. Electronic Testing 24(1-3): 271-284 (2008) |
| 209 | EE | Xiaojun Ma,
Jing Huang,
Cecilia Metra,
Fabrizio Lombardi:
Reversible Gates and Testability of One Dimensional Arrays of Molecular QCA.
J. Electronic Testing 24(1-3): 297-311 (2008) |
| 208 | EE | Xiaojun Ma,
Jing Huang,
Fabrizio Lombardi:
A model for computing and energy dissipation of molecular QCA devices and circuits.
JETC 3(4): (2008) |
| 2007 |
|---|
| 207 | EE | Naghmeh Karimi,
Shahrzad Mirkhani,
Zainalabedin Navabi,
Fabrizio Lombardi:
RT level reliability enhancement by constructing dynamic TMRS.
ACM Great Lakes Symposium on VLSI 2007: 172-175 |
| 206 | EE | Hamidreza Hashempour,
Fabrizio Lombardi:
Circuit-level modeling and detection of metallic carbon nanotube defects in carbon nanotube FETs.
DATE 2007: 841-846 |
| 205 | EE | Masaru Fukushi,
Susumu Horiguchi,
Luke Demoracski,
Fabrizio Lombardi:
A Scalable Framework for Defect Isolation of DNA Self-assemlbled Networks.
DFT 2007: 391-399 |
| 204 | EE | Masoud Hashempour,
Zahra Mashreghian Arani,
Fabrizio Lombardi:
Error Tolerance of DNA Self-Healing Assemblies by Puncturing.
DFT 2007: 400-408 |
| 203 | EE | Jing Huang,
Xiaojun Ma,
Cecilia Metra,
Fabrizio Lombardi:
Testing Reversible One-Dimensional QCA Arrays for Multiple Faults.
DFT 2007: 469-477 |
| 202 | EE | Xiaojun Ma,
Jing Huang,
Fabrizio Lombardi:
Error Tolerance in DNA Self-Assembly by (2k-1) x (2k-1) Snake Tile Sets.
VTS 2007: 131-140 |
| 201 | EE | Luca Schiano,
Marco Ottavi,
Fabrizio Lombardi,
Salvatore Pontarelli,
Adelio Salsano:
On the Analysis of Reed Solomon Coding for Resilience to Transient/Permanent Faults in Highly Reliable Memories
CoRR abs/0710.4750: (2007) |
| 200 | EE | Fabrizio Lombardi,
Cecilia Metra:
Guest Editors' Introduction: The State of the Art in Nanoscale CAD.
IEEE Design & Test of Computers 24(4): 302-303 (2007) |
| 199 | EE | Jing Huang,
Mariam Momenzadeh,
Fabrizio Lombardi:
An Overview of Nanoscale Devices and Circuits.
IEEE Design & Test of Computers 24(4): 304-311 (2007) |
| 198 | EE | André DeHon,
Craig S. Lent,
Fabrizio Lombardi:
Introduction to the Special Section on Nano Systems and Computing.
IEEE Trans. Computers 56(2): 145-146 (2007) |
| 197 | EE | Fabrizio Lombardi:
Editor's Note.
IEEE Trans. Computers 56(6): 721-726 (2007) |
| 196 | EE | Jing Huang,
Mariam Momenzadeh,
Fabrizio Lombardi:
Analysis of missing and additional cell defects in sequential quantum-dot cellular automata.
Integration 40(4): 503-515 (2007) |
| 195 | EE | Jing Huang,
Mariam Momenzadeh,
Fabrizio Lombardi:
On the Tolerance to Manufacturing Defects in Molecular QCA Tiles for Processing-by-wire.
J. Electronic Testing 23(2-3): 163-174 (2007) |
| 194 | EE | Sanjukta Bhanja,
Marco Ottavi,
Fabrizio Lombardi,
Salvatore Pontarelli:
QCA Circuits for Robust Coplanar Crossing.
J. Electronic Testing 23(2-3): 193-210 (2007) |
| 193 | EE | Jing Huang,
Mariam Momenzadeh,
Fabrizio Lombardi:
Design of sequential circuits by quantum-dot cellular automata.
Microelectronics Journal 38(4-5): 525-537 (2007) |
| 2006 |
|---|
| 192 | EE | Jing Huang,
Mariam Momenzadeh,
Fabrizio Lombardi:
Defect tolerance of QCA tiles.
DATE 2006: 774-779 |
| 191 | EE | Sanjukta Bhanja,
Marco Ottavi,
Fabrizio Lombardi,
Salvatore Pontarelli:
Novel designs for thermally robust coplanar crossing in QCA.
DATE 2006: 786-791 |
| 190 | EE | Hamidreza Hashempour,
Fabrizio Lombardi:
A Novel Methodology for Functional Test Data Compression.
DFT 2006: 128-135 |
| 189 | EE | Salvatore Pontarelli,
Marco Ottavi,
Vamsi Vankamamidi,
Adelio Salsano,
Fabrizio Lombardi:
Reliability Evaluation of Repairable/Reconfigurable FPGAs.
DFT 2006: 227-235 |
| 188 | EE | Fengming Zhang,
Warren Necoechea,
Peter Reiter,
Yong-Bin Kim,
Fabrizio Lombardi:
Load Board Designs Using Compound Dot Technique and Phase Detector for Hierarchical ATE Calibrations.
DFT 2006: 486-494 |
| 187 | EE | Xiaojun Ma,
Fabrizio Lombardi:
Multi-Site and Multi-Probe Substrate Testing on an ATE.
DFT 2006: 495-506 |
| 186 | EE | Xiaojun Ma,
Jing Huang,
Cecilia Metra,
Fabrizio Lombardi:
Testing Reversible 1D Arrays for Molecular QCA.
DFT 2006: 71-79 |
| 185 | EE | Byunghyun Jang,
Yong-Bin Kim,
Fabrizio Lombardi:
Error Tolerance of DNA Self-Assembly by Monomer Concentration Control.
DFT 2006: 89-97 |
| 184 | EE | Viktor K. Prasanna,
Fabrizio Lombardi:
Editors' Note.
