Yukiya Miura

2008
22	EE	Yukiya Miura, Jiro Kato: Diagnosis of Analog Circuits by Using Multiple Transistors and Data Sampling. DFT 2008: 491-499
21	EE	Yukiya Miura: Ramp Voltage Testing for Detecting Interconnect Open Faults. IEICE Transactions 91-D(3): 700-705 (2008)
20	EE	Yukiya Miura, Jiro Kato: Adaptive Fault Diagnosis of Analog Circuits by Operation-Region Model and X - Y Zoning Method. J. Electronic Testing 24(1-3): 223-233 (2008)
2006
19	EE	Masaki Hashizume, Tomomi Nishida, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Yukiya Miura: Current Testable Design of Resistor String DACs. DELTA 2006: 197-200
18	EE	Yukiya Miura, Jiro Kato: Fault Diagnosis of Analog Circuits Based on Adaptive Test and Output Characteristics. DFT 2006: 410-418
17	EE	Yukiya Miura: Proposal of Fault Diagnosis of Analog Circuits by Combining Operation-Region Model and X-Y Zoning Method: Case Study. J. Electronic Testing 22(4-6): 411-423 (2006)
2005
16	EE	Yukiya Miura: Characteristics of Fault Diagnosis for Analog Circuits Based on Preset Test. DFT 2005: 573-581
2004
15	EE	Yukiya Miura: Fault Diagnosis of Analog Circuits by Operation-Region Model and X-Y Zoning Method. DFT 2004: 230-238
2003
14	EE	Masaki Hashizume, Teppei Takeda, Hiroyuki Yotsuyanagi, Takeomi Tamesada, Yukiya Miura, Kozo Kinoshita: A BIST Circuit for IDDQ Tests. Asian Test Symposium 2003: 390-395
13	EE	Yukiya Miura, Daisuke Kato: Analysis and Testing of Analog and Mixed-Signal Circuits by an Operation-Region Model: A Case Study of Application and Implementation. DFT 2003: 279-286
2002
12	EE	Yukiya Miura, Shuichi Seno: Behavior Analysis of Internal Feedback Bridging Faults in CMOS Circuits. J. Electronic Testing 18(2): 109-120 (2002)
2001
11	EE	Teppei Takeda, Masaki Hashizume, Masahiro Ichimiya, Hiroyuki Yotsuyanagi, Yukiya Miura, Kozo Kinoshita: IDDQ Sensing Technique for High Speed IDDQ Testing. Asian Test Symposium 2001: 111-116
2000
10	EE	Arabi Keshk, Yukiya Miura, Kozo Kinoshita: Simulation of resistive bridging fault to minimize the presence of intermediate voltage and oscillation in CMOS circuits. Asian Test Symposium 2000: 120-124
1999
9	EE	Arabi Keshk, Kozo Kinoshita, Yukiya Miura: Procedure to Overcome the Byzantine General's Problem for Bridging Faults in CMOS Circuits. Asian Test Symposium 1999: 121-126
8	EE	Arabi Keshk, Kozo Kinoshita, Yukiya Miura: IDDQ Current Dependency on Test Vectors and Bridging Resistance. Asian Test Symposium 1999: 158-163
7	EE	Yukiya Miura, Hiroshi Yamazaki: A Low-Loss Built-In Current Sensor. J. Electronic Testing 14(1-2): 39-48 (1999)
1998
6	EE	Masaki Hashizume, Yukiya Miura, Masahiro Ichimiya, Takeomi Tamesada, Kozo Kinoshita: A High-Speed IDDQ Sensor for Low-Voltage ICs. Asian Test Symposium 1998: 327-
1997
5		Yukiya Miura: An IDDQ Sensor Circuit for Low-Voltage ICs. ITC 1997: 938-947
1996
4	EE	Yukiya Miura: Real-Time Current Testing for A/D Converters. IEEE Design & Test of Computers 13(2): 34-41 (1996)
1995
3		Yukiya Miura: A Comparative Analysis of Input Stimuli for Testing Mixed-Signal LSIs Based on Curent Testing. ITC 1995: 71-77
1994
2		Yukiya Miura, Sachio Naito, Kozo Kinoshita: A Case Study of Mixed-Signal Integrated Circuit Testing: An Application of Current Testing Using the Upper Limit and the Lower Limit. ISCAS 1994: 77-80
1992
1		Yukiya Miura, Kozo Kinoshita: Circuit Design for Built-in Current Testing. ITC 1992: 873-881

Coauthor Index

1	Masaki Hashizume	[6] [11] [14] [19]
2	Masahiro Ichimiya	[6] [11]
3	Daisuke Kato	[13]
4	Jiro Kato	[18] [20] [22]
5	Arabi Keshk	[8] [9] [10]
6	Kozo Kinoshita	[1] [2] [6] [8] [9] [10] [11] [14]
7	Sachio Naito	[2]
8	Tomomi Nishida	[19]
9	Shuichi Seno	[12]
10	Teppei Takeda	[11] [14]
11	Takeomi Tamesada	[6] [14] [19]
12	Hiroshi Yamazaki	[7]
13	Hiroyuki Yotsuyanagi	[11] [14] [19]

Colors in the list of coauthors