Wei Cen

List of publications from the DBLP Bibliography Server - FAQ

2000

1 EE Shiyi Xu, Wei Cen: Forecasting the efficiency of test generation algorithms for digital circuits. Asian Test Symposium 2000: 179-

2000
1	EE	Shiyi Xu, Wei Cen: Forecasting the efficiency of test generation algorithms for digital circuits. Asian Test Symposium 2000: 179-

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