IEEE Trans. Computers 55(1): 1 (2006) |
| 183 | EE | Jien-Chung Lo,
Cecilia Metra,
Fabrizio Lombardi:
Guest Editors' Introduction: Special Section on Design and Test of Systems-on-Chip (SoC).
IEEE Trans. Computers 55(2): 97-98 (2006) |
| 182 | EE | Marco Ottavi,
Luca Schiano,
Fabrizio Lombardi,
Douglas Tougaw:
HDLQ: A HDL environment for QCA design.
JETC 2(4): 243-261 (2006) |
| 2005 |
|---|
| 181 | EE | Hamidreza Hashempour,
Fabrizio Lombardi:
Two dimensional reordering of functional test data for compression by ATE.
ACM Great Lakes Symposium on VLSI 2005: 188-192 |
| 180 | EE | Vamsi Vankamamidi,
Marco Ottavi,
Fabrizio Lombardi:
Tile-based design of a serial memory in QCA.
ACM Great Lakes Symposium on VLSI 2005: 201-206 |
| 179 | EE | Hamidreza Hashempour,
Luca Schiano,
Fabrizio Lombardi:
Enhancing error resilience for reliable compression of VLSI test data.
ACM Great Lakes Symposium on VLSI 2005: 371-376 |
| 178 | EE | Hamidreza Hashempour,
Luca Schiano,
Fabrizio Lombardi:
Evaluation of Error-Resilience for Reliable Compression of Test Data.
DATE 2005: 1284-1289 |
| 177 | EE | Luca Schiano,
Marco Ottavi,
Fabrizio Lombardi,
Salvatore Pontarelli,
Adelio Salsano:
On the Analysis of Reed Solomon Coding for Resilience to Transient/Permanent Faults in Highly Reliable Memories.
DATE 2005: 580-585 |
| 176 | EE | Mariam Momenzadeh,
Jing Huang,
Fabrizio Lombardi:
Defect Characterization and Tolerance of QCA Sequential Devices and Circuits.
DFT 2005: 199-207 |
| 175 | EE | Mariam Momenzadeh,
Marco Ottavi,
Fabrizio Lombardi:
Modeling QCA Defects at Molecular-level in Combinational Circuits.
DFT 2005: 208-216 |
| 174 | EE | Kyung Ki Kim,
Jing Huang,
Yong-Bin Kim,
Fabrizio Lombardi:
On the Modeling and Analysis of Jitter in ATE Using Matlab.
DFT 2005: 285-293 |
| 173 | EE | Kyung Ki Kim,
Yong-Bin Kim,
Fabrizio Lombardi:
Data Dependent Jitter (DDJ) Characterization Methodology.
DFT 2005: 294-304 |
| 172 | EE | Pedram A. Riahi,
Zainalabedin Navabi,
Fabrizio Lombardi:
Simulating Faults of Combinational IP Core-based SOCs in a PLI Environment.
DFT 2005: 389-397 |
| 171 | EE | Marco Ottavi,
Luca Schiano,
Fabrizio Lombardi,
Salvatore Pontarelli,
Gian-Carlo Cardarilli:
Evaluating the Data Integrity of Memory Systems by Configurable Markov Models.
ISVLSI 2005: 257-259 |
| 170 | EE | Marco Ottavi,
Vamsi Vankamamidi,
Fabrizio Lombardi,
Salvatore Pontarelli,
Adelio Salsano:
Design of a QCA Memory with Parallel Read/Serial Write.
ISVLSI 2005: 292-294 |
| 169 | EE | R. Iris Bahar,
Mehdi Baradaran Tahoori,
Sandeep K. Shukla,
Fabrizio Lombardi:
Guest Editors' Introduction: Challenges for Reliable Design at the Nanoscale.
IEEE Design & Test of Computers 22(4): 295-297 (2005) |
| 168 | EE | Viktor K. Prasanna,
Fabrizio Lombardi:
Editor's Note.
IEEE Trans. Computers 54(2): 97- (2005) |
| 167 | EE | Hamidreza Hashempour,
Fabrizio Lombardi:
Application of Arithmetic Coding to Compression of VLSI Test Data.
IEEE Trans. Computers 54(9): 1166-1177 (2005) |
| 166 | EE | Jing Huang,
Mehdi Baradaran Tahoori,
Fabrizio Lombardi:
Fault Tolerance of Switch Blocks and Switch Block Arrays in FPGA.
IEEE Trans. VLSI Syst. 13(7): 794-807 (2005) |
| 165 | EE | Mariam Momenzadeh,
Jing Huang,
Mehdi Baradaran Tahoori,
Fabrizio Lombardi:
Characterization, test, and logic synthesis of and-or-inverter (AOI) gate design for QCA implementation.
IEEE Trans. on CAD of Integrated Circuits and Systems 24(12): 1881-1893 (2005) |
| 164 | EE | Jing Huang,
Mehdi Baradaran Tahoori,
Fabrizio Lombardi:
A probabilistic analysis of fault tolerance for switch block array in FPGAs.
IJES 1(3/4): 250-262 (2005) |
| 163 | EE | Gian-Carlo Cardarilli,
Fabrizio Lombardi,
Marco Ottavi,
Salvatore Pontarelli,
Marco Re,
Adelio Salsano:
A Comparative Evaluation of Designs for Reliable Memory Systems.
J. Electronic Testing 21(4): 429-444 (2005) |
| 162 | EE | Jing Huang,
Mariam Momenzadeh,
Luca Schiano,
Marco Ottavi,
Fabrizio Lombardi:
Tile-based QCA design using majority-like logic primitives.
JETC 1(3): 163-185 (2005) |
| 2004 |
|---|
| 161 | EE | Marco Ottavi,
Xiaopeng Wang,
Fred J. Meyer,
Fabrizio Lombardi:
Simulation of reconfigurable memory core yield.
ACM Great Lakes Symposium on VLSI 2004: 136-140 |
| 160 | EE | Jing Huang,
Mariam Momenzadeh,
Mehdi Baradaran Tahoori,
Fabrizio Lombardi:
Design and characterization of an and-or-inverter (AOI) gate for QCA implementation.
ACM Great Lakes Symposium on VLSI 2004: 426-429 |
| 159 | EE | Hamidreza Hashempour,
Fabrizio Lombardi:
Evaluation of heuristic techniques for test vector ordering.
ACM Great Lakes Symposium on VLSI 2004: 96-99 |
| 158 | EE | T. Feng,
Byoungjae Jin,
J. Wang,
Nohpill Park,
Yong-Bin Kim,
Fabrizio Lombardi:
Fault tolerant clockless wave pipeline design.
Conf. Computing Frontiers 2004: 350-356 |
| 157 | EE | Jing Huang,
Mehdi Baradaran Tahoori,
Fabrizio Lombardi:
Fault Tolerance of Programmable Switch Blocks.
DATE 2004: 1358-1359 |
| 156 | EE | Mehdi Baradaran Tahoori,
Fabrizio Lombardi:
Testing of Quantum Dot Cellular Automata Based Designs.
DATE 2004: 1408-1409 |
| 155 | EE | Luca Schiano,
Yong-Bin Kim,
Fabrizio Lombardi:
Scan Test of IP Cores in an ATE Environment.
DELTA 2004: 281-286 |
| 154 | EE | Xiaopeng Wang,
Marco Ottavi,
Fred J. Meyer,
Fabrizio Lombardi:
On The Yield of Compiler-Based eSRAMs.
DFT 2004: 11-19 |
| 153 | EE | Xiaopeng Wang,
Marco Ottavi,
Fabrizio Lombardi:
Testing of Inter-Word Coupling Faults in Word-Oriented SRAMs.
DFT 2004: 111-119 |
| 152 | EE | Hamidreza Hashempour,
Fabrizio Lombardi:
Compression of VLSI Test Data by Arithmetic Coding.
DFT 2004: 150-157 |
| 151 | EE | Jing Huang,
Mariam Momenzadeh,
Mehdi Baradaran Tahoori,
Fabrizio Lombardi:
Defect Characterization for Scaling of QCA Devices.
DFT 2004: 30-38 |
| 150 | EE | Hamidreza Hashempour,
Luca Schiano,
Fabrizio Lombardi:
Error-Resilient Test Data Compression Using Tunstall Codes.
DFT 2004: 316-323 |
| 149 | EE | T. Feng,
Nohpill Park,
Yong-Bin Kim,
Fabrizio Lombardi,
Fred J. Meyer:
Reliability Modeling and Assurance of Clockless Wave Pipeline.
DFT 2004: 442-450 |
| 148 | EE | Shanrui Zhang,
Minsu Choi,
Nohpill Park,
Fabrizio Lombardi:
Probabilistic Balancing of Fault Coverage and Test Cost in Combined Built-In Self-Test/Automated Test Equipment Testing Environment.
DFT 2004: 48-56 |
| 147 | EE | Jing Huang,
Mehdi Baradaran Tahoori,
Fabrizio Lombardi:
On the Defect Tolerance of Nano-Scale Two-Dimensional Crossbars.
DFT 2004: 96-104 |
| 146 | EE | Jing Huang,
Mehdi Baradaran Tahoori,
Fabrizio Lombardi:
Probabilistic Analysis of Fault Tolerance of FPGA Switch Block Array.
IPDPS 2004 |
| 145 | EE | Mariam Momenzadeh,
Mehdi Baradaran Tahoori,
Jing Huang,
Fabrizio Lombardi:
Quantum Cellular Automata: New Defects and Faults for New Devices.
IPDPS 2004 |
| 144 | EE | Jing Huang,
Mehdi Baradaran Tahoori,
Fabrizio Lombardi:
Routability and Fault Tolerance of FPGA Interconnect Architectures.
ITC 2004: 479-488 |
| 143 | EE | Luca Schiano,
Marco Ottavi,
Fabrizio Lombardi:
Markov Models of Fault-Tolerant Memory Systems under SEU.
MTDT 2004: 38-43 |
| 142 | EE | Mehdi Baradaran Tahoori,
Mariam Momenzadeh,
Jing Huang,
Fabrizio Lombardi:
Defects and Faults in Quantum Cellular Automata at Nano Scale.
VTS 2004: 291-296 |
| 141 | EE | André Ivanov,
Fabrizio Lombardi,
Cecilia Metra:
Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates.
IEEE Design & Test of Computers 21(4): 274-276 (2004) |
| 140 | EE | Bin Liu,
Fabrizio Lombardi,
Nohpill Park,
Minsu Choi:
Testing Layered Interconnection Networks.
IEEE Trans. Computers 53(6): 710-722 (2004) |
| 139 | EE | Jun Zhao,
Fred J. Meyer,
Nohpill Park,
Fabrizio Lombardi:
Sequential diagnosis of processor array systems.
IEEE Transactions on Reliability 53(4): 487-498 (2004) |
| 138 | EE | Zainalabedin Navabi,
Shahrzad Mirkhani,
Meisam Lavasani,
Fabrizio Lombardi:
Using RT Level Component Descriptions for Single Stuck-at Hierarchical Fault Simulation.
J. Electronic Testing 20(6): 575-589 (2004) |
| 137 | EE | Minsu Choi,
Nohpill Park,
Vincenzo Piuri,
Yong-Bin Kim,
Fabrizio Lombardi:
Balanced dual-stage repair for dependable embedded memory cores.
Journal of Systems Architecture 50(5): 281-285 (2004) |
| 2003 |
|---|
| 136 | EE | Pedram A. Riahi,
Zainalabedin Navabi,
Fabrizio Lombardi:
The VPI-Based Combinational IP Core Module-Based Mixed Level Serial Fault Simulation and Test Generation Methodology.
Asian Test Symposium 2003: 274-277 |
| 135 | EE | Hamidreza Hashempour,
Fabrizio Lombardi:
ATE-Amenable Test Data Compression with No Cyclic Scan.
DFT 2003: 151-158 |
| 134 | EE | Fengming Zhang,
Young-Jun Lee,
T. Kane,
Luca Schiano,
Mariam Momenzadeh,
Yong-Bin Kim,
Fred J. Meyer,
Fabrizio Lombardi,
S. Max,
Phil Perkinson:
A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment.
DFT 2003: 159-166 |
| 133 | EE | Xiaopeng Wang,
Marco Ottavi,
Fabrizio Lombardi:
Yield Analysis of Compiler-Based Arrays of Embedded SRAMs.
DFT 2003: 3-10 |
| 132 | EE | Luca Schiano,
Fabrizio Lombardi:
On the Test and Diagnosis of the Perfect Shuffle.
DFT 2003: 97-104 |
| 131 | | Pedram A. Riahi,
Zainalabedin Navabi,
Fabrizio Lombardi:
Using Verilog VPI for Mixed Level Serial Fault Simulation in a Test Generation Environment.
Embedded Systems and Applications 2003: 139-143 |
| 130 | EE | Hamidreza Hashempour,
Fred J. Meyer,
Fabrizio Lombardi,
Farzin Karimi:
Hybrid Multisite Testing at Manufacturing.
ITC 2003: 927-936 |
| 129 | EE | Minsu Choi,
Nohpill Park,
Fabrizio Lombardi,
Yong-Bin Kim,
Vincenzo Piuri:
Optimal Spare Utilization in Repairable and Reliable Memory Cores.
MTDT 2003: 64-71 |
| 128 | EE | Minsu Choi,
Noh-Jin Park,
K. M. George,
Byoungjae Jin,
Nohpill Park,
Yong-Bin Kim,
Fabrizio Lombardi:
Fault Tolerant Memory Design for HW/SW Co-Reliability in Massively Parallel Computing Systems.
NCA 2003: 341- |
| 127 | EE | Soha Hassoun,
Yong-Bin Kim,
Fabrizio Lombardi:
Guest Editors' Introduction: Clockless VLSI Systems.
IEEE Design & Test of Computers 20(6): 5-8 (2003) |
| 126 | EE | Wenyi Feng,
Fred J. Meyer,
Fabrizio Lombardi:
Adaptive Algorithms for Maximal Diagnosis of Wiring Interconnects.
IEEE Trans. Computers 52(10): 1259-1270 (2003) |
| 125 | EE | Jun Zhao,
Fred J. Meyer,
Fabrizio Lombardi,
Nohpill Park:
Maximal diagnosis of interconnects of random access memories.
IEEE Transactions on Reliability 52(4): 423-434 (2003) |
| 124 | EE | Farzin Karimi,
V. Swamy Irrinki,
T. Crosby,
Nohpill Park,
Fabrizio Lombardi:
Parallel testing of multi-port static random access memories.
Microelectronics Journal 34(1): 3-21 (2003) |
| 2002 |
|---|
| 123 | EE | Farzin Karimi,
Waleed Meleis,
Zainalabedin Navabi,
Fabrizio Lombardi:
Data Compression for System-on-Chip Testing Using ATE.
DFT 2002: 166-176 |
| 122 | EE | Hamidreza Hashempour,
Fred J. Meyer,
Fabrizio Lombardi:
Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE.
DFT 2002: 186-194 |
| 121 | EE | Fabrizio Lombardi,
Nohpill Park:
Testing Layered Interconnection Networks.
DFT 2002: 293-304 |
| 120 | EE | Minsu Choi,
Nohpill Park,
Fabrizio Lombardi,
Yong-Bin Kim,
Vincenzo Piuri:
Balanced Redundancy Utilization in Embedded Memory Cores for Dependable Systems.
DFT 2002: 419-427 |
| 119 | EE | Y. Chang,
Minsu Choi,
Nohpill Park,
Fabrizio Lombardi:
Repairability Evaluation of Embedded Multiple Region DRAMs.
DFT 2002: 428-436 |
| 118 | EE | Farzin Karimi,
Fabrizio Lombardi:
A Scan-Bist Environment for Testing Embedded Memories.
IOLTW 2002: 211- |
| 117 | EE | Minsu Choi,
Nohpill Park,
Fabrizio Lombardi:
Hardware-Software Co-Reliability in Field Reconfigurable Multi-Processor-Memory Systems.
IPDPS 2002 |
| 116 | EE | Farzin Karimi,
Fred J. Meyer,
Fabrizio Lombardi:
Random Testing of Multi-Port Static Random Access Memories.
MTDT 2002: 101-108 |
| 115 | EE | Farzin Karimi,
Fabrizio Lombardi:
A Scan-Bist Environment for Testing Embedded Memories.
MTDT 2002: 17- |
| 114 | EE | Minsu Choi,
Nohpill Park,
Yong-Bin Kim,
Fabrizio Lombardi:
Hardware/Software Co-Reliability of Configurable Digital Systems.
PRDC 2002: 67-74 |
| 113 | EE | Jun Zhao,
Fred J. Meyer,
Fabrizio Lombardi:
Analyzing and Diagnosing Interconnect Faults in Bus-Structured Systems.
IEEE Design & Test of Computers 19(1): 54-64 (2002) |
| 112 | EE | Dimiter R. Avresky,
Barry W. Johnson,
Fabrizio Lombardi:
Guest Editors' Introduction.
IEEE Trans. Computers 51(2): 97-99 (2002) |
| 2001 |
|---|
| 111 | EE | Xiao-Tao Chen,
Wei-Kang Huang,
Nohpill Park,
Fred J. Meyer,
Fabrizio Lombardi:
Novel Approaches for Fault Detection in Two-Dimensional Combinational Arrays.
DFT 2001: 161-169 |
| 110 | EE | Farzin Karimi,
Fabrizio Lombardi:
Parallel Testing of Multi-port Static Random Access Memories for BIST.
DFT 2001: 271-279 |
| 109 | EE | Farzin Karimi,
Fabrizio Lombardi,
V. Swamy Irrinki,
T. Crosby:
A Parallel Approach for Testing Multi-Port Static Random Access Memories.
MTDT 2001: 73- |
| 108 | EE | Mohammad A. Al-Hashimi,
Huay-min H. Pu,
Nohpill Park,
Fabrizio Lombardi:
Dependability under Malicious Agreement in N-modular Redundancy-on-Demand Systems.
NCA 2001: 80-93 |
| 107 | EE | Minsu Choi,
Nohpill Park,
Fred J. Meyer,
Fabrizio Lombardi:
Connectivity-Based Multichip Module Repair.
PRDC 2001: 19-26 |
| 106 | EE | Fabrizio Lombardi,
Nohpill Park,
Mohammad A. Al-Hashimi,
Huay-min H. Pu:
Modeling the Dependability of N-Modular Redundancy on Demand under Malicious Agreement.
PRDC 2001: 68-75 |
| 105 | | Fabrizio Lombardi,
Cecilia Metra:
Guest Editors' Introduction: Defect-Oriented Diagnosis for Very Deep-Submicron Systems.
IEEE Design & Test of Computers 18(1): 8-9 (2001) |
| 104 | EE | Dimiter R. Avresky,
Fabrizio Lombardi,
Karl-Erwin Großpietsch,
Barry W. Johnson:
Guest Editors' Introduction: Fault-Tolerant Embedded Systems.
IEEE Micro 21(5): 12-15 (2001) |
| 103 | EE | Wenyi Feng,
Farzin Karimi,
Fabrizio Lombardi:
Fault Detection in a Tristate System Environment.
IEEE Micro 21(5): 77-85 (2001) |
| 102 | EE | Haldun Hadimioglu,
David R. Kaeli,
Fabrizio Lombardi:
Introduction to the Special Section on High Performance Memory Systems.
IEEE Trans. Computers 50(11): 1103-1104 (2001) |
| 2000 |
|---|
| 101 | EE | Bin Liu,
Fabrizio Lombardi,
Wei-Kang Huang:
Testing programmable interconnect systems: an algorithmic approach.
Asian Test Symposium 2000: 311-316 |
| 100 | EE | W. Shi,
K. Kumar,
Fabrizio Lombardi:
On the Complexity of Switch Programming in Fault-Tolerant-Configurable Chips.
DFT 2000: 125-134 |
| 99 | EE | Nohpill Park,
S. J. Ruiwale,
Fabrizio Lombardi:
Testing the Configurability of Dynamic FPGAs.
DFT 2000: 311-319 |
| 98 | EE | Nohpill Park,
Fred J. Meyer,
Fabrizio Lombardi:
Quality-Effective Repair of Multichip Module Systems.
DFT 2000: 47-55 |
| 97 | EE | Wenyi Feng,
Fred J. Meyer,
Fabrizio Lombardi:
Complexity Bounds for Lookup Table Implementation of Factored Forms in FPGA Technology Mapping.
IPDPS Workshops 2000: 951-958 |
| 96 | EE | Jun Zhao,
Fred J. Meyer,
Fabrizio Lombardi:
Diagnosing the Interconnect of Bus-Connected Multi-RAM Systems under Restricted and General Fault Models.
MTDT 2000: 14-19 |
| 95 | EE | Jun Zhao,
V. Swamy Irrinki,
Mukesh Puri,
Fabrizio Lombardi:
Detection of Inter-Port Faults in Multi-Port Static RAMs.
VTS 2000: 297-304 |
| 94 | EE | Wei-Kang Huang,
Fred J. Meyer,
Fabrizio Lombardi:
An Approach for Detecting Multiple Faulty FPGA Logic Blocks.
IEEE Trans. Computers 49(1): 48-54 (2000) |
| 93 | EE | Jun Zhao,
V. Swamy Irrinki,
Mukesh Puri,
Fabrizio Lombardi:
Testing SRAM-Based Content Addressable Memories.
IEEE Trans. Computers 49(10): 1054-1063 (2000) |
| 92 | EE | Fabrizio Lombardi,
Mariagiovanna Sami:
Guest Editors' Introduction.
IEEE Trans. Computers 49(6): 529-531 (2000) |
| 91 | EE | Tong Liu,
Wei-Kang Huang,
Fred J. Meyer,
Fabrizio Lombardi:
Testing and testable designs for one-time programmable FPGAs.
IEEE Trans. on CAD of Integrated Circuits and Systems 19(11): 1370-1375 (2000) |
| 1999 |
|---|
| 90 | EE | Yinlei Yu,
Jian Xu,
Wei-Kang Huang,
Fabrizio Lombardi:
Diagnosing Single Faults for Interconnects in SRAM Based FPGAs.
ASP-DAC 1999: 283-286 |
| 89 | EE | Yinlei Yu,
Jian Xu,
Wei-Kang Huang,
Fabrizio Lombardi:
Minimizing the Number of Programming Steps for Diagnosis of Interconnect Faults in FPGAs.
Asian Test Symposium 1999: 357-362 |
| 88 | EE | Lan Zhao,
D. M. H. Walker,
Fabrizio Lombardi:
IDDQ Testing of Input/Output Resources of SRAM-Based FPGAs.
Asian Test Symposium 1999: 375- |
| 87 | EE | Wenyi Feng,
Wei-Kang Huang,
Fred J. Meyer,
Fabrizio Lombardi:
A BIST TPG Approach for Interconnect Testing With the IEEE 1149.1 STD.
Asian Test Symposium 1999: 95-100 |
| 86 | EE | Wenyi Feng,
Fred J. Meyer,
Fabrizio Lombardi:
Novel Control Pattern Generators for Interconnect Testing with Boundary Scan.
DFT 1999: 112-120 |
| 85 | EE | Nohpill Park,
Fabrizio Lombardi:
Stratified Testing of Multichip Module Systems under Uneven Known-Good-Yield.
DFT 1999: 192-200 |
| 84 | EE | Fred J. Meyer,
Fabrizio Lombardi,
Jun Zhao:
Good Processor Identification in Two-Dimensional Grids.
DFT 1999: 348-356 |
| 83 | EE | Wenyi Feng,
Xiao-Tao Chen,
Fred J. Meyer,
Fabrizio Lombardi:
Reconfiguration of One-Time Programmable FPGAs with Faulty Logic Resources.
DFT 1999: 368-376 |
| 82 | EE | Wenyi Feng,
Fred J. Meyer,
Fabrizio Lombardi:
Two-Step Algorithms for Maximal Diagnosis of Wiring Interconnects.
FTCS 1999: 130-137 |
| 81 | EE | Jun Zhao,
Fred J. Meyer,
Fabrizio Lombardi:
Interconnect Diagnosis of Bus-Connected Multi-RAM Systems.
MTDT 1999: 40-47 |
| 80 | EE | Jian Xu,
Paifa Si,
Weikang Huang,
Fabrizio Lombardi:
A Novel Fault Tolerant Approach for SRAM-Based FPGAs.
PRDC 1999: 40-44 |
| 79 | EE | Jun Zhao,
Fred J. Meyer,
Fabrizio Lombardi:
Maximal Diagnosis of Interconnects of Random Access Memories.
VTS 1999: 378-383 |
| 78 | | Bruce F. Cockburn,
Fabrizio Lombardi,
Fred J. Meyer:
Guest Editors' Introduction: DRAM Architecture and Testing.
IEEE Design & Test of Computers 16(1): 19-21 (1999) |
| 77 | EE | Xiao-Tao Chen,
Wei-Kang Huang,
Nohpill Park,
Fred J. Meyer,
Fabrizio Lombardi:
Design Verification of FPGA Implementations.
IEEE Design & Test of Computers 16(2): 66-73 (1999) |
| 76 | EE | Tong Liu,
Xiao-Tao Chen,
Fred J. Meyer,
Fabrizio Lombardi:
Test generation and scheduling for layout-based detection of bridge faults in interconnects.
IEEE Trans. VLSI Syst. 7(1): 48-55 (1999) |
| 75 | EE | Jun Zhao,
Fred J. Meyer,
Fabrizio Lombardi:
Adaptive Fault Detection and Diagnosis of RAM Interconnects.
J. Electronic Testing 15(1-2): 157-171 (1999) |
| 1998 |
|---|
| 74 | EE | Wenyi Feng,
Wei-Kang Huang,
Fred J. Meyer,
Fabrizio Lombardi:
Fault Detection in a Tristate System Environment.
Asian Test Symposium 1998: 253-258 |
| 73 | EE | Yinlei Yu,
Jian Xu,
Wei-Kang Huang,
Fabrizio Lombardi:
A Diagnosis Method for Interconnects in SRAM Based FPGAs.
Asian Test Symposium 1998: 278-282 |
| 72 | EE | Y. Bellan,
Mario Costa,
Giancarlo Ferrigno,
Fabrizio Lombardi,
Luca Macchiarulo,
Alfonso Montuori,
Eros Pasero,
Camilla Rigotti:
Artificial Neural Networks for Motion Emulation in Virtual Environments.
CAPTECH 1998: 83-99 |
| 71 | EE | Avinash Munshi,
Fred J. Meyer,
Fabrizio Lombardi:
A New Method for Testing EEPLA's.
DFT 1998: 146-154 |
| 70 | EE | Wenyi Feng,
Fred J. Meyer,
Wei-Kang Huang,
Fabrizio Lombardi:
On the Complexity of Sequential Testing in Configurable FPGAs.
DFT 1998: 164- |
| 69 | EE | Lan Zhao,
D. M. H. Walker,
Fabrizio Lombardi:
Bridging Fault Detection in FPGA Interconnects Using IDDQ.
FPGA 1998: 95-104 |
| 68 | EE | Lan Zhao,
D. M. H. Walker,
Fabrizio Lombardi:
Detection of bridging faults in logic resources of configurable FPGAs using I_DDQ.
ITC 1998: 1037- |
| 67 | EE | Jun Zhao,
Fred J. Meyer,
Fabrizio Lombardi:
Fault Detection and Diagnosis of Interconnects of Random Access Memories.
VTS 1998: 42-47 |
| 66 | EE | Xiao-Tao Chen,
Fred J. Meyer,
Fabrizio Lombardi:
Structural diagnosis of interconnects by coloring.
ACM Trans. Design Autom. Electr. Syst. 3(2): 249-271 (1998) |
| 65 | | Fabrizio Lombardi:
Field-Programmable Gate Arrays.
IEEE Design & Test of Computers 15(1): 8-9 (1998) |
| 64 | EE | Lan Zhao,
D. M. H. Walker,
Fabrizio Lombardi:
IDDQ Testing of Bridging Faults in Logic Resources of Reconfigurable Field Programmable Gate Arrays.
IEEE Trans. Computers 47(10): 1136-1152 (1998) |
| 63 | EE | Wei-Kang Huang,
Fred J. Meyer,
Xiao-Tao Chen,
Fabrizio Lombardi:
Testing configurable LUT-based FPGA's.
IEEE Trans. VLSI Syst. 6(2): 276-283 (1998) |
| 1997 |
|---|
| 62 | EE | Wei-Kang Huang,
M. Y. Zhang,
Fred J. Meyer,
Fabrizio Lombardi:
A XOR-Tree Based Technique for Constant Testability of Configurable FPGAs.
Asian Test Symposium 1997: 248-253 |
| 61 | EE | Wei Liang Huang,
Fred J. Meyer,
Fabrizio Lombardi:
Multiple fault detection in logic resources of FPGAs.
DFT 1997: 186-194 |
| 60 | EE | D. G. Ashen,
Fred J. Meyer,
Nohpill Park,
Fabrizio Lombardi:
Testing of programmable logic devices (PLD) with faulty resources.
DFT 1997: 76-84 |
| 59 | | Fred J. Meyer,
Xiao-Tao Chen,
Wei-Kang Huang,
Fabrizio Lombardi:
Using Virtual Links for Reliable Information Retrieval Across Point-to-Point Networks.
FTCS 1997: 216-225 |
| 58 | | X. Tan,
J. Tong,
P. Tan,
Nohpill Park,
Fabrizio Lombardi:
An Efficient Multi-Way Algorithm for Balanced Partitioning of VLSI Circuits.
ICCD 1997: 608-613 |
| 57 | EE | Yinan N. Shen,
Xiao-Tao Chen,
Susumu Horiguchi,
Fabrizio Lombardi:
On the multiple fault diagnosis of multistage interconnection networks: the lower bound and the CMOS fault model.
ICPP 1997: 350- |
| 56 | EE | Xiao-Tao Chen,
Fred J. Meyer,
Fabrizio Lombardi:
On the Fault Coverage of Interconnect Diagnosis.
VTS 1997: 101-109 |
| 1996 |
|---|
| 55 | EE | Fabrizio Lombardi,
David Ashen,
Xiao-Tao Chen,
Wei-Kang Huang:
Diagnosing Programmable Interconnect Systems for FPGAs.
FPGA 1996: 100-106 |
| 54 | EE | Xiao-Tao Chen,
Fabrizio Lombardi:
A coloring approach to the structural diagnosis of interconnects.
ICCAD 1996: 676-680 |
| 53 | EE | Yinan N. Shen,
Nohpill Park,
Fabrizio Lombardi:
Space Cutting Approaches for Repairing Memories.
ICCD 1996: 106-111 |
| 52 | EE | José Salinas,
Nohpill Park,
U. Arunkumar,
Fabrizio Lombardi:
Conformance Testing of Time-Dependent Protocols.
ICECCS 1996: 257-264 |
| 51 | EE | Wei-Kang Huang,
Xiao-Tao Chen,
Fabrizio Lombardi:
On the diagnosis of programmable interconnect systems: Theory and application.
VTS 1996: 204-211 |
| 50 | EE | Wei-Kang Huang,
Fabrizio Lombardi:
An approach for testing programmable/configurable field programmable gate arrays.
VTS 1996: 450-455 |
| 49 | | Chao Feng,
Laxmi N. Bhuyan,
Fabrizio Lombardi:
Adaptive System-Level Diagnosis for Hypercube Multiprocessors.
IEEE Trans. Computers 45(10): 1157-1170 (1996) |
| 48 | | José Salinas,
Yinan N. Shen,
Fabrizio Lombardi:
A Sweeping Line Approach to Interconnect Testing.
IEEE Trans. Computers 45(8): 917-929 (1996) |
| 47 | EE | Yinan N. Shen,
Fabrizio Lombardi:
Graph Algorithms for Conformance Testing Using the Rural ChinesePostman Tour.
SIAM J. Discrete Math. 9(4): 511-529 (1996) |
| 1995 |
|---|
| 46 | EE | Tong Liu,
Wei-Kang Huang,
Fabrizio Lombardi:
Testing of Uncustomized Segmented Channel Field Programmable Gate Arrays.
FPGA 1995: 125-131 |
| 45 | | Chao Feng,
Wei-Kang Huang,
Fabrizio Lombardi:
A New Diagnosis Approach for Short Faults in Interconnects.
FTCS 1995: 331-339 |
| 44 | | V. Purohit,
Fabrizio Lombardi,
Susumu Horiguchi,
J. H. Kim:
Diagnosing Multiple Bridge Faults in Baseline Multistage Interconnection Networks.
ICPP (1) 1995: 131-135 |
| 43 | | Tong Liu,
Wei-Kang Huang,
Fabrizio Lombardi,
Laxmi N. Bhuyan:
A Submesh Allocation Scheme for Mesh-Connected Multiprocessor Systems.
ICPP (2) 1995: 159-163 |
| 42 | EE | Amitabh Mishra,
Yeimkuan Chang,
Laxmi N. Bhuyan,
Fabrizio Lombardi:
Fault-tolerant sorting in SIMD hypercubes.
IPPS 1995: 312-318 |
| 41 | EE | Tong Liu,
Fabrizio Lombardi,
José Salinas:
Diagnosis of interconnects and FPICs using a structured walking-1 approach.
VTS 1995: 256-261 |
| 1994 |
|---|
| 40 | | Yinan N. Shen,
Hannu Kari,
S. S. Kim,
Fabrizio Lombardi:
Scheduling Policies for Fault Tolerance in a VLSI Processor.
DFT 1994: 1-9 |
| 39 | | Tong Liu,
Fabrizio Lombardi:
On Soft Switch Programming for Reconfigurable Array Systems.
DFT 1994: 203-211 |
| 38 | | José Salinas,
Fabrizio Lombardi:
Rank Order Filtering on an Array With Faulty Processors.
ICPP (1) 1994: 236-240 |
| 37 | | D. Schin,
Yinan N. Shen,
Fabrizio Lombardi:
An Approach for UIO Generation for FSM Verification and Validation.
ISCAS 1994: 303-306 |
| 36 | | Hannu Kari,
Heikki Saikkonen,
Fabrizio Lombardi:
Detecting Latent Sector Faults in Modern SCSI Disks.
MASCOTS 1994: 403-404 |
| 35 | EE | Hannu Kari,
José Salinas,
Fabrizio Lombardi:
Generating non-standard random distributions for discrete event simulation systems.
Simul. Pr. Theory 1(4): 173-193 (1994) |
| 1993 |
|---|
| 34 | | Fabrizio Lombardi,
Mariagiovanna Sami,
Yvon Savaria,
Renato Stefanelli:
The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy, Proceedings
IEEE Computer Society 1993 |
| 33 | | Hannu Kari,
Heikki Saikkonen,
Fabrizio Lombardi:
Detection of Defective Media in Disks.
DFT 1993: 49-55 |
| 32 | | José Salinas,
Fabrizio Lombardi:
On the Reconfigurable Operation of Arrays with Defects for Image Processing.
DFT 1993: 88-95 |
| 31 | | José Salinas,
Fabrizio Lombardi:
Emulating Reconfigurable Arrays for Image Processing Using the MasPar Architecture.
ICPP 1993: 141-148 |
| 30 | | Chao Feng,
Laxmi N. Bhuyan,
Fabrizio Lombardi:
An Adaptive System-Level Diagnosis Approach for Mesh Connected Multiprocessors.
ICPP 1993: 153-157 |
| 29 | | Hannu Kari,
Heikki Saikkonen,
Fabrizio Lombardi:
On the Methods to Detect Sector Faults of a Disk Subsystem.
MASCOTS 1993: 317-322 |
| 28 | | Chao Feng,
Laxmi N. Bhuyan,
Fabrizio Lombardi:
An Adaptive System-Level Diagnosis Approach for Hypercube Multiprocessors.
SPDP 1993: 460-469 |
| 27 | EE | H. Lin,
Fabrizio Lombardi,
M. Lu:
On the optimal reconfiguration of multipipeline arrays in the presence of faulty processing and switching elements.
IEEE Trans. VLSI Syst. 1(1): 76-79 (1993) |
| 26 | EE | Chao Feng,
Jon C. Muzio,
Fabrizio Lombardi:
On the testability of array structures for FFT computation.
J. Electronic Testing 4(3): 215-224 (1993) |
| 1992 |
|---|
| 25 | | X. Sun,
Yinan N. Shen,
Fabrizio Lombardi:
On the Verification and Validation of Protocols with High Fault Coverage Using UIO Sequences.
SRDS 1992: 196-203 |
| 24 | | Fabrizio Lombardi,
Chao Feng,
Wei-Kang Huang:
Detection and Location of Multiple Faults in Baseline Interconnection Networks.
IEEE Trans. Computers 41(10): 1340-1344 (1992) |
| 23 | EE | Fabrizio Lombardi,
Donatella Sciuto:
Constant testability of combinational cellular tree structures.
J. Electronic Testing 3(2): 139-148 (1992) |
| 1991 |
|---|
| 22 | | X. Sun,
Yinan N. Shen,
Fabrizio Lombardi,
Donatella Sciuto:
Protocol Conformance Testing by Discriminating UIO Sequences.
PSTV 1991: 349-364 |
| 1990 |
|---|
| 21 | | Peter Koo,
Fabrizio Lombardi,
Donatella Sciuto:
A Routing Algorithm for Harvesting Multipipeline Arrays with Small Intercell and Pipeline Delays.
ICCAD 1990: 2-5 |
| 20 | EE | Yinan N. Shen,
Fabrizio Lombardi,
Donatella Sciuto:
Evaluation and improvement of fault coverage for verification and validation of protocols.
SPDP 1990: 200-207 |
| 19 | EE | Fabrizio Lombardi,
Yinan N. Shen,
Jon C. Muzio:
On the testability of array structures for FFT computation.
SPDP 1990: 519-522 |
| 18 | | Fabrizio Lombardi,
Wei-Kang Huang:
Fault Detection and Design Complextity in C-Testable VLSI Arrays.
IEEE Trans. Computers 39(12): 1477-1481 (1990) |
| 17 | | Wei-Kang Huang,
Fabrizio Lombardi:
On the Constant Diagnosability of Baseline Interconnection Networks.
IEEE Trans. Computers 39(12): 1485-1488 (1990) |
| 16 | EE | Wei-Kang Huang,
Yinan N. Shen,
Fabrizio Lombardi:
New approaches for the repairs of memories with redundancy by row/column deletion for yield enhancement.
IEEE Trans. on CAD of Integrated Circuits and Systems 9(3): 323-328 (1990) |
| 15 | EE | Yinan N. Shen,
Fabrizio Lombardi:
Yield enhancement and manufacturing throughput of redundant memories by repairability/unrepairability detection.
J. Electronic Testing 1(1): 43-57 (1990) |
| 1989 |
|---|
| 14 | | Yinan N. Shen,
Fabrizio Lombardi:
Location and Identification for Single and Multiple Faults in Testable Redundant PLAs for Yield Enhancement.
ITC 1989: 670-678 |
| 13 | | Yinan N. Shen,
Fabrizio Lombardi,
Anton T. Dahbura:
Protocol Conformance Testing Using Multiple UIO Sequences.
PSTV 1989: 131-143 |
| 12 | EE | Fabrizio Lombardi,
Mariagiovanna Sami,
Renato Stefanelli:
Reconfiguration of VLSI arrays by covering.
IEEE Trans. on CAD of Integrated Circuits and Systems 8(9): 952-965 (1989) |
| 1988 |
|---|
| 11 | | Salih Yurttas,
Fabrizio Lombardi:
New Approaches for the Reconfiguration of Two-Dimensional VLSI Arrays Using Time-Redundancy.
IEEE Real-Time Systems Symposium 1988: 212-221 |
| 10 | | Fabrizio Lombardi:
Analysis of Comparison-Based Diagnosable Systems Using Temporal Criteria.
Comput. J. 31(3): 201-208 (1988) |
| 9 | | Donatella Sciuto,
Fabrizio Lombardi:
On Functional Testing of Array Processors.
IEEE Trans. Computers 37(11): 1480-1484 (1988) |
| 8 | EE | Fabrizio Lombardi,
Donatella Sciuto,
Renato Stefanelli:
An algorithm for functional reconfiguration of fixed-size arrays.
IEEE Trans. on CAD of Integrated Circuits and Systems 7(10): 1114-1118 (1988) |
| 7 | EE | Wei-Kang Huang,
Fabrizio Lombardi:
On an improved design approach for C-testable orthogonal iterative arrays.
IEEE Trans. on CAD of Integrated Circuits and Systems 7(5): 609-615 (1988) |
| 1987 |
|---|
| 6 | | Fabrizio Lombardi,
Donatella Sciuto,
Renato Stefanelli:
A Technique for Reconfiguring Two Dimensional VLSI Arrays.
IEEE Real-Time Systems Symposium 1987: 44-53 |
| 5 | | Chin-Long Wey,
Fabrizio Lombardi:
On a Novel Self-Test Approach to Digital Testing.
Comput. J. 30(3): 258-267 (1987) |
| 4 | EE | Chin-Long Wey,
Fabrizio Lombardi:
On the Repair of Redundant RAM's.
IEEE Trans. on CAD of Integrated Circuits and Systems 6(2): 222-231 (1987) |
| 3 | | A. Kovaleski,
S. Ratheal,
Fabrizio Lombardi:
An Architecture and an Interconnection Scheme for Time-Sliced Buses.
J. Parallel Distrib. Comput. 4(2): 209-229 (1987) |
| 1986 |
|---|
| 2 | | A. Kovaleski,
S. Ratheal,
Fabrizio Lombardi:
An Architecture and an Interconnection Scheme for Time-Sliced Buses in Real-Time Processing.
IEEE Real-Time Systems Symposium 1986: 20-27 |
| 1985 |
|---|
| 1 | | Fabrizio Lombardi,
Chin-Long Wey:
On a Multiprocessor System with Dynamic Redundancy.
IEEE Real-Time Systems Symposium 1985: 3-12 |
